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41.
42.
Eutectic solder balls (63Sn-37Pb) joined to Cu pads with an Au/Ni metallization have been widely used in wafer-level chip-size
package (WLCSP) technology for providing electrical and mechanical interconnections between components. However, some reliability
issues must be addressed regarding the intermetallic compounds (IMCs). The formation of a brittle IMC layer between the solder/Cu
pad interface impacts considerably upon the solder-ball shear strength. In addition, it will degrade the long-term operating
reliability of the WLCSP. This study investigates, by means of experiments, the growth of the IMC layer under isothermal aging
for the eutectic Sn-Pb solder reflowed on a Cu pad with an Au/Ni metallization. Forming the Cu pad with an Au/Ni metallization
was achieved by a simple semiconductor-manufacturing process. The effects of the intermetallic layer on solder-ball shear
strength were examined for various parameters, including the thickness of the Au layer, solder-ball size, and the diameter
of the Cu pad. Experimental results indicate that two IMC layers, Au0.5Ni0.5Sn4 and Ni3Sn4, form at the solder/Cu pad interface after aging. The Au0.5Ni0.5Sn4 intermetallic layer dominates the total thickness of the IMC layer and grows with aging time while the solder-ball shear
strength decreases after aging. The degradation of the solder-ball shear strength was found to be caused mainly by the formation
of the Au0.5Ni0.5Sn4 layer. The experimental results established that a thinner Au layer on Cu pad can effectively control the degradation of
solder-ball shear strength, and this is especially true for smaller ball sizes. 相似文献
43.
Naren Noolu Nikhil Murdeshwar Kevin Ely John Lippold William BaeslackIII 《Journal of Electronic Materials》2004,33(4):340-352
Gold-aluminum ball bonds were thermally exposed at constant elevated temperatures, and the resultant phase transformations
studied in detail. The as-bonded microstructure of a Au-Al ball bond essentially consisted of a reaction zone (termed “alloyed
zone” (AZ) in the as-bonded condition) between the Au bump and the bonded Al metallization. It is the growth of the reaction
zone between the Au bump and the bonded Al metallization and also the nonbonded Al metallization during thermal exposure that
gave rise to the various phase transformations. Au4Al, Au8Al3, and Au2Al are the predominant phases that grew across the ball bond until the bonded Al metallization is available to take part in
the interdiffusion reactions. After the complete consumption of the bonded Al metallization, the Au-Al phases reverse transformed
resulting in the formation of the Au4Al phase in the entire reaction zone across the ball bond (RZ-A). The lateral interdiffusion reactions resulted in the nucleation
and the growth of all of the Au-Al phases given by the phase diagram. Kidson’s analysis and Tu et al.’s treatment were extended
to a five-phase binary system to explain the phase transformations in thermally exposed Au-Al ball bonds. It is possible for
all of the Au-Al phases to grow across a ball bond uninhibited as long as the bonded metallization is available. However,
the supply limitation of the bonded metallization gives rise to reverse transformations where Al-rich phases transform to
Au-rich phases and eventually result in the formation of the Au4Al phase in the entire RZ-A. If infinite time is allowed, Au4Al would dissolve; the extent of which is dependent on the solubility of Al in Au. No supply of Au lateral to the bond causes
the reverse transformation of the Au4Al phase, giving rise to the lateral growth of the remaining Au-Al phases. If infinite time is allowed, the lateral phase
transformations would result in the formation of a phase that is dependant on the relative proportion of Au and Al present
in the nonbonded metallization (NBM) and Au4Al below the void line. Hence, the presence of a phase in a particular location of a ball bond is dependent on the time and
temperature of thermal exposure. 相似文献
44.
45.
硬质合金激光铣削加工试验研究 总被引:3,自引:0,他引:3
采用不同的激光铣削工艺对硬质合金进行激光铣削试验研究。分析了工艺参数对铣削量和铣削质量的影响,并利用优化或复合的工艺对硬质合金试样进行多样激光铣削。 相似文献
46.
介绍龙门铣床的直流调速控制系统的改造方案,根据龙门铣床工作台运动过程及原直流电机的容量来选择交流电机和变频器并对变频器的功能进行设定。 相似文献
47.
Effects of microstructural evolution and intermetallic layer growth on shear strength of ball-grid-array Sn-Cu solder joints 总被引:1,自引:0,他引:1
The shear strength of ball-grid-array (BGA) solder joints on Cu bond pads was studied for Sn-Cu solder containing 0, 1.5,
and 2.5 wt.% Cu, focusing on the effect of the microstructural changes of the bulk solder and the growth of intermetallic
(IMC) layers during soldering at 270°C and aging at 150°C. The Cu additions in Sn solder enhanced both the IMC layer growth
and the solder/IMC interface roughness during soldering but had insignificant effects during aging. Rapid Cu dissolution from
the pad during reflow soldering resulted in a fine dispersion of Cu6Sn5 particles throughout the bulk solder in as-soldered joints even for the case of pure Sn solder, giving rise to a precipitation
hardening of the bulk solder. The increased strength of the bulk solder caused the fracture mode of as-soldered joints to
shift from the bulk solder to the solder/IMC layer as the IMC layer grew over a critical thickness about 1.2 m for all solders.
The bulk solder strength decreased rapidly as the fine Cu6Sn5 precipitates coarsened during aging. As a consequence, regardless of the IMC layer thickness and the Cu content of the solders,
the shear strength of BGA solder joints degraded significantly after 1 day of aging at 150°C and the shear fracture of aged
joints occurred in the bulk solder. This suggests that small additions of Cu in Sn-based solders have an insignificant effect
on the shear strength of BGA solderjoints, especially during system use at high temperatures. 相似文献
48.
Fluorine: Edge‐Fluorinated Graphene Nanoplatelets as High Performance Electrodes for Dye‐Sensitized Solar Cells and Lithium Ion Batteries (Adv. Funct. Mater. 8/2015) 下载免费PDF全文
49.
针对常用磨球材质脆性大,耐磨性低,磨耗高,我们研制了多元低合金贝氏作铸钢磨球,它具有硬度高、硬度均匀性好和韧性高等特点,用于磨矿生产,磨耗接近高铬铸铸铁磨球,成本降低30%~40%,综合效益显著。 相似文献
50.
介绍了铬钒钛材质锻造及轧制的钢球在调军台选矿厂5 .49m× 8.83m球磨机生产应用的情况 ,探讨了大型溢流型球磨机对磨矿介质机械性能和球径、配比等方面的技术要求 ,使新建选矿厂磨机生产能力尽快达到设计水平。 相似文献