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81.
采用n型掺杂背面入射AlGaAs/GaAs量子阱结构,用MOCVD外延生长和GaAs集成电路工艺,设计制作了大面积AlGaAs/GaAs QWIP单元测试器件和128×128、128×160、256×256 AlGaAs/GaAs QWIP焦平面探测器阵列。 用液氮温度下的暗电流和傅里叶红外响应光谱对单元测试器件进行了评估,针对不同材料结构,实现了9 μm和10.9 μm的截止波长; 黑体探测率最高达到2.6×109 cm·Hz1/ 2·W-1 。 将128×128 AlGaAs/GaAs QWIP阵列芯片与CMOS读出电路芯片倒装焊互连,成功演示了室温环境下目 标的红外热成像;并进一步讨论了提高QWIP组件成像质量的途径。  相似文献   
82.
InGaAs/GaAs量子点红外探测器   总被引:1,自引:2,他引:1  
与量子阱红外探测器相比,量子点红外探测器具有不制作表面光栅就能在垂直入射红外光照射下工作以及工作温度更高等优势。然而,目前阻碍量子点红外探测器性能提高的技术瓶颈主要来自组装量子点较差的大小均匀性、较低的量子点密度以及垂直入射下子带跃迁吸收效率低等原因。利用分子束外延技术研究了如何从量子点材料生长和器件设计两方面来克服这些困难,并且制作了几种不同结构的InGaAs/GaAs量子点红外探测器。 在77 K时,这些器件在垂直入射条件下观察到了很强的光电流信号。  相似文献   
83.
利用像元分辨率公式和高斯光束传输理论,设计了一种基于线阵InGaAs光电探测器的宽谱光源平均波长测试系统光路结构。在Zemax光学软件中建立了宽谱光源平均波长测试系统的光路模型,并优化了该测试系统的光路结构参数。根据软件仿真建立的光路模型,分析了位置偏差对准直光束平行度及系统光能利用率的影响,得到了相应的变化曲线,为宽谱光源平均波长测试系统的结构设计和装配提供了指导。  相似文献   
84.
InxGa1−xAs (x=0.25–0.35) grown at low temperature on GaAs by molecular beam epitaxy is characterized by Hall effect, transmission electron microscopy, and ultrafast optical testing. As with low temperature (LT) GaAs, the resistivity is generally higher after a brief anneal at 600°C. High-resolution transmission electron microscopy shows all the as-grown epilayers to be heavily dislocated due to the large lattice mismatch (2–3%). When the layers are annealed, in addition to the dislocations, precipitates are also generally observed. As with LT-GaAs, the lifetime shortens as growth temperature is reduced through the range 300–120°C; also, the lifetime in LT-InxGa1−xAs is generally shorter in as-grown samples relative to annealed samples. Metal-semiconductor-metal photodetectors fabricated on the material exhibit response times of 1–2 picoseconds, comparable to results reported on GaAs grown at low temperature, and the fastest ever reported in the wavelength range of 1.0–1.3 μm.  相似文献   
85.
提出一种应用于CMOS图像传感器的新型光电检测器件-双极型光栅晶体管,并建立了其瞬态等效电路模型,利用电路模拟软件HSPICE的多瞬态分析法对双极型光栅晶体管的光电流特性进行了仿真,分析得出这种新型器件在0.6μmCMOS工艺参数下,由于引入pn注入结加速了光电荷的读出速率,光电流随外加电压呈指数式增长,与普通光栅晶体管相比,蓝光响应特性有较大改善。  相似文献   
86.
基于电子波干涉红外探测器的研究   总被引:3,自引:0,他引:3  
电子波干涉法是一种新的量子阱探测器能带结构计算方法,该方法是基于电子波在量子阱界面的反射和干涉效应提出的。利用电子波干涉法,设计了一种新型的宽带量子阱红外探测器。对这种探测器的能带结构进行了计算,分析了这种新型探测器的响应带宽和暗电流特性。理论计算表明:电子在干涉形成的分离能级间跃迁可形成多个响应带,这些响应带之间相互交叠可实现宽带响应;器件的暗电流在微安量级且随温度的变化不大。共振隧穿电流随温度的变化较小,是暗电流的主要组成部分;而热离子激发电流随温度的变化较大,但对暗电流的影响不大。  相似文献   
87.
An AIGaN-based back-illuminated ultraviolet p-i-n detector is designed and its performance is analysed both simulately and experimentally. The width of p- and i-regions has been optimized to the best theoretic values. It is indicated that the changing of responsivity with increase of bias can not be attributed to the expansion of depletion layer as it is believed, but to two reasons: 1) the effect of GaN/AlGaN heterojunction barrier to block the electrons decreases with higher bias and 2) the recombination rate of excess carriers decreases due to the building up of an electric field in depletion region. At zero bias, the simulated responsivity reaches its maximum of 0.12 A/W with quantum efficiency of 55.1%. The measured peak responsivity is more than 0.09 A/W with quantum efficiency greater than 41.6%. The experimental data are almost consistent with the results of the simulation.  相似文献   
88.
在蓝宝石上用MOCVD生长的材料制备了背入射Al0.42Ga0.58N/Al0.40Ga0.60N异质结p-I-n太阳光盲紫外探测器.从器件的正向Ⅰ-Ⅴ特性曲线计算了理想因子n与串联电阻Rs分别为3和93?器件在零偏压下275nm峰值波长处的外量子效率与探测率分别为9%和4.98×1011cm·Hz1/2/W,分析表明Al0.42Ga0.58N窗口层在275nm波长处的透过率仅为15.7%,是器件外量子效率和探测率偏低的原因之一.  相似文献   
89.
A detailed investigation of the dark electrical characteristics of the lateral metal–semiconductor–metal (MSM) structures is carried out using a two‐dimensional numerical simulation based on the drift‐diffusion model. The model includes image force barrier lowering and current‐dependent recombination velocities at the Schottky contacts. The simulation was used to examine the details of the depletion region, the electric field distributions, and the current path in the active region of the planar structure. The obtained results were shown to be very helpful to understand and to explain various behaviours seen in the characteristics of the metal–semiconductor–metal (MSM) structures. The dark I‐V characteristics of the structure were also calculated and compared with published experimental data. The results reveal the importance of the image force lowering on the characteristics and the hole injection at the forward contact beyond the flat band voltage. Copyright © 2010 John Wiley & Sons, Ltd.  相似文献   
90.
Photodetectors are critical parts of an optical communication system for achieving efficient photoelectronic conversion of signals, and the response speed directly determines the bandwidth of the whole system. Metal halide perovskites, an emerging class of low‐cost solution‐processed semiconductors, exhibiting strong optical absorption, low trap states, and high carrier mobility, are widely investigated in photodetection applications. Herein, through optimizing the device engineering and film quality, high‐performance photodetectors based on all‐inorganic cesium lead halide perovskite (CsPbIxBr3–x), which simultaneously possess high sensitivity and fast response, are demonstrated. The optimized devices processed from CsPbIBr2 perovskite show a practically measured detectable limit of about 21.5 pW cm?2 and a fast response time of 20 ns, which are both among the highest reported device performance of perovskite‐based photodetectors. Moreover, the photodetectors exhibit outstanding long‐term environmental stability, with negligible degradation of the photoresponse property after 2000 h under ambient conditions. In addition, the resulting perovskite photodetector is successfully integrated into an optical communication system and its applications as an optical signal receiver on transmitting text and audio signals is demonstrated. The results suggest that all‐inorganic metal halide perovskite‐based photodetectors have great application potential for optical communication.  相似文献   
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