Two-dimensional island gold films [2D-I(Au)Fs] were prepared by the thermal evaporation technique where Corning 7059 glass slides, held at ambient temperature during deposition, were used as substrates. After exposing the films to air at a room temperature of 300 K, the d.c. resistance of the films was monitored until the films attained short-term stability, namely, invariance of resistance over time. The different island gold films were identified by the values of their stabilized surface resistivity (
s
); these values in units of M/ are 23, 275, 4.4×10
3, 23.2×10
3 and 37.5×10
3. The values of the parallel components (
r
p
,
c
p
) of an equivalent circuit of the investigated films were obtained via a.c. measurements on the films performed by a lock-in amplifier at six temperatures (
T) 100, 140, 180, 220, 260, and 300 K, where at each of them the frequency (
f) of the a.c. voltage imposed on the film was varied over the range 0.1–80 kHz. It is found that: (i) regarding
r
p
, its value decreases with the increase in (
T) and (
f) while it increases as (
s
) does. (ii) with respect to
c
p
, its magnitude decreases with the increase in (
f) and (
s
) but increases as (
T) does. Our results are interpreted, qualitatively, by relating
r
p
and
c
p
to three frequency-independent parameters that reflect what happens physically in an island film when a steady voltage is applied across it. These parameters are
R
b
,
R
g
, and
C
g
; where
R
b
is the resistance associated with the conduction of free electrons within the bulk (interior) of islands themselves,
R
g
is the resistance that accompanies the conduction across the gaps between the islands and
C
g
is the capacitance resulting from the presence of separated metallic islands at different potentials. To the best of our knowledge, the present results are the first to be reported for 2D-I(Au)Fs.
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