稀土在氧-乙炔火焰喷焊层中的作用机理

运用透射电镜(TEM)、X-射线能谱仪(EDX)、扫描电镜(SEM)等物理检测手段对Fe-22CH中加入不同种类、含量的稀土获得的氧-乙炔火焰喷焊层的组织和性能进行分析研究,得出不同种类的稀土在火焰喷焊层中的作用以及对喷焊层性能的影响.     

一氧化碳中微量CO_2的热导色谱分析

通过实验建立了一氧化碳中微量CO_2的热导色谱分析方法.结果表明,该方法可同时检测一氧化碳中的微量CH_4和CO_2,其中CO_2的最低检出浓度为5×10~(-6).     

Residential energy use and conservation in Sweden

We describe energy use in Swedish homes from 1963 to 1980 using data assembled and analyzed for the first time. Changes in energy use by fuel and purpose before and after the 1973 oil price shock are illustrated and discussed, and savings in space heating in the year 1980, compared with the pre-embargo period, are quantified. We discuss two important elements of Swedish energy conservation policy, the building codes and the system of grants and loans to homeowners. We conclude that the grants and loans probably accelerated home retrofit measures, while the building codes will play an important role in reducing residential heat losses over the long term.     

湖南广播影视集团5.1CH多功能音频车系统设计与应用

本文详细介绍了湖南广播影视集团高清转播系统中的5.1CH音频车。从其设计思路、设备组成到安装调试,以及节目转播时与其他转播车级联等多功能应用等都进行了详细阐述。     

Zn(H2PO4)2-N[CH2CH2OPO(OH)2]3对碳钢的协同效应与缓蚀机理研究

采用失重法、表面观察法、极化曲线法、氩离子刻蚀法和ＸＰＳ分析法研究Ｚｎ（Ｈ２ＰＯ４）２－Ｎ「ＣＨ２ＣＨ２ＯＰＯ（ＯＨ）２」３在海水中对碳钢的协同效应与缓蚀机理。结果发现：５０％Ｚｎ（Ｈ２ＰＯ４）２＋５０＾Ｎ「（ＣＨ２ＣＨ２ＯＰＯ（ＯＨ）２」３（ＸＭ－３０３在海水中对碳钢具有明显的协同缓蚀效应。５０％Ｚｎ（Ｈ２ＰＯ４）２＋５０％Ｎ「ＣＨ２ＣＨ２ＯＰＯ（ＯＨ）２」３（ＸＭ－３０３）主要为阴极抑制型缓蚀     

AVR单片机在粒谱分析仪中的应用

介绍了以AVR单片机系列的ATmegal28芯片为控制核心的粒谱分析仪的设计思路,针对电子学部分给出了系统的软硬件设计方法,单片机与上位机通讯对仪器进行控制和气溶胶粒子的分析,并驱动液晶模块实现二维图形以及仪器状态等的显示,实现了人机交互.目前该系统正在试运行中并准备投入到环境气体监测中.     

基于CH375的USB移动存储接口设计

CH375作为USB移动存储设备的接口芯片,可大大减少外围电路,降低成本,提高研发速度。文中详细介绍了CH375的功能、特性,同时结合在蓄电池活化设备中的实际应用,给出了CH375与AVR单片机的接口电路和软件设计方法。     

一种使用CH341A编程器修改Hawk仪器FSU站号的方法

在Hawk仪器FSU维修过程中有对FSU站号修改的需求,使用CH341A编程器对U20芯片重新编程可以实现对FSU站号修改的目的。本文详细介绍了使用CH341A编程器修改Hawk仪器FSU站号的方法。     

车身总成焊接夹具的PLC控制

本文主要介绍了 CH10 15车身总成焊接夹具结构及其 PL C全自动控制。     

Structural and Chemical Changes to CH3NH3PbI3 Induced by Electron and Gallium Ion Beams

Organic–inorganic hybrid perovskites, such as CH₃NH₃PbI_3, have shown highly promising photovoltaic performance. Electron microscopy (EM) is a powerful tool for studying the crystallography, morphology, interfaces, lattice defects, composition, and charge carrier collection and recombination properties at the nanoscale. Here, the sensitivity of CH₃NH₃PbI₃ to electron beam irradiation is examined. CH₃NH₃PbI₃ undergoes continuous structural and compositional changes with increasing electron dose, with the total dose, rather than dose rate, being the key operative parameter. Importantly, the first structural change is subtle and easily missed and occurs after an electron dose significantly smaller than that typically applied in conventional EM techniques. The electron dose conditions under which these structural changes occur are identified. With appropriate dose‐minimization techniques, electron diffraction patterns can be obtained from pristine material consistent with the tetragonal CH₃NH₃PbI₃ phases determined by X‐ray diffraction. Radiation damage incurred at liquid nitrogen temperatures and using Ga⁺ irradiation in a focused ion beam instrument are also examined. Finally, some simple guidelines for how to minimize electron‐beam‐induced artifacts when using EM to study hybrid perovskite materials are provided.