基于Reed-Muller模式的组合电路故障定位方法

针对组合电路的测试生成算法种类繁多,但对所检测到的故障进行定位的方法却很少的问题,阐明了一种基于Reed-Muller模式的组合电路的故障定位方法.该方法在减少测试开销的同时,不但可以方便检测出电路中的单固定型故障,且可以对故障进行定位.此方法还可应用于其他相关电路的可测性设计中.     

基于故障仿真确定测试矢量最小测试集方法的研究

为了减少测试矢量，有必要对电路中的故障加以分析，寻找各类故障之间的关系，以求压缩测试矢量。本文提出了一种通过并行故障仿真来确定测试矢量最小故障集的方法。该方法将并行故障仿真与布尔约简法相结合，利用并行故障仿真结果确定出故障点和测试矢量的对应关系。然后根据布尔约简法即可求出测试矢量的最小故障集。     

The structure-based multi-fault test generation algorithm for combinational circuit

Testgeneration of integrated circuitis a very activeresearch subject in CAD and digital system fault diag-nosis. With the improvement of the complexity and in-tegrated degree of circuit, the test of digital integratedcircuit becomes harder and harder. Although peoplehave studied this for several years, digital integratedcircuit test is still generally regarded as a difficult prob-lem in international areas at present.For the problem that test patterns are obtained bydetermined finite faults s…