A soft measurement technique is presented, which the pulp suspension flow velocity (PSFV) can be obtained by analysis of pulp fibre consistency signal without using the flow sensor or flow meter. Doppler Effect in pulp fibre consistency signal, which is caused by the relative motion between pulp suspension flowing in pulp pipe and consistency sensor fixed in the pipe, is discovered on the basis of studying the structure of pulp suspension and the properties of pulp fibre consistency signal, and it is proved by wavelet transform (WT) in this paper. WT are used to analyse pulp fibre consistency signal based on Doppler Effect. PSFV can be determined by the average period of WT which is used to analyse pulp fibre consistency signal based on Doppler Effect. The corresponding tests indicate that the measurement technique is feasible with high precision and better dynamic characteristics. 相似文献
A novel technique was developed to control the deposition of electrospun polyurethane fibers using a silicone collector substrate patterned with soft lithography. This method can be used to control selective fiber deposition with broad pattern dimensions (50–500 µm) over a large area. The combination of ease of use, low cost, tunability, and generation of relatively large fiber mats available with this technique is expected to advance our ability to mimic the orientation and anisotropic properties of native tissues to generate improved tissue engineering scaffolds.
We first study the impacts of soft errors on various types of CAM for different feature sizes. After presenting a soft error immune CAM cell, SSB-RCAM, we propose two kinds of reliable CAM, DCF-RCAM and DCK-RCAM.In addition, we present an ignore mechanism to protect dual cell redundancy CAMs against soft errors. Experimental results indicate that the 11T-NOR CAM cell has an advantage in soft error immunity. Based on 11T-NOR, the proposed reliable CAMs reduce the SER by about 81% on average with acceptable overheads. The SER of dual cell redundancy CAMs can also be decreased using the ignore mechanism in specific applications. 相似文献
Reliability is expected to become a big concern in future deep sub-micron integrated circuits design.Soft error rate(SER) of combinational logic is considered to be a great reliability problem.Previous SER analysis and models indicated that glitch width has a great impact on electrical masking and latch window masking effects,but they failed to achieve enough insights.In this paper,an analytical glitch generation model is proposed.This model shows that after an inflexion point the collected charge has an... 相似文献