Correlation Between Structural and Optical Properties of Composite Polymer/Fullerene Films for Organic Solar Cells

We investigate thin poly(3‐hexylthiophene‐2,5‐diyl)/[6,6]‐phenyl C₆₁ butyric acid methyl ester (P3HT/PCBM) films, which are widely used as active layers in plastic solar cells. Their structural properties are studied by grazing‐incidence X‐ray diffraction (XRD). The size and the orientation of crystalline P3HT nanodomains within the films are determined. PCBM crystallites are not detected in thin films by XRD. Upon annealing, the P3HT crystallinity increases, leading to an increase in the optical absorption and spectral photocurrent in the low‐photon‐energy region. As a consequence, the efficiency of P3HT/PCBM solar cells is significantly increased. A direct relation between efficiency and P3HT crystallinity is demonstrated.     

Facile synthesis of ordered nanocrystalline alumina thin films with tunable mesopore structures

Mesoporous alumina layers have attracted attention for their potential use in ultrafiltration of salts, as a heterogeneous catalyst support, an adsorbent in environmental cleanup, and in petroleum refinement. The ability to control the fast hydrolysis rate of the inorganic precursors using simple and inexpensive routes is important for that potential to be realized. Herein, we introduce a novel and facile route to synthesize mesoporous alumina thin films from the combination of inexpensive and commercially available copolymer with aluminum chloride or nitrate (salts) in an EtOH–surfactant–NH₃ · H₂O–salts (EsNs) system through the evaporation-induced self-assembly (EISA) method. Mesoporous alumina layers obtained utilizing the EsNs system have ordered and tunable pore structures. The ability to easily control the mesophases of the alumina layers within a short time provides distinct advantages over previously reported synthesis procedures. Most importantly, we demonstrate that the binding of surfactant and NH₃ · H₂O for the formation of hydrogen bond between them in the EsNs system controls the fast hydrolysis rate of the inorganic species. This allows for the synthesis of nanocrystalline alumina layers via the aluminum oxo-clusters’ assembly with the surfactant. Such simple route may be applied in the synthesis of other non-silica mesostructured oxides.     

掺铝氧化锌(AZO)导电薄膜的研究进展

综述透明导电薄膜的性能、种类、制备工艺、研究及应用状况,重点讨论掺铝氧化锌(AZO)薄膜的结构、导电机理、光电性能和当前的研究焦点。并指出,为了进一步提高透明导电薄膜的性能,应从以材料选择、制备工艺、多层膜光学设计等方面深入研发,以满足尖端技术的需要。     

Influence of zero-loss filtering on electron optical phase contrast

Complex scattering amplitudes are used to calculate the phase contrast of colloidal gold particles. Comparison of measurements of the phase contrast intensity at the centre of the gold particle as a function of defocus for unfiltered and zero-loss filtered images demonstrates the increase in phase contrast achieved by zero-loss filtering even for a thick carbon substrate film. The granulation of amorphous germanium films is measured by the spatial rms (root mean square) values of image intensity in a defocus series.     

The electron microscopy of post-growth induced defects of ZnSe/GaAs epilayers

A fundamental research of structural defects induced upon post-growth processing of ZnSe/GaAs epilayers grown on (100) GaAs was done by identifying defect-related reflections in the transmission electron diffraction (TED) patterns of ZnSe. Structural artifacts, other than the as-grown defects, on this material system could be excluded according to our results. Four types of abnormal reflections have been observed in addition to primary reflections. These extra reflections are sensitive to the post-growth processing of ZnSe epilayers and may arise from various external effects, rather than epitaxy growth, such as irradiation damage, surface oxidation, and surface contamination. By mapping these reflections at several major zone axes using TED patterns, we found that the reciprocal lattice for a ZnSe crystal with structural defects consists of two distinct types of extra reflections associated with irradiation damage. The first type of extra reflections is ±1/3{111} and the other is ±1/2{111} corresponding to pure-edge and non-edge dislocation loops, respectively. For (100) oriented wafers, the ±1/3{111} and ±1/2{111} reflections were observed only on two of the four possible 〈111〉 variants (i.e. [111]_Zn and [111]_Zn)and this phenomenon was attributed to the anisotropy of defect distribution. Extra reflections associated with surface oxidation and contamination are also observed. The orientation relationships between a surface hexagonal ZnO and a cubic ZnSe film are [0001]_ZnO//[−111]_ZnSe, and [01−11]_ZnO//[011]_ZnSe. The origin, characterization, and elimination of these induced reflections are discussed. With the knowledge about these extra effects on structural defect formation, we have shown the real microstructure of ZnSe epilayers.     

Effect of Post Annealing on the Microstructure and Magnetic Properties of NdFeB/α-Fe/NdFeB Thin Films

A series of nanocomposite thin films, composed of Nd2Fe14B and α-Fe, has been prepared by DC-magnetron sputtering combined ion beam sputtering onto Si (100) substrates. The effects of post annealing on the microstructure and magnetic properties of [NdFeB/α-Fe/NdFeB]-type thin films have been investigated. The X-ray diffraction (XRD) study showed that annealing of the films for 30min at temperatures 550,600,650,700℃ resulted in the appearance of diffraction peaks, characteristic for Nd2Fe14B tetragonal structure, α-Fe and Nd2O3 phases. The investigation using the Vibrating Sample Magnetometer (VSM) with a maximum applied field of 2 T indicated that with the increase of the annealing temperature, the magnetic properties of the multilayer films were improved and reached peak value at 650℃ (Hci=41.72kA·m-1, Mr/Ms=0.4, (BH)max=30.35kJ·m-3), after which the magnetic properties were decreased greatly. Along with the increase of the thickness of α-Fe layer from Tα-Fe16nm, the coercivity Hci, saturation magnetization Ms, and remanence ratio Mr/Ms all declined. As the Atomic Force Microscope (AFM) indicated, after being annealed at 650℃ for 30min, the sample was showed fine surface morphology with grain size 60nm≤dα-Fe≤80nm and 100nm≤dNdFeB≤150nm.     

Characterization of CuInS2 thin films for solar cells prepared by spray pyrolysis

We have made a study of the chemical composition, the electrical, the optical and the structural properties of polycrystalline CuInS₂ thin films prepared by spray pyrolysis to be used for thin film solar cells. These films were deposited starting from aqueous solutions with different chemical compositions ([Cu]/[In] and [S]/[Cu] ratios) and at different substrate temperatures. In all cases, the material is p-type with grains preferentially oriented in the (112) direction of the sphalerite structure. The electro-optical properties show a very strong dependence on the [Cu]/[In] ratio in the solution. Films with copper excess have smaller resistivity and better crystallinity than those which are stoichiometric or have indium excess. The results obtained in this work show the possibility of having CuInS₂ thin films with a wide range of resistivity, a fact that could be important for making solar cells based on this material.     

WO3 pillar-type and helical-type thin film structures to be used in microbatteries

In the present study WO₃ thin films were deposited by sputtering onto ITO glass, W/ITO and Si substrates by using the glancing angle deposition (GLAD) technique, with the objective of applying these materials in electrochemical intercalation devices. The thin films microstructure and electrochemical behavior were determined through scanning electron microscopy (SEM) and cycling at constant current with potential limitation. By mainly adjusting the substrate holder speed rotation, pillar-type and helical-type structures were obtained under high and low speed rotation levels, respectively. The electrochemical results showed that the best charge capacity performance was obtained for the WO₃/W/ITO films with pillar-type structures, which are more porous.     

Heat transfer in YBaCuO thin film/sapphire substrate system

The thermal boundary resistance at the YBaCuO thin film/Al₂O₃ substrate interface was investigated. The transparency for thermal phonons incident on the interface as well as for phonons moving from the substrate was determined. We have measured a transient voltage response of current-biased films to continuously modulated radiation. The observed knee in the modulation frequency dependence of the response reflects the crossover from the diffusion regime to the contact resistance regime of the heat transfer across the interface. The values of transparency were independently deduced both from the phonon escape time and from the time of phonon return to the film which were identified with peculiarities in the frequency dependence. The results are much more consistent with the acoustic mismatch theory than the diffuse mismatch model.We are grateful to A. Elantev for helpful discussion. We acknowledge the financial support of the Russian Scientific Council on the HTS problem (Project No. 90462).     

液晶光阀用ZnSSe薄膜的光电特性研究

用分子束外延法(MBE),在铟锡氧化物(ITO)导电玻璃衬底上生长了ZnSSe薄膜,详细研究了薄膜的光电特性.通过控制反应时的生长参数,制备出了符合紫外液晶光阀设计要求的光导层薄膜.室温下,该薄膜光谱响应截止边的响应度为0.01A/W,紫外/可见光响应对比度大于103.薄膜的暗电阻率随薄膜晶粒增大而减小,在衬底温度为2900C时,所获得的ZnSSe薄膜具有4.3×1011Ω@cm的暗电阻率.频率从40Hz到4000Hz的交流特性测试,也证实该薄膜符合器件紫外成像的工作要求.