电子系统封装器件的传热研究

开发了一个电子系统封装(SIP)典型器件的传热模型,用数值方法模拟了器件的热传递过程和温度分布状况,探讨了各种设计参数和物性参数对温度场的影响。计算结果表明:当t = 1 400 s,以LCP为基板时SIP器件传热过程达到稳定态,基板导热系数和对流换热系数是影响器件散热速率的关键参数,此外还计算了对于不同的环境对流换热系数和不同基板材料,不使芯片产生热失效所允许的输入功率耗散密度。这为研究高密度电子封装器件的热特性,进一步改善器件的热性能提供了理论依据。     

Investigation of ultrasonic vibrations of wire-bonding capillaries

Ultrasonic energy is widely used in wire bonding for microelectronics packaging. It is necessary to ensure that the maximum ultrasonic vibration displacement occurs at or near the tip of the bonding tool (capillary) for optimal performance. In this study, amplitude profiles of ultrasonic vibrations along capillaries were measured with load using a laser interferometer. This provided valuable information in understanding and improving capillary performance. The method was applied to real time applications to optimize capillary designs and bonding processes for specific bonding applications. First, the application of a new capillary material with different zirconia compositions was evaluated. The new material with certain amount of zirconia composition showed that it was the capillary material of choice for ultra-fine pitch wire bonding. Next, comparative analysis was conducted to investigate the ultrasonic energy transfer of a new ‘slimline’ bottleneck and the conventional bottleneck. The actual bonding response of the molded slimline bottleneck showed comparable performance with the ground conventional bottleneck using the same bonding parameters. Finally, optimization of a 60-μm-bond-pad-pitch process was performed on a wire bonder. Within the optimized parameter ranges, the ultrasonic displacement of the capillary was monitored. For all possible combinations of bond force and bond power, the ultrasonic displacement of the capillary increased with increasing bond power, without drastic changes caused by bond force changes. This indicated that the selected process window was located in a stable region.     

互连封装结构电特性分析中的改进PEEC三维建模

本文提出了一种改进的PEEC模型,为便于在大规模互连封装结构分析中利用规模缩减技术,它以描述系统的状态方程代替了具体的等效电路.为此它以矢量磁位的积分表达式和洛仑兹规范代替了矢量磁位和标量电位的积分表达式,对积分方程进行展开.这样做可以避免复杂介质结构中的电容矩阵提取,大大节省了计算时间.这一模型可方便地嵌入更大的系统进行分层次的综合分析和利用PVL等规模缩减技术.数值计算的结果与其他文献吻合较好,表明该方法有较高的可靠性.     

白光LED荧光粉远场涂覆光学性质

研究了白光LED远场隔离封装中隔离距离对发光效率及相关色温(CCT)的影响。实验结果表明,低电流输入条件下,白光LED的发光效率随芯片表面到荧光粉层距离变化是非线性的,当芯片表面到荧光粉层距离为0.88mm时具有最佳发光效率74lm/W,白光LED相关色温随着距离的增加呈线性下降。这为白光LED的一次光学设计提供了实验依据。     

倒装片可修复底部填充材料的研究现状及发展

有机基板上的倒装芯片一般采用底部填充技术以提高其封装的可靠性.有缺陷的芯片在倒装后难以进行返工替换,使得倒装芯片技术成本提高,限制了此技术的应用.提出新型可修复底部填充材料的开发成为解决这一问题的有效途径.介绍了倒装芯片的可修复底部填充技术和可应用于可修复底部填充材料的技术要求,并综述了国内外对于可修复底部填充材料的研究现状.     

微电子封装技术的发展与展望

微电子技术的发展,推动着微电子封装技术的不断发展、封装形式的不断出新。介绍了微电子封装的基本功能与层次,微电子坟技术发展的三个阶段,并综述了微电子封装技术的历史、现状、发展及展望。     

无铅电子封装Sn-Cu焊料润湿性试验研究

为了改善无铅焊料的润湿性,配置活性剂松香焊剂和无机物焊剂,研究了Sn-0.75 Cu焊料的润湿性.分析讨论了影响Sn-0.75 Cu焊料润湿性的主要因素,获得了焊剂和Sn-0.75 Cu焊料的最优匹配.在镀锡铜片上,5#焊剂匹配Sn-0.75 Cu焊料能够获得最佳的润湿性(润湿角为18°),已接近Sn-37 Pb焊料的润湿性.     

热超声倒装键合过程中的非线性动力学行为

在作为微器件电气互连主要手段的热超声键合工艺中,微细键合区域内金属变形/变性/互连所需的能量,来自于超声波功率源通过换能系统所施加的微幅压剪动载.对热超声倒装键合过程的研究说明,PZT换能系统在热超声倒装键合工艺过程中的非线性动力学行为,如换能系统启动后的初值敏感性和不确定性,键合工具与换能杆之间的不稳定动力耦合,倒装芯片运动的奇异相轨线等,是深入研究键合机理以及提高工艺可靠性的重要关键.     

小波变换分离太阳射电频谱图中的纤维结构

太阳射电爆发纤维精细结构是太阳射电爆发活动中一类重要的观测现象,利用二维小波变换对纤维精细结构动态频谱图进行处理,分离频谱图中的纤维结构。首先对原始频谱图实行多层小波变换,由低频分量重构原始图像,就可得到爆发的背景信息,令原始频谱图减去背景并经过阈值处理后,便可将原始频谱图中的纤维结构很好地分离出来。     

圆片级低温富锡金锡键合

Sn-rich Au–Sn solder bonding has been systematically investigated for low cost and low temperature wafer-level packaging of high-end MEMS devices.The AuSn2 phase with the highest Vickers-hardness among the four stable intermetallic compounds of the Au–Sn system makes a major contribution to the high bonding shear strength.The maximum shear strength of 64 MPa and a leak rate lower than 4.9×10-7 atm·cc/s have been obtained for Au46Sn54 solder bonded at 310 ℃.This wafer-level low cost bonding technique with high bonding strength can be applied to MEMS devices requiring low temperature packaging.