高功率脉冲水中放电的应用及其发展

首先介绍了高功率脉冲水下放电的机理，然后综合论述了其应用和研究的状况，从较为成熟的脉冲水处理技术到医疗领域的ESWL应用技术，以及在脉冲电场食品杀菌和水下目标探测方面的最新发展和研究，最后指出了高功率脉冲电技术应用前景以及进行更系统和深入研究的必要性。     

Wear and Creep Characteristics of a Carbon‐Derived Si3N4/SiC Micro/Nanocomposite

In the presented work some properties of a recently developed Si₃N₄/SiC micro/nanocomposite have been investigated. The material was tested using a pin on disc configuration. Under unlubricated sliding conditions using Si₃N₄ pin at 50 % humidity, the friction coefficient was in the range of 0,6 ‐ 0,7. The reduction of humidity resulted in a lower coefficient of friction, in vacuum the coefficient of friction had a value of about 0,6. The wear resistance in vacuum was significantly lower then that in air. The wear patterns on the Si₃N₄+SiC disc revealed that mechanical fracture was the wear controlling mechanism. Creep tests were realized in four point bending configuration in the temperature interval 1200‐1400 °C at stresses 50,100 and 150 MPa and the minimal creep deformation rate was established for each stress level. The activation energy, established from the minimal creep deformation had a value of about 360 kJ/mol and the stress exponent values were in the range of 0.8‐1.28. From the achieved stress exponents it can be assumed that under the studied load/temperature conditions the diffusion creep was the most probable creep controlling mechanism.     

双室充氮包装机的技术改进

分析了原机型的性能特点和不足之处,介绍了改进方案。     

A New Approach for Built‐in Self‐Test of 4.5 to 5.5 GHz Low‐Noise Amplifiers

This paper presents a low‐cost RF parameter estimation technique using a new RF built‐in self‐test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST circuit is designed using 0.18 μm SiGe technology. The test technique utilizes input impedance matching and output DC voltage measurements. The technique is simple and inexpensive.     

低差错平底特性的非规则LDPC码的设计

介绍了非规则LDPC码的发展并给出了其优势及缺点，重点论述用ACE算法来构造非规则LDPC码从而降低其差错平底特性。对降低非规则LDPC码的差错平底特性的其它方法提出了展望。     

子空间方法盲多用户检测技术分析与探索

着重分析了基于子空间跟踪的盲线性多用户检测算法 ,并对其内部算法模块进行了仿真比较 ,最后对算法性能改善方法提出了自己的新思路     

Sociotechnical systems, risk management, and public health: comparing the North Battleford and Walkerton outbreaks

Accidents in different complex sociotechnical systems are rarely compared using the same theoretical framework for risk management. We conducted a comparative analysis of two Canadian public health disasters involving drinking water distribution systems, the North Battleford Cryptosporidium parvum outbreak in April 2001 and the Walkerton E. coli outbreak in May 2000. Both accidents resulted from a complex interaction between all levels of a complex sociotechnical system. However, the low-level physical and individual factors differed in the two cases, whereas, the high-level governmental and regulatory factors tended to be the same. These findings may have implications for the design of public policies to minimize risk in complex sociotechnical systems.     

海杂波中基于混沌预测的目标检测方法改进

基于记忆库非线性预测的NP-CFAR方法是目前混沌海杂波背景中目标检测的一种典型而先进的方法.考虑到海杂波功率与特征的时变不稳定性,本文提出运用旋转超盒分类取代这一方法中的NP-CFAR进行目标检测,并探讨了运用盒维数特征提取进行预处理以节省运算开销的问题.仿真实验验证了本文所提改进方法的有效性.     

应用AR模型的IMU误差系数漂移预测研究

将影响IMU误差系数漂移并难于分离的多种因素综合为一种因素，假定IMU误差系数的漂移由一特定系统所引起，从而采用时间序列建模方法进行IMU误差系数漂移的预测。该方法具有消除各因素具体分析中的不确定性并减少其工作员的优点。文中描述了其原理，对某惯组的33个误差系数进行了时间序列建模与预测并得到有效的结果。最后还阐述了存在的问题及其解决方法。     

Signal Integrity: Fault Modeling and Testing in High-Speed SoCs

As we approach 100 nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-on-chips. Voltage distortion (noise) and delay violations (skew) contribute to the signal integrity loss and ultimately functional error, performance degradation and reliability problems. In this paper, we first define a model for integrity faults on the high-speed interconnects. Then, we present a BIST-based test methodology that includes two special cells to detect and measure noise and skew occurring on the interconnects of the gigahertz system-on-chips. Using an inexpensive test architecture the integrity information accumulated by these special cells can be scanned out for final test and reliability analysis.