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排序方式: 共有2749条查询结果,搜索用时 15 毫秒
1.
对基于离散傅里叶变换(DFT)信号处理方式的柯氏质量流量计来说,影响其精度的关键问题是如何实现信号的整周期采样。提出了一种全新的方法,用采样率固定不变的采样数据,通过软件实时地确定信号的频率并且实现信号整周期重新采样。实验结果表明该方法在求取相位差时具有极高的精度。 相似文献
2.
介绍了一种适用于并网逆变器预同步操作的电网电压基波分量递推DFT算法。该算法既能够可靠跟踪电网电压基波分量的相位、频率和幅值,又减少了计算量,保证了算法的实时性。在此基础上,该算法根据等角度间隔采样原理提出以递推DFT运算得到的基波相角为反馈调整采样间隔,实现了对电网电压频率的自适应跟踪,减少了频谱泄漏,提高了基波同步参数检测的精度。相对于传统的锁相环预同步方法,可以在谐波和零点漂移比较严重的情况下精确跟踪电网电压基波分量,从而减小逆变器并网操作对微电网以及逆变器本身的冲击。仿真结果表明了该算法的正确性。 相似文献
3.
Using first-principles calculations based on density functional theory, we have investigated the nature of H defects in CdTe.
The formation energy calculations indicate that the ground state position of the H inside the CdTe lattice depends on charge
state: the lowest energy position for H0 and H+ is at the bond center site, while H− prefers the tetrahedral interstitial site with Cd nearest neighbors (TCd). We find that H in CdTe acts as an amphoteric impurity. In p-type samples, H is in a positive charge state, acting as a donor to neutralize the free holes in the valence band, and in
n-type samples H acquires an electron, compensating the donors in the sample. 相似文献
4.
Simulation techniques used in the Manufacturing Test SIMulator(MTSIM) are described. MTSIM is a Concurrent Engineering tool used tosimulate the manufacturing test andrepair aspects of boards and MCMs from design concept through manufacturing release. MTSIM helps designers select assemblyprocess, specify Design For Test (DFT) features, select board testcoverage, specify ASIC defect level goals, establish productfeasibility, and predict manufacturing quality and cost goals. A newyield model for boards and MCMs which accounts for theclustering of solder defects is introduced and used topredict the yield at each test step. In addition, MTSIMestimates the average number of defects per board detected at eachtest step, and estimates costs incurred in test execution, faultisolation and repair. MTSIM models were validated withhigh performance assemblies at Hewlett-Packard (HP). 相似文献
5.
A general-purpose modular-based scan chain between the analog-digital boundary of a mixed analog/digital design is proposed. This general-purpose Design-For-Test methodology is oriented towards the test of the mixed-signal modules within the design. Implementing this structure improves the controllability and observability of these modules and the reusability of the test software at a minimum cost. 相似文献
6.
7.
文章针对一款应用于大规模数字集成电路的CMOS高频锁相环进行了可测性设计,详细讨论了最高输出频率、输出频率范围和锁定时间等参数的测试.分别给出了边界扫描测试和分频器测试两种测试方案,并对两种方案进行了比较,指出了各自的适用范围.对于选用的边界扫描方法,给出了详尽的测试电路图,并进行了电路仿真,仿真结果表明该方法有效可行. 相似文献
8.
In this paper, we propose a new discrete-time model which relates uniform samples and K-th order nonuniform (KONU) samples. Typically, such situations may occur in practice where the sampling rates of analog-to-digital converters (ADCs) in a cluster of sensors may be different. This paper also outlines a digital signal processing approach to reconstructing uniform samples from the nonuniform samples produced by time interleaving analog-to-digital converters (TI-ADCs) with different sampling rates and time-mismatches. 相似文献
9.
常规的信号处理中快速傅里叶变换法不能满足频率精度要求。本文介绍了一种基于DFT变换的幅值曲线拟合算法用于改善频率测量精度。 相似文献
10.
Among the new materials currently employed as electron donor element in active layers of organic solar cells (OSCs), PTB7 holds the best results. It has been extensively studied and now there is a search for new derivatives to improve its properties. In this work, a set of 24 polymers derived from polythieno[3,4-b]-thiophene-co-benzodithiophene (PTB7) was studied theoretically, using chemical modifications in the benzodithiophene (BDT) moiety of the PTB7 monomeric units. After evaluations of the electronic and optical properties, including the open circuit voltage and exciton dissociation and recombination conditions, the results indicate that employing chlorine as substituent yields the most promising material for application in active layers together with Phenyl-C61-Butyric-Acid-Methyl-Ester (PCBM) as electron acceptor material. 相似文献