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71.
A numerical study of the transport phenomena arising in a single-screw extruder channel is carried out. A non-Newtonian fluid
is considered, using a power law model for the variable viscosity. Chemical reaction kinetics are also included. Finite difference
computations are carried out to solve the governing set of partial differential equations for the velocity, temperature and
species concentration fields, over a wide range of governing parameters for the case of a tapered screw channel.
The numerical treatment for this combined heat and mass transfer problem is outlined. A marching procedure in the down-channel
direction is adopted and the validity of the scheme for practical problems discussed. For large viscous dissipation, the material
heats up considerably due to the prevailing shear field, affecting the viscosity significantly, and results in large changes
in the pressure development at the end of the channel. The rate of reaction controls the mass diffusion rate which in turn
affects viscosity and the flow significantly. The dimensionless throughput,q
v
, is one of the most important parameters in the numerical solution. The dimensionless pressure variation is very sensitive
toq
v
, and orders of magnitude changes are possible for small variations inq
v
. Schemes for dealing with other important effects such as back flow, heat transfer by conduction in the barrel, and the effect
of the die are also outlined.
A list of symbols is given at the end of the paper
This is publication No. F-10544-4-91 of the New Jersey Agricultural Experiment Station supported by State Funds and the Center
for Advanced Food Technology (CAFT). The Center for Advanced Food Technology is a New Jersey Commission on Science and Technology Center. This work was also
supported in part by the US Army Research Office. 相似文献
72.
R. Niebuhr K. H. Bachem U. Kaufmann M. Maier C. Merz B. Santic P. Schlotter H. Jürgensen 《Journal of Electronic Materials》1997,26(10):1127-1130
Oxygen doped GaN has been grown by metalorganic chemical vapor deposition using N2O as oxygen dopant source. The layers were deposited on 2″ sapphire substrates from trimethylgallium and especially dried
ammonia using nitrogen (N2) as carrier gas. Prior to the growth of the films, an AIN nucleation layer with a thickness of about 300? was grown using
trimethylaluminum. The films were deposited at 1085°C at a growth rate of 1.0 μm/h and showed a specular, mirrorlike surface.
Not intentionally doped layers have high resistivity (>20 kW/square). The gas phase concentration of the N2O was varied between 25 and 400 ppm with respect to the total gas volume. The doped layers were n-type with carrier concentrations
in the range of 4×1016 cm−3 to 4×1018 cm−3 as measured by Hall effect. The observed carrier concentration increased with increasing N2O concentration. Low temperature photoluminescence experiments performed on the doped layers revealed besides free A and B
exciton emission an exciton bound to a shallow donor. With increasing N2O concentration in the gas phase, the intensity of the donor bound exciton increased relative to that of the free excitons.
These observations indicate that oxygen behaves as a shallow donor in GaN. This interpretation is supported by covalent radius
and electronegativity arguments. 相似文献
73.
The complete crystallographic orientation dependence of the growth rate for GaAs low pressure organometallic vapor phase epitaxy
(LPOMVPE) is determined using a previously described semi-empirical model. A set of LPOMVPE growth rate polar diagrams is
presented for reactor temperatures near 550°C as well as near 700°C. Also, the variation of the growth rate polar diagrams
as a function of process variables is given. The experimental data utilized in the semiempirical model was attained using
a typical horizontal reactor LPOMVPE system and typical LPOMVPE process parameters. 相似文献
74.
75.
Journal of Electronic Materials - Low pressure chemical vapor deposition (LPCVD) of tungsten (W) by SiH4 reduction of WF6 on Si(100) surfaces was studied in a single-wafer, cold-wall reactor over a... 相似文献
76.
S. J. C. Irvine A. Stafford M. U. Ahmed A. Brown H. Kheyrandish 《Journal of Electronic Materials》1997,26(6):723-727
The first detailed comparison has been made of the metalorganic vapor phase epitaxy growth rates of CdTe, ZnTe, and ZnSe,
measured in situ with laser reflectometry. The comparison also includes the photo-assisted growth with visible radiation from
an argon ion laser. Using a standard Group II precursor (DMCd or DMZn.TEN) partial pressure of 1.5 × 10−4 atm, VI/II ratio of 1 and DIPM (M = Te, Se) the maximum growth rates are in the region of 10 to 15 AU/ s. Decrease in growth
rates of ZnTe at higher temperatures or higher laser powers have been attributed to the desorption from the substrate of unreacted
Te precursor. The behavior of DTBSe is quite different from DIPSe for both pyrolytic and photo-assisted growth. The maximum
growth rate is around 1 AU/ s with very little photo-enhancement, except at 300°C. Secondary ion mass spectroscopy analysis
of hydrogen concentration in the ZnSe layers shows high concentrations, up to 5.9 × 1019 atoms cm−3 for DTBSe grown ZnSe under pyrolytic conditions. These results show that the growth kinetics play an important part in the
incorporation of hydrogen and passivation of acceptor doped material. 相似文献
77.
T. Kawakami Y. Koide N. Teraguchi Y. Tomomura A. Suzuki Masanori Murakami 《Journal of Electronic Materials》1998,27(8):929-935
In order to prepare low resistance ohmic contacts to p-ZnSn by the “deposition and annealing (DA)” technique which has been
extensively used for GaAs and Si-based devices, formation of a heavily doped layer by the p-ZnSe/metal reaction is required.
For p-ZnSe/Ni contacts, Ni and Se reacted preferentially at the ZnSe/Ni interface upon annealing at temperatures higher than
250°C. However, capacitance-voltage measurements showed that the net acceptor concentration (NA-ND) close to the p-ZnSe/Ni interface was reduced upon the Ni/ZnSe reaction, resulting in high contact resistance. For p-ZnSe/Au
contacts, neither Au/ZnSe reaction nor reduction of the acceptor concentration were observed after annealing at temperatures
lower than 300°C. This indicates that although the metal/p-ZnSe reaction is mandatory to prepare a heavily doped layer, the
reaction induced an increase in the compensation donors in the p-ZnSe substrate. In order to increase the acceptor concentration
in the vicinity of the p-ZnSe/metal interface through diffusion from the contact materials, Li or O which was reported to
play the role of an acceptor in ZnSe was deposited with a contact metal and annealed at elevated temperatures. Ni or Ag was
selected as the contact metal, because these metals were expected to enhance Li or O doping by reacting with ZnSe. However,
the current density-voltage characteristics of the Li(N)/Ni and Ag(O) contacts exhibited rectifying behavior, and the contact
resistances increased with increasing annealing temperature. The present results indicated that, even though the acceptor
concentration in the p-ZnSe substrate increased by diffusion of the dopants from the contact elements, an increment of the
compensation donors was larger than that of the acceptors. The present experiments indicated that preparation of low resistance
ohmic contacts by forming a heavily doped intermediate layer between p-ZnSe and metal is extremely difficult by the DA technique. 相似文献
78.
79.
C. S. Wisdom 《Journal of chemical ecology》1985,11(11):1553-1565
Larvae of the monophagous herbivore,Trirhabda geminata, selectively eat particular plants and plant parts of its natural host,Encelia farinosa. Measurements of leaf damage and larval positions on branches through time support this observation. Time-lapse movie photography revealed that larvae are sufficiently mobile to search most of a plant in a 48-hr period and that aggregations were the result of larval activity and not directly the result of oviposition. Experiments withT. geminata larvae on artificial diets containing a range of natural concentrations of chemical extracts fromE. farinosa leaves showed that the larvae grew significantly slower and had a lower overall survivorship at the high concentration. Combining the results of all choice tests, larvae appeared unable to distinguish between high- and low-concentration agar diets. Considered individually, larval preferences for natural production concentrations changed as the season progressed. Early-season larvae preferred low-concentration leaves, while late-season larvae preferred high-concentrations. Measurements of chemical and nitrogen content of leaves selected by larvae in the field confirmed this pattern. Percent parasitism in field-collected larvae increased with season as the larval population decreased. This combination of slowed growth and increasing parasitism and predation is a putative defense strategy ofEncelia farinosa to prevent adaptation by a specialist herbivore to the total range of compounds elaborated. 相似文献
80.
A.A.Fior M.Fabbro 《钢铁》2007,42(10):83-86
埃及Ain Sukhna Ezz带钢厂的电弧炉是达涅利公司建造的最大的电弧炉之一,由于可选用多种入炉原料,采用最优化熔炼和精炼方法,可在电弧炉上以转炉生产成本生产转炉优质钢种. 相似文献