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101.
The impossibility of exact arc length computation for ‘standard’ parametric curves such as Bézier/B-spline curves makes it difficult to generate a feedrate profile with desired accelerations in real-time. This paper presents a new recursive trajectory generation method that estimates an admissible path increment and determines the initiation of the final deceleration stage according to the distance left to travel estimated at every sampling time, resulting in exact feedrate trajectory generation through jerk-limited acceleration profiles for the parametric curves. The proposed approach allows the feedrate profile to be dynamically adjusted according to geometrical path constraints for the curved path. The simulation result has been also provided to illustrate the generation of smooth feedrate profile encompassing a sequence of mixed NC blocks including traditional linear and circular blocks.  相似文献   
102.
A low‐cost microcontroller based control and data acquisition unit for digital image recording of scanning electron microscope (SEM) images and scanning electron microscope based electron beam lithography (EBL) is described. The developed microcontroller low‐level embedded software incorporates major time critical functions for image acquisition and electron beam lithography and makes the unit an intelligent module which communicates via USB with the main computer. The system allows recording of images with up to 4096 × 4096 pixel size, different scan modes, controllable dwell time, synchronization with main power frequency, and other user controllable functions. The electron beam can be arbitrary positioned with 12‐bit precision in both dimensions and this is used to extend the scanning electron microscope capabilities for electron beam lithography. Hardware and software details of the system are given to allow its easy duplication. Performance of the system is discussed and exemplary results are presented.  相似文献   
103.
The objective of this investigation was to evaluate the practical effects of electron beam broadening in the environmental scanning electron microscope (ESEM) on particle x-ray microanalysis and to determine some of the optimum operating conditions for this type of analysis. Four sets of experiments were conducted using a Faraday cage and particles of copper, glass, cassiterite, andrutile. The accelerating voltage and chamber pressure varied from 20 to 10 kV and from 665–66 Pa (5.0 to 0.5 torr), respectively. The standard gaseous secondary electron detectors (GSED) and the long environmental secondary dectectors (ESD) for the ESEM were evaluated at different working distances. The effect of these parameters on the presence of artifact peaks was evaluated. The particles were mounted on carbon tape on an aluminum specimen mount and were analyzed individually and as a mixture. Substrate peaks were present in almost all of the spectra. The presence of neighboring particle peaks and the number of counts in these depended upon the operating conditions. In general, few of these peaks were observed with the long ESD detector at 19 mm working distance and at low chamber pressures. More peaks and counts were observed with a deviation from these conditions. The most neighboring peaks and counts were obtained with the GSED detector at 21.5 mm working distance, 10 kV accelerating voltage, and 665 Pa (5.0 torr) chamber pressure. The results of these experiments support the idea that the optimum instrumental operating conditions for EDS analysis in the ESEM occur by minimizing the gas path length and the chamber water vapor pressure, and by maximizing the accelerating voltage. The results suggest that the analyst can expect x-ray counts from the mounting materials. These tests strongly support the recommendation of the manufacturer to use the long ESD detector and a 19 mm working distance for EDS analysis. The results of these experiments indicate that neighboring particles millimeters from the target may contribute x-ray counts to the spectrum.  相似文献   
104.
In this paper, the repair of a cracked beam under an external dynamic load employing the electro-mechanical characteristic of piezoelectric material to induce a local moment is presented. Conceptually, an external voltage is applied to actuate a piezoelectric patch bonded on the beam to effect closure of a crack so that the singularity at the crack tip under dynamic load may be decreased. Globally, this has the effect of altering the resonant frequency of the cracked beam towards that of the healthy beam, which is the criterion used for the repair. To demonstrate the repair methodology, a cantilever beam is used as an illustration, where the repair moment coefficient and the voltage required are mathematically derived. The relationship between repair moment coefficient, crack parameters and length of piezoelectric patch is investigated. The difference between the proposed repair criterion and an earlier published criterion for cracked beam under static load is also shown. A numerical example is used to study the effectiveness of the proposed repair methodology and its results are compared with those from 3-D finite element analyses using ABAQUS 6.4 as one means of verification.  相似文献   
105.
基于功率变化率的刀具破损监测系统   总被引:6,自引:0,他引:6  
介绍一种以刀具切削功率变化率为信号,利用单片机进行处理与判断,实现加工过程刀具破损在线监测的系统组成和工作原理,讨论了提高刀具破损报警准确性的措施。  相似文献   
106.
基于遗传算法进行张弦梁结构索力识别   总被引:1,自引:0,他引:1  
为识别张弦梁结构索力大小,提出了一种基于静力检测技术的索力识别方法.基于静力检测技术,定义了张弦梁结构索力识别的一般数学模型.通过分析张弦梁结构的整体受力特征,基于有限元方法提出了适用于张弦梁结构索力识别的识别模型.运用改进的遗传算法寻求问题的全局最优解,只需若干点位移实测值便可实现多个索段索力的同时识别.并编制了通用有限元计算程序,数值模拟算例验证了方法的可行性.  相似文献   
107.
针对齿形已经确定的摆线轮,在修正方式及修正量未知的情况下,利用改进的复合形法对摆线轮齿形修正方式及修正量进行了优化分析.同时,采用工艺过程简单的“等距+ 移距” 修正方式代替工艺过程较复杂的转角修正方式,使用该方法计算等距和移距修正量速度快,与传统的计算方法相比较,工作效率明显提高.计算结果表明:在摆线轮齿形的各种修正方式中,“正等距+ 负移距”修正方式是较理想的摆线轮齿形修正方式.这种修正方式具有理想齿形,加工工艺简单,在设计与制造中有一定的推广使用价值  相似文献   
108.
本研究运用文献资料法、专家访谈法、问卷调查法、测试法、数理统计等方法,以24名女运动员为研究对象,对不同水平竞技体操运动员平衡木项目平衡能力影响因素进行研究,得出结论:竞技体操运动员平衡木项目向前比向侧平衡容易保持;平衡木的高度、前庭机能和视觉对平衡能力均有影响。  相似文献   
109.
碳纤维材料在梁板加固工程中的应用   总被引:4,自引:0,他引:4  
以南京某高校教学楼卫生间梁板加固工程为例,阐述了应用碳纤维材料对混凝土梁板进行结构补强加固的设计原理、施工工序,提出了应用碳纤维布进行结构加固时应注意的事项。  相似文献   
110.
CBCT scanners have been widely used in angiography, radiotherapy guidance, mammography and oral maxillofacial imaging. To cut detector size, reduce manufacturing costs and radiation dose while keeping a reasonable FOV, the flat panel detector can be placed off-center horizontally. This scanning configuration extends the FOV effectively. However, each projection is transversely truncated, bringing errors and artifacts in reconstruction. In this paper, a simple but practical method is proposed for this scanning geometry based on truncation compensation and the modified FDK algorithm. Numerical simulations with jaw phantom were conducted to evaluate the accuracy and practicability of the proposed method. A novel CBCT system for maxillofacial imaging is used for clinical test, which is equipped with an off-center small size flat panel detector. Results show that reconstruction accuracy is acceptable for clinical use, and the image quality appears sufficient for specific diagnostic requirements. It provides a novel solution for clinical CBCT system, in order to reduce radiation dose and manufacturing cost.  相似文献   
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