多孔硅发光的物理机制——纳米量子限制效应及表面态在发光中的作用

采用阳极氧化腐蚀的方法制备了多孔硅（ＰＳ），这种ＰＳ的微结构为纳米量级的，并具有光致发光特性，这无疑将对全硅光电子学的发展具有很大意义。根据大量实验与理论分析，提出了这种ＰＳ发光的物理机制：纳米量子限制效应和表面态及其物质在发光中的作用，从量子力学的薛定锷方程出发，用沟道势阱的近似模型，推导得到进入量子线的电子和空穴的能量势垒，ＰＳ的有效带宽Ｅ＝Ｅ＿０＋ΔＥ，对于Ｓｉ（Ｅ＿０＝１．１２ｅｖ）。完美地解释了目前在ＰＳ研究中的ＰＬ谱的篮移现象。     

AlGaAs／GaAs HBT表面效应的二维数值分析

采用表面效应集总模型综合考虑表面费米能级钉扎和表面复合效应，对ＡｌＧａＡｓ／ＧａＡｓＨＢＴ表面效应的影响进行了二维数值模拟。结果表明，表面态的存在对集电极电流几乎不产生影响，但显著增加基极电流，使得电流增益明显下降。同时还发现在台面结构ＡＩＧａＡｓ／ＧａＡｓＨＢＴ中外基区表面复合的集边效应，即外基区表面复合主要发生在发射极台面与外基区的交界处附近，与外基区长度基本无关。模拟还表明基区缓变结构可以减少表面复合，提高电流增益。     

提高大口径金属主镜面形精度的方法

分析了影响Ｒｉｔｃｈｅｙ－Ｃｈｒｅｉｔｉｅｎ光学系统中金属主反射镜面形精度因素，采用有限元法对立交易的加工过程及其安装进行了模拟，指出提高主镜的面形镜度，既要合理主镜材料的热处理工艺，也要对加工参数进行控制。良好的稳定化处理可以有效地消除材料内部的残余应力，保证主镜尺寸的稳定性。提高加工基准的精度，并采用组合加工镜面，可以大大提高主镜的面形精度，最后，给出了主镜的干涉仪检测结果。     

128×128元IRCCD成像技术

研制成功了１２８×１２８元ＰｔｓｉＩＲＣＣＤ，获得了清晰的室温目标热像。文章叙述了该摄像机驱动逻辑电路的设计、驱动方式的研究和视频信号、数字信号的处理。     

Influence of the surface conditions on permeation in the deuterium–MANET system

The condition of the surfaces is of crucial importance for the deuterium permeation through materials. In this work a study of the surface constants for the adsorption (σk₁) and release (σk₂) of deuterium under different surface conditions on the martensitic steel DIN 1.4914 (MANET) has been carried out. The growth of an oxide surface layer (Cr₂O₃) of about 25–30 nm in a MANET sample, heat treated in an oxidizing environment, compared to the bare MANET that have a ‘natural' oxide of about 5 nm has provoked a reduction of both the permeation rate and the recombination coefficient (about 3 orders of magnitude). In addition, the permeation governing process has changed from diffusion-limited to surface-limited. The measurements of the permeation rate of deuterium were performed by a gas-phase permeation technique over the temperature range 574–746 K and for deuterium driving pressures in the range from 3 to 10⁵ Pa.     

Introductory Paper

In today’s competitive market designing of digital systems (hardware as well as software) faces tremendous challenges. In fact, notwithstanding an ever decreasing project budget, time to market and product lifetime, designers are faced with an ever increasing system complexity and customer expected quality. The above situation calls for better and better formal verification techniques at all steps of the design flow. This special issue is devoted to publishing revised versions of contributions first presented at the 12th Advanced Research Working Conference on Correct Hardware Design and Verification Methods (CHARME) held 21–24 October 2003 in L’Aquila, Italy. Authors of well regarded papers from CHARME’03 were invited to submit to this special issue. All papers included here have been suitably extended and have undergone an independent round of reviewing.     

Saw and digital technologies in mutlicarrier demodulators

One key technology, for the implementation of future on-board processing payloads, is the multicarrier demodulator (MCD). The MCD is instrumental in allowing FDMA/TDM access schemes which optimize the use of on-board and ground resources in VSAT networks. This paper deals with the analogue and digital implementations of MCD, trying to assess the fields of application of each of the two technologies.     

数字图像边缘检测算子的性能实验比较

本文对数字图像中几种具有代表性的边缘检测算子进行了理论分析，并通过VC编程实验，对各种算法进行实现，通过比较得出了各自的优缺点和适用范围。     

利用光纤数字同步传送网2.048 Mbit/s支路传送高精度标准时间信号

首次提出一种利用光同步数字传送网的2.048Mbit/s信号传送高精度时间编码信号的方法和实验结果。它可以使整个通信网的交换机、计费系统、网管系统、基站控制器等设备实现与UTC的时间同步。目前的实验证明,时间同步的不确定度优于±5μs。