基于特定产业集群生命周期下的政府政策分析

产业集群与产业、产品一样也存在生命周期。本文通过对产业集群生命周期的各阶段进行分析,简述了其各阶段的特征及表现。进而提出政府在各阶段中所处位置与应采取的措施。     

CCGA封装特性及其在航天产品中的应用

介绍了CCGA封装的基本组成及焊柱的3种连接技术,对CCGA如何实现高互联密度、高性能、高可靠性的大尺寸封装进行了详细描述。CCGA板级装配的热循环试验结果表明CCGA封装技术达到甚至超过了典型卫星对航天电子设备可靠性的要求;CCGA散热时施加在器件顶部的压力超过极限值后将对可靠性产生严重影响。板级装配设计的关键要素和板级组装的关键工艺在文中也进行了概括性的叙述。     

Molecular beam epitaxy growth of high-quality HgCdTe LWIR layers on polished and repolished CdZnTe substrates

We report here molecular beam epitaxy (MBE) mercury cadmium telluride (HgCdTe) layers grown on polished and repolished substrates that showed state-of-the-art optical, structural, and electrical characteristics. Many polishing machines currently available do not take into account the soft semiconductor materials, CdZnTe (CZT) being one. Therefore, a polishing jig was custom designed and engineered to take in account certain physical parameters (pressure, substrate rotational frequency, drip rate of solution onto the polishing pad, and polishing pad rotational velocity). The control over these parameters increased the quality, uniformity, and the reproducibility of each polish. EPIR also investigated several bromine containing solutions used for polishing CZT. The concentration of bromine, as well as the mechanical parameters, was varied in order to determine the optimal conditions for polishing CZT.     

DV摄像机在旅游中的技术处理与技巧应用

DV摄像机在旅游中的技术处理与拍摄技巧应用是众多旅游爱好者共同关注的问题,从分析DV摄像机技术特性、摄像中的技术处理和技巧应用等几方面介绍如何拍摄旅游景点中优美独特的风光景色、记录景点的人文景观、捕捉愉快有趣的旅游情景,从而增强旅游摄像画面的表现力,使旅游生活更具意义和情趣.     

I DDQ testing in CMOS digital ASICs

I _DDQ testing with precision measurement unit (PMU) was used to eliminate early life failures caused by CMOS digital ASICs in our products. Failure analysis of the rejected parts found that bridging faults caused by particles were not detected in incoming tests created by automatic test generation (ATG) for stuck-at-faults (SAF). The nominal 99.6% SAF test coverage required to release a design for production was not enough! This article shows how I _DDQ testing and supplier process improvements affected our early life failure rates over a three year period. A typical I _DDQ measurement distribution, effects of multiple I _DDQ testing, and examples of the defects found are presented. The effects of less than 99.6% fault coverage after the I _DDQ testing was implemented are reviewed. The methods used to establish I _DDQ test limits and implement the I _DDQ test with existing ATG testing are included. This article is a revision of one given at International Test Conference [1].     

基于寿命周期成本管理的输变电设备状态检修方法分析

文章对输变电寿命周期成本管理内涵进行分析,并基于寿命周期成本管理对输变电设备状态检修方法进行研究,最后结合实例进一步了解和掌握检修方法,旨在为输变电状态检修提供更多支持.     

长“眼睛”的电源插座构思、设计与制作

长“眼睛”电源插座,实现功能是一旦家用电器金属外壳带电,它就能“看”到,同时发出报警声提醒人们,用电器外壳已经带电不要触碰,并切断用电器的电源。这样就人们没有触电之前就已保护了,比起现在市场上触电保安器（还要在灵敏的情况下）在有人触电以后才保护,安全系数提高了很多倍。     

利用游程统计的办法估计长码参数

在现阶段，长码在GPS，CDMA通信等领域发挥着很重要的作用，因此也是信息对抗研究的重点对象。利用长码中固有的统计规律来估计长码的寄存器长度，抽头多项式等参数，从而在只接收部分长码的情况下计算出整个长码周期。     

1995年汛期长江流域长期水文气象预报及其验证分析

长江流域汛期长期水文气象预报成果是通过对气候背景的分析，前期天气气候征兆和重要物理因子的分析，最后经专家会商形成的，在预报方案制定过程中，坚持水文与气象，短中长期预报，科学研究与预报应用相结合，从定性上讲，无论时间和空间都基本吻合，对１９９５年长江汛期防洪发挥了重要的耳目作用。