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991.
浅谈NokiaPCM设备的维护 总被引:2,自引:0,他引:2
为了保障系统通信正常运行,对PCM设备的维护管理是非常重要的。文中介绍了对Nokia公司PCM设备的故障分析、故障定位和故障处理的方法,为相关的维护管理工作提供了一定的参考。 相似文献
992.
993.
994.
在非线性光学玻璃材料中,碲酸盐系统玻璃材料凭借较高的三阶非线性光学极化率、超快光学响应、较宽的红外透过窗口、较好的化学稳定性和较低的熔化温度而备受关注,以铌碲酸盐系统为基础的新型碲酸盐系统重金属氧化物玻璃则表现出更为优秀的综合品质,极有希望成为制作新型光学器件的理想材料。 相似文献
995.
采用共焦Z扫描系统,以λ=532nm.脉冲宽度0.7ns.重复频率15.79kHz的脉冲半导体激光器作为入射光源,研究了AgOx超分辨近场结构(SuperRENS)薄膜样品的非线性光学性质.实验获得了其三阶非线性折射率系数随入射光功率的变化曲线.并与Au,Ag薄膜作了比较.讨论了光致非线性变化过程。结果表明,在聚焦激光作用下.AgOx超分辨近场结构薄膜样品存在一相变点.即解析出纳米Ag颗粒,满足了产生局域表面等离子体的激发和增强效应的条件。 相似文献
996.
Zinc oxide(ZnO) has a wide band gap, high stability and a high thermal operating range that makes it a suitable material as a semiconductor for fabricating light emitting diodes(LEDs) and laser diodes, photodiodes, power diodes and other semiconductor devices. Recently, a new crystal growth for producing ZnO crystal boules was developed, which was physical vapor transport(PVT), at temperatures exceeding 1500 ?C under a certain system pressure. ZnO crystal wafers in sizes up to 50 mm in diameter were produced. The conditions of ZnO crystal growth, growth rate and the quality of ZnO crystal were analyzed. Results from crystal growth and material characterization are presented and discussed. Our research results suggest that the novel crystal growth technique is a viable production technique for producing ZnO crystals and substrates for semiconductor device applications. 相似文献
997.
998.
The concept of model-based test was developed in order to reduce the production test effort for data converters (Cherubal
and Chatterjee (IEEE Trans Circuits Syst part I 50(3):317–327, 2003); Stenbakken and Souders (1985) Modelling and test point selection for data converter testing. In: ITC, Int Test Conf, pp 813–817; Wegener and Kennedy (IEEE
Trans Circuits Syst I 51(1):213–217, 2004); Wrixon and Kennedy (IEEE Trans Instrum Meas IM-48(5):978–985, 1999)). In applying this concept, a vector of model parameters is determined for each device under test (DUT). Typically, this
model parameter vector is merely used to calculate the DUT performance characteristic which is then subject to specification-oriented
testing. However, each element of the model parameter vector represents an independent error source which contributes to performance
degradations; thus, the model parameter vector can be viewed as a signature of the error sources. In this work, analyzing
the error source signature is used to devise a model-based methodology for hard-fault detection and diagnosis. We investigate
conditions under which hard-faults are detectable/diagnosable in spite of masking effects due to manufacturing process variations.
In particular, we show that taking the model parameter vector as the fault signature is optimal as it minimizes the masking
effects and thus maximizes detectability/diagnosibility.
Carsten Wegener has been awarded the academic degree of a “Diplom-Ingenieur” in Electronic Circuits and Systems by the Technical University of Dresden, Germany, in 1997. During a period of two years, 1996 through 1998, he attended the lecture series for the “Vordiplom” in Mathematics at Humboldt-University at Berlin, Germany. In Spring 1998, he moved permanently to Ireland, where he started to work with the Test Department of Analog Devices B.V. in Limerick. In Autumn of the same year he took up his PhD-studies with Dr M.P. Kennedy in the area of model-based testing of mixed-signal integrated circuits. He has been awarded the PhD degree by the National University of Ireland in December 2003. In 2006, Carsten moved to Germany working with Infineon Technologies AG as an Analog Mixed-signal Design-for-Test Engineer on innovative data converter test approaches. He has contributed to numerous conferences, publishing works in areas of nonlinear oscillator dynamics and mixedsignal testing. In Ireland, he has taught MATLAB courses to design and test engineers at Analog Devices B.V., and graduate courses on “Digital Design-for-Test” and “Mixed-signal Test and Testability” at the Department of Microelectronic Engineering, University College Cork. Michael Peter Kennedy received the B.E. degree in electronics from the National University of Ireland in 1984, and the M.S. and Ph.D. degrees from the University of California at Berkeley (UC Berkeley) in 1987 and 1991, respectively, for his contributions to the study of neural networks and nonlinear dynamics. He worked as a Design Engineer with Philips Electronics, a Postdoctoral Research Engineer with the Electronics Research Laboratory, UC Berkeley, and as a Professeur Invite with the EPFL, Switzerland. He returned to University College Dublin in 1992 as a College Lecturer in the Department of Electronic and Electrical Engineering. He was appointed Professor of Microelectronic Engineering in 2000 and Vice-President for Research in 2005 at University College Cork. He has published 200 articles in the area of nonlinear circuits and systems and has taught courses on nonlinear dynamics and chaos. His research interests are nonlinear circuits and systems for applications in communications and signal processing. Since 1995 he has been active in research into algorithms for mixed-signal testing. Since 1994, he has led international basic and applied research projects on chaotic communications valued at over USD 2M. Dr. Kennedy was elected a Fellow of the IEEE in 1998. He received the Third Millenium Medal from the IEEE in 2000, the IEEE Circuits and Systems Society Golden Jubilee Medal, and the inaugural Parson’s Award for excellence in Engineering Sciences from the Royal Irish Academy in 2001. 相似文献
Michael Peter KennedyEmail: |
Carsten Wegener has been awarded the academic degree of a “Diplom-Ingenieur” in Electronic Circuits and Systems by the Technical University of Dresden, Germany, in 1997. During a period of two years, 1996 through 1998, he attended the lecture series for the “Vordiplom” in Mathematics at Humboldt-University at Berlin, Germany. In Spring 1998, he moved permanently to Ireland, where he started to work with the Test Department of Analog Devices B.V. in Limerick. In Autumn of the same year he took up his PhD-studies with Dr M.P. Kennedy in the area of model-based testing of mixed-signal integrated circuits. He has been awarded the PhD degree by the National University of Ireland in December 2003. In 2006, Carsten moved to Germany working with Infineon Technologies AG as an Analog Mixed-signal Design-for-Test Engineer on innovative data converter test approaches. He has contributed to numerous conferences, publishing works in areas of nonlinear oscillator dynamics and mixedsignal testing. In Ireland, he has taught MATLAB courses to design and test engineers at Analog Devices B.V., and graduate courses on “Digital Design-for-Test” and “Mixed-signal Test and Testability” at the Department of Microelectronic Engineering, University College Cork. Michael Peter Kennedy received the B.E. degree in electronics from the National University of Ireland in 1984, and the M.S. and Ph.D. degrees from the University of California at Berkeley (UC Berkeley) in 1987 and 1991, respectively, for his contributions to the study of neural networks and nonlinear dynamics. He worked as a Design Engineer with Philips Electronics, a Postdoctoral Research Engineer with the Electronics Research Laboratory, UC Berkeley, and as a Professeur Invite with the EPFL, Switzerland. He returned to University College Dublin in 1992 as a College Lecturer in the Department of Electronic and Electrical Engineering. He was appointed Professor of Microelectronic Engineering in 2000 and Vice-President for Research in 2005 at University College Cork. He has published 200 articles in the area of nonlinear circuits and systems and has taught courses on nonlinear dynamics and chaos. His research interests are nonlinear circuits and systems for applications in communications and signal processing. Since 1995 he has been active in research into algorithms for mixed-signal testing. Since 1994, he has led international basic and applied research projects on chaotic communications valued at over USD 2M. Dr. Kennedy was elected a Fellow of the IEEE in 1998. He received the Third Millenium Medal from the IEEE in 2000, the IEEE Circuits and Systems Society Golden Jubilee Medal, and the inaugural Parson’s Award for excellence in Engineering Sciences from the Royal Irish Academy in 2001. 相似文献
999.
1000.
针对局部二值模式(LBP)特征在低分辨率的人脸图 像上识别率较低的问题,提出了一种基于分块中心对称局部二值模式(CS-LBP,center symmetric local binary pattern)和加权主成分分析(PCA)算法的低分辨率人脸识别算法。 首先利用分块CS-LBP算子提取低分辨率人脸图像的特征;然后利用加权PCA算子对特 征进行降维, 从而得到更强的分类特征;最后利用最近邻分类器选出人脸最优分类类别并计算识别率。在 ORL人脸库上的实验表明,在人脸图像分辨率下降到(12×10)时,本 文算法的识别率仍能达 到85.00%,基本满足了实际运用中对识别率的要求,并且降低了运算 时间。 相似文献