An improved method for voice pathology detection by means of a HMM-based feature space transformation

This paper presents new a feature transformation technique applied to improve the screening accuracy for the automatic detection of pathological voices. The statistical transformation is based on Hidden Markov Models, obtaining a transformation and classification stage simultaneously and adjusting the parameters of the model with a criterion that minimizes the classification error. The original feature vectors are built up using classic short-term noise parameters and mel-frequency cepstral coefficients. With respect to conventional approaches found in the literature of automatic detection of pathological voices, the proposed feature space transformation technique demonstrates a significant improvement of the performance with no addition of new features to the original input space. In view of the results, it is expected that this technique could provide good results in other areas such as speaker verification and/or identification.     

智能车竞赛中道路的视频识别方案

视频信号的的采集和处理是一个复杂的过程,这需要程序设计者了解视频信号的构成,充分利用复合视频信号中的各种同步信息作为视频信号采集的控制信号,从而完成信号的采集。     

混沌权值变异的Huffman树图像加密算法

提出一种采用混沌权值变异的Huff man树的图像加密算法.此算法在熵编码过程中,以基本的Huffman树为标准,利用双耦合混沌序列1对DC系数进行树的结构未变异、路径值变异的加密;再利用双耦合混沌序列2对AC系数进行码字序号的加密.论文对算法进行了仿真,并对安全性、计算复杂度、压缩比性能进行了分析.实验结果表明,该算法基本上不影响压缩效率,且计算复杂度低、安全性高和实时性好,可用于网络上的图像服务.     

基于改进傅里叶描绘子的CBIR系统

在现有的基于傅里叶描绘子的CBIR系统中,为了提高检索速度,一般需要舍去物体轮廓经傅里叶变换后的大部分高频分量.当物体轮廓在细节部分具有较高能量时,此方法不具备有效性.为尽可能保证检索准确率并兼顾检索速度,在原有傅里叶描绘子上进行扩展,避免直接舍去高频分量,引入Fisher判别分析法将描绘子映射到子空间进行降维,并保证...     

A new strategy for defect inspection by the virtual inspection in semiconductor wafer fabrication

The defect of process equipments is a major factor that impairs the yields in the mass production of semiconductor wafer fabrication and it is a main supervision means to use high-resolution defect inspection tools to detect and monitor the defect damage. Due to the high investment costs of these inspection tools and the resulting decrease in the throughput, how to improve the sampling rate is an important issue for the associated inspection strategy. This paper proposes a new concept and implementation of virtual inspection (VI) to enhance the detection and monitoring of defect in semiconductor production process. The underlying theory of the VI concept is that the state variables identifications (SVIDs) of process equipments can reflect the process quality effectively and loyally. The approach of VI is to combine the application of the fault detection and classification (FDC), and the defect library and the re-engineering of inspection procedure to reach the full-scope of strategic objective. VI enables the defect monitoring to enter a new era by promoting the monitoring level of defect inspection from the previous lot-sampling basis to the wafer-sampling level, and hence upgrades the sampling strategy from random-sampling to full and right-sampling. In this study, various typical defect cases are utilized to illustrate how to create VI models and verify the reliability of the proposed approach. Furthermore, a feasible architecture of the VI implementation for mass production in semiconductor factory is presented in the paper.     

A new mathematical programming approach to multi-group classification problems

In this paper we introduce a goal programming formulation for the multi-group classification problem. Although a great number of mathematical programming models for two-group classification problems have been proposed in the literature, there are few mathematical programming models for multi-group classification problems. Newly proposed multi-group mathematical programming model is compared with other conventional multi-group methods by using different real data sets taken from the literature and simulation data. A comparative analysis on the real data sets and simulation data shows that our goal programming formulation may suggest efficient alternative to traditional statistical methods and mathematical programming formulations for the multi-group classification problem.     

SIFT在行星表面探测器视觉导航系统中的应用

介绍了行星探测器自主导航系统的相关背景,讨论了行星探测器自主视觉导航系统算法的主要目的和传感器信息融合的必要性,并就此引入了尺度不变特征变换(SIFT)的相关理论分析.对SIFT方法提出了改进,从而改善了算法的效果.最后给出了三维重建和目标追踪的实验结果.     

A numerical modelling for the extraction of decay regions from color images of monuments

An innovative application focused on the segmentation of decay zones from images of stone materials is presented. The adopted numerical approach to extract decay regions from the color images of monuments provides a tool that helps experts analyze degraded regions by contouring them. In this way even if the results of the proposed procedure depend on the evaluation of experts, the approach can be a contribution to improving the efficiency of the boundary detection process. The segmentation is a process that allows an image to be divided into disjoint zones so that partitioned zones contain homogeneous characteristics. The numerical method, used to segment color images, is based on the theory of interface evolution, which is described by the eikonal equation. We adopted the fast marching technique to solve the upwind finite difference approximation of the eikonal equation. The fast marching starts from a seed point in the region of interest and generates a front which evolves according to a specific speed function until the boundary of the region is identified. We describe the segmentation results obtained with two speed functions, attained by the image gradient computation and color information about the object of interest. Moreover, we present the extension of the working modality of the method by introducing the possibility to extract the regions not only in a local way but also in a global way on the entire image. In this case, in order to improve the segmentation efficiency the application of the fast marching technique starts with more seed points defined as seed regions. The study case concerns the impressive remains of the Roman Theatre in the city of Aosta (Italy). In the image segmentation process the color space L^∗a^∗b^∗$L^{\ast }{a}^{\ast }{b}^{\ast }$ is utilized.     

A genetic algorithm with gene rearrangement for K-means clustering

In this paper, a new clustering algorithm based on genetic algorithm (GA) with gene rearrangement (GAGR) is proposed, which in application may effectively remove the degeneracy for the purpose of a more efficient search. A new crossover operator that exploits a measure of similarity between chromosomes in a population is also presented. Adaptive probabilities of crossover and mutation are employed to prevent the convergence of the GAGR to a local optimum. Using the real-world data sets, we compare the performance of our GAGR clustering algorithm with K-means algorithm and other GA methods. An application of the GAGR clustering algorithm in unsupervised classification of multispectral remote sensing images is also provided. Experiment results demonstrate that the GAGR clustering algorithm has high performance, effectiveness and flexibility.