CATV中的分支器及分配系统

本文提出了通过分支器的传输效率来评判分支器性能及数据的合理程度,并对分支系列值的最佳取值进行了论证。文中还提出了一种用户分配系统的快速设计方法。     

X射线能谱分析中对铁的百分含量修正的理论推导和实验测定

在KYKY-1000B扫描电镜上进行X射线能谱分析时,常出现附加的铁峰。本文从理论上对产生附加铁峰的原因作出了解释,并推导出附加铁峰强度和样品原子序数的函数关系的解析表达式,同时对附加的铁的百分含量进行了实验测量。由实验数据拟合得出的实验曲线和理论分析得出的表达很好地符合。     

用复射线理论研究波束经天线罩的传输

本文研究了三维复射线理论,给出了三维空间中一般的复射线追踪法,对旋转抛物形单层介质天线罩的波束传输特性进行了计算.根据计算出的数据绘制了远区和近区波束传输特性方向图,并与无介质天线罩时波束方向图进行了对比,从而明确了天线罩对波束传输的影响.     

Partial scan flip-flop selection by use of empirical testability

Partial serial scan as a design for testability technique permits automatic generation of high fault coverage tests for sequential circuits with less hardware overhead and less performance degradation than full serial scan. The objective of the partial scan flip-flop selection method proposed here is to obtain maximum fault coverage for the number of scan flip-flops selected. Empirical Testability Difference (ETD), a measure of potential improvement in the testability of the circuit, is used to successively select one or more flip-flops for addition or deletion of scan logic. ETD is calculated by using testability measures based on empirical evaluation of the circuit with the acutal automatic test pattern generation (ATPG) system. In addition, once such faults are known, ETD focuses on the hard-to-detect faults rather than all faults and uses heuristics to permit effective selection of multiple flip-flops without global optimization. Two ETD algorithms have been extensively tested by using FASTEST ATPG [1, 2] on fourteen of the ISCAS89 [3] sequential circuits. The results of these tests indicate that ETD yields, on average, 35% fewer uncovered detectable faults for the same number of scanned flip-flops or 27% fewer scanned flip-flops for comparable fault coverage relative to cycle-breaking methods.This work was performed while the author was with the University of Wisconsin-Madison.     

Design of testable sequential circuits by repositioning flip-flops

This paper presents a technique to enhance the testability of sequential circuits by repositioning flip-flops. A novel retiming for testability technique is proposed that reduces cycle lengths in the dependency graph, converts sequential redundancies into combinational redundancies, and yields retimed circuits that usually require fewer scan flip-flops to break all cycles (except self-loops) as compared to the original circuit. Our technique is based on a new minimum cost flow formulation that simultaneously considers the interactions among all strongly connected components (SCCs) of the circuit graph to minimize the number of flip-flops in the SCCs. A circuit graph has a vertex for every gate, primary input and primary output. If gatea has a fanout to gateb, then the circuit graph has an arc from vertexa to vertexb. Experimental results on several large sequential circuits demonstrate the effectiveness of the proposed retiming for testability technique in reducing the number of partial scan flip-flops.     

程控电话交换机过电流保护元件用高性能PTC陶瓷的研制

阐述了高性能ＰＴＣ陶瓷材料制备的基本要点，并以基方固溶体化学组成、原材料选择、复合添加物改性以及特定烧结工艺等方面开展工作，制得了居里温度为９０℃左右、室温体积电阻率为３０Ω·ｃｍ，电阻率突变ρνｍａｘ／ρνｍｉｎ＞１０５、电阻率温度系数α≈１５％／℃、耐电压强度≥１５０Ｖ／ｍｍ的高性能ＰＴＣ陶瓷材料。此材料制得的元件能满足程控电话交换机过电流保护的要求。     

异质谷间转移电子器件的计算机模拟

使用弛豫时间近似求出了描述两能谷间电子交换的方程。在此基础上建立了双能谷电子的连续性方程和油松方程。对具体的ＧａＡｓ／ＡｌｘＧａ１－ｘＡｓ异质谷间转移电子器件结构求解了这些方程组，得到了直流工作时器件内的电场分布、双能谷中载流子的布居以及两个能谷的电流分布。这些结果正好和常规Ｇｕｎｎ器件相反，说明了两种器件的不同工作机理。最后通过对低Ａｌ组份势垒结构的计算说明了Ｘ谷电子注入对器件工作的重要作用。     

基于新型抗扰数学模型的无扰控制

根据某些生产过程控制中被控对象所受的干扰量过多，对象反应速度较快，常规控制手段不适应的情况，引入修正权函数的理论，了新型的抗拓数学模型，并在ＹＥＷＰＡＣＫ计算机系统上实现了对步进式加热炉燃烧系统进行控制，有效地抑制了多干扰量，提高了该燃烧系统的控制效果。     

双色红外系统的参数优化设计及作用距离的计算与分析

对采用玫瑰线图形扫描的红外搜索与跟踪系统的技术参数选取以及作用距离计算等问题，进行了系统的研究。提出了有效的计算方法和专用程序，并作了必要的评述与分析，全文以一具体的实验系统，对方法和过程作进一步的论述。     

超薄型钢结构防火涂料的研究

重点阐述了超薄型钢结构防火涂料的防火机理及其组成中基料、脱水催化剂、炭化剂、发泡剂的作用,描述了国内外超薄型钢结构防火涂料发展的现状,指出了国内在超薄型钢结构防火涂料中存在的问题及其未来的发展趋势。