基于AEM法的爆破拆除倒塌过程的数值模拟

利用应用单元法(AEM法),以含填充墙的某多层框架结构定向爆破拆除为例,进行倒塌过程的数值模拟。结果表明:在框架结构爆破切口形成后,结构由于重力作用逐渐沿横向偏转,并在横向最外侧的一排柱上形成活动铰,产生翻转倒塌,模拟结果与实际倒塌结果基本相符。在倒塌的过程中,结构爆破切口的横向很快进入大变形倒塌,同时引起横向隔墙的平面失去稳定而倒塌。落地的倒塌碎块,在纵向产生150kN左右的峰值冲击力,在横向产生30~50kN的峰值冲击力。基于仿真结果,可以定量设置防护措施,避免安全隐患。     

电镀塑料制品对结构设计及成形工艺的要求

为保证电镀塑料制品的质量,提出了符合电镀要求的塑料制品设计原则,并且指出在注塑成形时,对塑料经过充分干燥,采用较高的注塑温度,较低的注射压力和较慢的注射速度,是使镀层获得良好结合强度的先决条件。     

Memory effects of all‐solution‐processed oxide thin‐film transistors using ZnO nanoparticles

Abstract— Non‐volatile memory effects of an all‐solution‐processed oxide thin‐film transistor (TFT) with ZnO nanoparticles (NPs) as the charge‐trapping layer are reported. The device was fabricated by using a soluble MgInZnO active channel on a ZrHfO^x gate dielectric. ZnO NPs were used as the charge‐trapping site at the gate‐insulator—channel interface, and Al was used for source and drain electrodes. Transfer characteristics of the device showed a large clockwise hysteresis, which can be used to demonstrate its memory function due to electron trapping in the ZnO NP charge‐trapping layer. This memory effect has the potential to be utilized as a memory application on displays and disposable electronics.     

一种可行的可用性测试过程

文章综述用户模型法、用户调查法、专家评审法和观察法4类可用性测试方法,根据可用性测试的经验,总结出一套合理实用的可用性测试过程,使得可用性测试的效率高、代价低,尽可能发现更多的可用性问题;提出在程序设计类课程的教学中,应适当向学生介绍可用性测试的方法和过程,以培养学生对自己开发的软件系统进行可用性测试的能力。     

谈智能科学多媒体辅助教学设计

在多媒体辅助教学中,教学设计直接影响教学效果。认知心理学的发展,尤其是R.E.Mayer提出的多媒体教学理论给我们提供了一个研究教学设计规则的依据。描述同多媒体教学相关的认知心理学的几个基本理论,在此基础上提出一些关于提高多媒体辅助教学效果的教学设计方法。     

Stochastic differential equations driven by a Wiener process and fractional Brownian motion: Convergence in Besov space with respect to a parameter

A stochastic differential equation involving both a Wiener process and fractional Brownian motion, with nonhomogeneous coefficients and random initial condition, is considered. The coefficients and initial condition depend on a parameter. The assumptions on the coefficients and the initial condition supplying continuous dependence of the solution on a parameter, with respect to the Besov space norm, are established.     

MEMS AC voltage reference for miniaturized instrumentation and metrology

This work explores MEMS (Micro-Electro-Mechanical Systems) potentialities to fabricate AC voltage references through mechanical-electrical transduction that could be used for high precision electrical metrology and for applications in miniaturized instrumentation. AC voltage reference ranging from 5 V to 90 V have been designed and fabricated using the same Epitaxial Silicon On Insulator (SOI) surface micromachining process allowing an accurate control of both dimensions and material properties. The measured MEMS AC voltage reference values have been found in a good agreement with CoventorWare calculations. These tests structures have also been used to develop the read-out electronics to drive the MEMS.     

Fault tolerant machine learning for nanoscale cognitive radio

We introduce a machine learning-based classifier that identifies free radio channels for cognitive radio. The architecture is designed for nanoscale implementation, under nanoscale implementation constraints; we do not describe all physical details but believe future physical implementation to be feasible. The system uses analog computation and consists of cyclostationary feature extraction and a radial basis function network for classification. We describe a model for nanoscale faults in the system, and simulate experimental performance and fault tolerance in recognizing WLAN signals, under different levels of noise and computational errors. The system performs well under expected non-ideal manufacturing and operating conditions.     

Optimal replacement policy for a two-dissimilar-component cold standby system with different repair actions

In this paper, a cold standby repairable system consisting of two dissimilar components and one repairman is studied. When failures occur, the repair of both component 1 and component 2 are not ‘as good as new’. The consecutive operating times of component 1 after repair constitute a decreasing geometric process, while the repair times of component 1 are independent and identically distributed. For component 2, its failure is rectified by minimal repair, and the repair time is negligible. Component 1 has priority in use when both components are good. The replacement policy N is based on the failure number of component 1. Under policy N, we derive the explicit expression of the long-run average cost rate C(N) as well as the average number of repairs of component 2 before the system replaced. The optimal replacement policy N*, which minimises the long-run average cost rate C(N), is obtained theoretically. If the failure rate r(t) of component 2 is increasing, the existence and uniqueness of the optimal policy N* is also proved. Finally, a numerical example is given to validate the developed theoretical model. Some sensitivity analyses are provided to show the influence of some parameters, such as the costs for replacement and repair, and the parameters of the lifetime and repair time distributions of both components, to the optimal replacement policy N* and corresponding average cost rate C(N*).