Electrical conductivity changes of bulk tin and Sn-3.0Ag-0.5Cu in bulk and in joints during isothermal aging

The changes of electrical conductivity(resistance) between Sn-3.0Ag-0.5Cu solder joints and printed circuit board(PCB) assembly during aging at 125℃were investigated by the four-point probe technique.The microstructural characterizations of interfacial layers between the solder matrix and the substrate were examined by optical microscopy and scanning electronic microscopy.Different types of specimens were designed to consider several factors.The experimental results indicate that electrical conductivitie...     

Parameter fitting of constitutive model and FEM analysis of solder joint thermal cycle reliability for lead-free solder Sn-3.5Ag

The experimental tests of tensile for lead-free solder Sn-3.5Ag were performed for the general work temperatures range from 11 to 90 °C and strain rate range from 5×10⁻⁵ to 2×10⁻² s⁻¹, and its stress—strain curves were compared to those of solder Sn-37Pb. The parameters in Anand model for solder Sn-3.5Ag were fitted based on experimental data and nonlinear fitting method, and its validity was checked by means of experimental data. Furthermore, the Anand model was used in the FEM analysis to evaluate solder joint thermal cycle reliability. The results show that solder Sn-3.5Ag has a better creep resistance than solder Sn-37Pb. The maximum stress is located at the upper right corner of the outmost solder joint from the symmetric center, and thermal fatigue life is predicted to be 3.796×10⁴ cycles under the calculated conditions. Foundation item: Project(50376076) supported by the National Natural Science Foundation of China     

典型添加元素对Sn-Zn系钎料性能的影响

Sn-Zn钎料被认为是传统Sn-Pb共晶钎料的最佳替代合金之一,它以低廉的成本、较好的力学性能以及其共晶成分与Sn-37Pb钎料熔点相近等优点引起了人们的广泛关注,但其润湿性、抗氧化性、抗腐蚀性不够理想.阐述了Bi、A1、In、Ag、Cu及稀土元素(RE)等典型添加元素对Sn-Zn钎料各种性能的影响,以期为Sn-Zn钎...     

AuSn焊料预热温度对高功率半导体激光器封装质量影响的研究

为提高高功率半导体激光器封装质量,对AuSn焊料预热温度进行研究。通过分析AuSn焊料共晶原理,建立四组不同预热温度的AuSn焊料封装试验。通过对比不同预热温度下封装器件的光电参数,光谱特性及SEM检测效果,对实验结果进行分析。实验结果表明AuSn焊料的预热温度对高功率半导体激光器封装质量有重要影响,并得出AuSn焊料预热温度在235℃时高功率半导体激光器的封装质量最为理想。     

合金元素对铝基钎料组织和性能的影响

采用正交试验法设计低熔点Al-Si-Cu-Mg系钎料成分,通过金相、硬度、铺展及差热等方法,分析钎料的显微组织及性能。结果表明:钎料的组织主要由基体相α-Al、粒状相Mg2Si、骨骼状相Al2Cu(θ相),以及θ相和Mg2Si的复杂共晶组成;合金元素对显微硬度及熔化特性的影响由主到次的顺序为Cu、Si、Mg;受金属间化合物Al2Cu和Mg2Si以及初晶Si析出的影响,当Cu、Si含量达到一定值(10%Cu、7.5%Si)后,钎料铺展面积变化不大,试验配方中Al-7.5Si-20Cu-0.4Mg熔点529℃时,铺展面积大,综合性能良好。     

新型中温钎料Ag-Cu-Ge-Sn-Ni的初步研究

根据合金相图的基本原理,结合Ag-Cu-Ge系三元相图,设计了含有少量合金元素Sn、Ni的中温钎料合金Ag-Cu24．0-Ge25．0-Sn4．0-Ni0．2(质量分数,％)。通过钎料合金与Ni板的润湿性测试及润湿后界面的微观组织分析,表明该合金对于纯Ni具有良好的漫流性和润湿性。     

Sn-9Zn无铅钎料合金的压蠕变行为研究

试验研究了Sn-9Zn合金钎料在温度为40～100℃和压力为9．3～18．6MPa范围内的压蠕变行为。结果表明：随温度和应力的升高，合金的压蠕变量增大，稳态蠕变速率的对数分别与应力对数和温度呈较好的线性关系，稳态蠕变速率符合半经验公式。在不同的温度下，应力指数n相近，平均值为5．74；不同的应力下，表观激活能Qa相差不大，平均值为51．95kJ／mol，材料结构常数为0．03，压蠕变变形是位错滑移和位错攀移共同作用的结果，控制稳态蠕变速率的主要因素为位错管道扩散过程控制下的位错攀移。     

应力对SnPb基复合钎料钎焊接头蠕变性能的影响

采用搭接面积为1mm^2的单搭接钎焊接头，研究了恒定温度下，应力对纳米颗粒增强的SnPb基复合钎料钎焊接头的蠕变寿命的影响。结果表明，纳米颗粒增强的SnPb基复合钎料的蠕变抗力优于传统SnPb钎料。同时钎焊接头的蠕变寿命随应力增加而降低，且应力对复合钎料钎焊接头蠕变寿命的影响较传统63Sn37Pb钎料明显。     

Effect of bismuth on the growth kinetics of intermetallic compounds in Sn-3.5Ag solder joints: A growth kinetic model

The effect on the growth kinetics of the intermetallic compounds (IMCs) in solder/Cu joints, caused by adding Bi to eutectic Sn-3.5Ag solder alloy, was examined at the aging temperatures of 150°C and 180°C. The Cu₆Sn₅ layer growth was significantly enhanced, but the Cu₃Sn layer growth was slightly retarded by the addition of Bi, resulting in significant growth enhancement of the total (Cu₆Sn₅+Cu₃Sn) IMC layer with increasing Bi addition. The IMC layer growth in the Bi-containing solder joints was accompanied by the accumulation of Bi ahead of the Cu₆Sn₅ layer that resulted in the formation of a liquid layer at the Cu₆Sn₅/solder interface. A kinetic model was developed for the planar growth of the Cu₆Sn₅ and Cu₃Sn layers in the solder joints, accounting for the existence of interfacial reaction barriers. Predictions from the kinetic model showed that the experimental results could be well explained by the hypothesis that the formation of a Bi-rich liquid layer at the Cu₆Sn₅/solder interface reduces the interfacial reaction barrier at the interface.     

微量Ge对大气下液态Sn抗氧化性能的影响

采用观察液态Sn表面氧化行为和刮取表面氧化渣的方法,研究了微量元素Ge对液态Sn在大气和250℃条件下表面抗氧化性能的影响,并与纯Sn的氧化行为进行对比;利用X射线光电子能谱仪(XPS)、扫描电子显微镜(SEM)研究了合金表面元素的含量、价态,及合金氧化后的表面形貌.结果表明:当微量元素Ge浓度达到0.01%时(质量分数),大气下液态Sn表面具有很好的抗氧化性能,同时微量元素在液态Sn表面高度富集.XPS分析表明:表面富集的Ge以4价氧化物形式存在.静态液面氧化时,Ge在液态Sn中迅速偏析,并形成一种保护性的致密氧化膜,是提高液态Sn抗氧化性能的原因.