A frequency domain approach to fault detection in sampled-data systems

This paper deals with fault detection problems in sampled-data (SD) systems. A tool is first introduced for the analysis of intersample behavior of SD systems in the frequency domain from the viewpoint of fault detection and isolation. Based on it, a direct design approach of fault detection systems for SD systems is proposed, and further the problem of full decoupling from unknown disturbances is studied.     

A novel automated image analysis method for maceral analysis

A new image analysis technique has been developed which allows maceral analysis of coal to be carried out. The technique is able to separate the liptinite component from the background resin by using two separate images of the surface captured with different camera exposure times. At normal exposure, the liptinite has a similar grey scale value to the surrounding resin, but at a higher exposure time, the resin remains black whilst the liptinite grey scale increases significantly enough to distinguish it from the resin. The method has been tested for repeatability and reproducibility and found to be within the ISO Standard requirements.     

应用于激光光谱学中的短脉冲光峰功率的测量

报道了应用于激光光谱学中直接测量短脉冲光峰值光功率的双通道测量系统。给出了两个通道的线性关系和频率响应曲线。实验表明此测量系统可以测量到脉宽为10ns的脉冲光峰功率1％的放大和吸收。     

生物超微弱发光的光子计数成象方法

介绍了我们研制和设计的用于测量生物超微弱发光的光子计数成象系统，包括光子成象头，高帧频ＣＣＤ摄象机，图象采集系统和计算机，可以定量地探测出生物的发光强度分布 ，还能够显示出其发光的图象，确定发光的形状和位置，本系统的信噪比为１０：１，最小探测功率达１０＾－１６Ｗ，灵敏度高，动态范围大。     

分形方法用于有噪图像边缘检测的研究

本文研究了加性高斯白噪声对于基于离散分数布朗随机场模型图像分形维数估计的影响，并将分形方法用于图像边缘检测，指出在加性高斯白噪声的情况下，分形方法用于图像边缘检测较之经典的基于梯度运算的边缘检测方法有好的抗噪性能，同时又能检测比较丰富的图像边缘细节。     

强度型光纤传感器的信号检测系统

本文阐述了一种可提高强度型光纤传感器测量精度的检测系统。该系统利用同一检测电路交替检测信号、参考通道的输出信号，并将信号、参考两通道的检测结果相除，从而消除了因发光二极管光源波动及检测电路系统不稳定所带来的误差。采用同步相关技术抑制了噪声，提高了输出信噪比。实验证明，当时间常数ＲＣ为０．０５Ｓ时，采用该检测系统可获得优于千分之一的零点稳定性和优于２×１０３的输出信噪比。     

Reverse reachability analysis: A new technique for deadlock detection on communicating finite state machines

The communicating finite state machines can exchange messages over bounded FIFO channels. In this paper, a new technique, called reverse reachability analysis, is proposed to detect deadlocks on the communication between the communicating finite state machines. The technique is based on finding reverse reachable paths starting from possible deadlock states. If a reverse reachable path can reach the initial global state, then deadlock occurs. Otherwise the communication is deadlock-free. The effectiveness of the technique has been verified by some real protocols such as a specification of X.25 call establishment/clear protocol and Bartlet's alternating bit protocol.     

Fundamental solutions for half plane with an oblique edge crack

An elastic half plane with an oblique edge crack is considered in this paper. A pair of concentrated forces or point dislocations is assumed to act at an arbitrary point in the half plane. The half plane with an edge crack is first mapped into a unit circle by a rational mapping function so that the following analysis can be carried out on the mapped plane analytically. Then the complex stress functions are derived by separating the whole problem into two parts; one is the principal part corresponding to the infinite plane acted on by concentrated forces or dislocations, the other is the holomorphic part, which can be determined by making use of the property of regularity of complex stress functions. The stress intensity factors of the crack can be calculated with different inclined angles of the crack, and the displacement and stress components at an arbitrary position in the half plane can be expressed explicitly.     

ERD facility for analysis of hydrogen and deuterium in solids

Hydrogen is the lightest element in nature, and so, its detection and quantitative analysis is difficult by the conventional methods utilized for other elements. In the recent years the technique of elastic recoil detection analysis (ERD) using 1–2 MeV He⁺ beam has been developed to quantitatively and simultaneously analyze hydrogen and its isotopes in solids. Such a facility has been set up using the 2 MeV Van-de-Graaff accelerator at IIT Kanpur. It facilitates H and D analysis in a material up to a depth of ∼ 1μm with a detection sensitivity of 0·1 at.% and depth resolution of about 300 ?. The application potential of this setup is illustrated by presenting the results of measurements performed on Al:H:D systems prepared by plasma source ion implantation and highT _c YBCO pellets exposed to humid atmosphere.     

非晶硅基薄膜的等离子体刻蚀光发射谱检测

本文研究了采用锁定放大相干检测技术的等离子体光发射谱检测系统。用该系统检测了仅用CF4作为刻蚀气体刻蚀非晶硅基薄膜的等离子体光发射谱。分析了检测结果和刻蚀机理。