Specific contact resistivity of indium contacts to n-type CdTe

Indium alloyed to n-type CdTe of about 10¹⁶ cm^-3 electron concentration provides a contact resistivity of about 7 x 10^-3 ohm cm². This is achieved by alloying for 10 minutes at 150-450‡C in a sealed ampoule with an overpressure of cadmium. If the alloying is done in an open tube H₂ flow without a Cd vapor overpressure, alloying temperatures above 250‡C cause the contact resistance to rise as cadmium vacancies increase the compensation in the CdTe. Further improvement of the contact resistivity to 1 x 10^-3 ohm cm is obtained by a 900‡C diffusion of In into the n-CdTe (electron concentration 10¹⁶ cm^-3 before the diffusion).     

Variable temperature hall effect on p-Hg1−xCdxTe grown on CdTe and sapphire substrates by liquid phase epitaxy

Variable temperature Hall effect measurements have been made down to 9–10K on p-type Hg_1−xCd_xTe grown by liquid phase epitaxy on both CdTe and sapphire substrates. Carrier freeze-out was usually observed throughout the measured temperature range. For most samples, the hole mobility was well-behaved and exhibited a maximum at ˜ 35K. Values of acceptor ionization energy E_A and donor concentration N_D were estimated from the data, using a model assuming significant compensation, which provided a good fit to the low temperature data. In addition, values of N_D were also estimated from an analysis of the low temperature mobility using the hole effective mass as a parameter to provide reasonable agreement between the N_D values calculated from the Hall coefficient and mobility data. The measured carrier concentration is a result of close compensation between stoichiometric acceptors and donors, with N_D usually in the low-10¹⁷ cm⁻³ range. Average values of E_A for as-grown, undoped x = 0.32 layers on CdTe and sapphire substrates are 7.4 and 6.6 meV, respectively. An activation energy of 0.84 meV was determined for a Cu-doped x = 0.32 layer that was annealed in Hg vapor to reduce the number of Hg vacancies. The average E_A for undoped Hg-annealed x = 0.22 layers on CdTe substrates is 2.35 meV. Layers with x = 0.32 grown on sapphire substrates have average carrier concentrations of 2.92 (σ = 0.54) × 10¹⁶ cm⁻³, compared with 4.64 (θ = 1.26) × 10¹⁶ cm⁻³ for the same composition layers grown on CdTe substrates.     

CdTe-CdS solar cells — Production in a new baseline and investigation of material properties

In this paper, we describe our new baseline for CSS-CdTe-CdS solar cells on 10 × 10 cm² substrates. The deposition of the p-n junction and all the following steps were performed at the Institut für Festkörperphysik (IFK) in Jena. Using the new baseline, we are already able to produce solar cells with similar properties as commercial ones. In the batch type process, all manufacturing steps can be investigated separately. We employ Rutherford backscattering spectrometry (RBS), X-ray diffraction (XRD) and external quantum efficiency (EQE) measurements to characterise the structure of the bulk materials and interfaces. It is demonstrated that by RBS the front contact becomes accessible for thinned CdTe films. At the back contact, RBS spectra show a tellurium accumulation which is due to etching. This tellurium rich layer is confirmed by XRD with Rietveld refinement. The intermixing at the CdS-CdTe interface caused by the activation step is quantified by a bandgap determination based on EQE measurements. From the bandgap energy of the CdTe_1 − xS_x compound, we calculated the sulphur fraction x at the interface. XRD measurements imply that the activation step induces a (111) texture in CdTe. With regard to an improved manufacturing process, our cells are compared to industrial cells produced by Antec Solar Energy.     

The structural and electrical properties of Zn-Sn-O buffer layers and their effect on CdTe solar cell performance

Thin films of zinc-tin-oxide (ZTO) have been deposited on SnO₂:F coated glass substrates by co-sputtering of SnO₂ and ZnO. The deposition conditions for ZTO were controlled in order to vary film stoichiometry. The electro-optical and structural properties of ZTO have been studied as a function of their stoichiometric ratio and post-deposition annealing conditions. The same films were subsequently utilized as part of a bi-layer transparent front contact for the fabrication of CdTe solar cells: glass/SnO₂:F/ZTO. The performance of these devices suggested that the ZTO deposition and cell processing conditions can be optimized for enhanced device performance in particular for devices with thin CdS. Specifically, high blue spectral response (> 70% at 450 nm), accompanied by high open-circuit voltages (830 mV), and fill factors (70⁺%) have been demonstrated. Best solar cell performance was obtained for multi-phase ZTO films deposited at substrate temperatures of 400°C and a Zn/Sn ratio of 2.0, and which contained the binary phase of ZnO₂.     

Strategies to increase CdTe solar-cell voltage

There is a significant difference in performance between today's highest efficiency of CdTe solar cells and single-crystal cells of comparable band gap. The largest contribution to this difference is the voltage, where the values for the best CdTe cells are about 230 mV below the best GaAs cells when an appropriate adjustment is made for band gap. CdTe voltage and fill-factor are currently compromised by low recombination lifetime (near 1 ns), low hole density (near 10¹⁴ cm^− 3), and in some cases an excessive back-contact barrier. Numerical simulation is used to evaluate how combinations of lifetime, carrier density, back electron reflection, and interfacial properties affect voltage and cell performance. Two different strategies for improving voltage and performance are explored.     

Photoluminescence studies of CdTe films and junctions

Device quality CdTe films and junctions have been studied using low-temperature photoluminescence (PL) measurements. The behavior of the PL was studied as a function of the measurement temperature and excitation intensity. The CdTe films and junctions were prepared under various deposition conditions to determine the effect of film deposition and solar cell fabrication parameters, such as the effect of oxygen, and chloride treatment. A PL band located at 1.232 eV has been attributed to the presence of oxygen. This band is present only in as-deposited samples excited at the CdTe surface. Samples annealed in the presence of CdCl₂ exhibit a single PL band located at 1.42 eV. A model explaining the behavior of these bands is presented.     

利用焓-多孔介质法对垂直Bridgman生长CdTe的数值模拟

利用数值模拟研究了碲化镉在垂直Bridgman炉中生长时的固-液界面的形状．采用焓-多孔介质法,在固定网格上对碲化镉的固液两相用统一的控制方程进行了整场求解,用一特征参数确定界面的位置和形状．结果表明,当晶体的生长速率较低时,界面的形状与物质在固态和液态两相下的热扩散率有关．如果两种热扩散率的数值相近,界面的形状是平坦的．液态区自然对流是界面形状的影响因素之一,而积聚在固态区的结晶潜热是形成弯曲固-液界面的主要原因．     

One-pot synthesis of highly luminescent CdTe quantum dots by microwave irradiation reduction and their Hg2+-sensitive properties

A facile one-pot microwave irradiation reduction route has been developed for the synthesis of highly luminescent CdTe quantum dots using Na₂TeO₃ as the Te source in an aqueous environment. The synthesis parameters of this simple and rapid approach, including the reaction temperature and time, the pH of the reaction solution and the molar ratio of the 3-mercaptopropionic acid (MPA) stabilizer to Cd²⁺, have considerable influence on the particle size and photoluminescence quantum yield of the CdTe quantum dots. The photoluminescence quantum yield of CdTe quantum dots prepared using relatively short reaction times (10–40 min) reached 40%–60% (emission peaks at 550–640 nm). Furthermore, the resulting products could be used as fluorescent probes to detect Hg²⁺ ions in aqueous media. The response was linearly proportional to the concentration of Hg²⁺ ion in the range 8.0×10⁻⁹ mol/L to 2.0×10⁻⁶ mol/L with a detection limit of 2.7×10⁻⁹ mol/L. Electronic Supplementary Material  Supplementary material is available for this article at and is accessible for authorized users.     

分子束外延CdTe（211）B／Si复合衬底材料

报道了用MBE的方法，在3英寸Si衬底上制备ZnTe／CdTe（211）B复合衬底材料的初步研究结果，该研究结果将能够直接应用于大面积Si基HgCdTe IRFPA材料的生长．经过Si（211）衬底低温表面处理、ZnTe低温成核、高温退火、高温ZnTe、CdTe层的生长研究，用MBE方法成功地获得了3英寸Si基ZnTe／CdTe（211）B复合衬底材料．CdTe厚度大于10μm，XRD FWHM平均值为120arc sec，最好达到100arc sec，无（133）孪晶和其他多晶晶向．     

CdS量子点/CdTe纳米棒光电极制备及其光电性能研究

本文利用化学沉积法和射频溅射法成功实现了CdS量子点/CdTe纳米棒复合光电极的制备。通过X射线粉末衍射(XRD)、扫描电镜(SEM)、紫外-可见吸收光谱(UV-vis)和电化学工作站分别对获得的光电极进行了结构、形貌和光电性能的表征;结果表明,所获得的光电极由CdS量子点和CdTe一维纳米棒组成,其中CdTe纳米棒沿着(111)择优方向定向生长。在不同CdS量子点厚度的光电极的电化学表征结果中,我们发现了由CdS的压电效应引起的新颖的热释电现象,并在25 cycle CdS QDs的光电极测试中获得了最好的结果,开路电压为0.49 V,短路电流为71.09 μA,其I-t曲线的开光比为6。我们在研究过程中还发现了热释电引起的电流反向现象,这一特性对于未来提高光电器件的性能具有重要的意义。