企业管理流程30题

企业管理信息他是企业进步的重要途径。但在实践中,许多企业管理流程存在着许多问题,两不同企业在管理流程中存在的问题往往具有共性。现经作者归纳整理。特此发表。以飨读者。     

基于差频检测技术的高速AD单粒子翻转评估方法研究

本文基于差频检测的原理,提出一种在高频动态输入模式下,对高速高精度模数转换器（AD）的抗单粒子翻转效应进行评估的测试方法,并以一款8位3 GSPS高速AD为测试对象,设计开发了一套高速AD单粒子翻转效应测试系统,对目标器件进行了重离子试验。通过对试验结果的图像和错误数据进行分析,评估参试器件的抗辐照性能参数,为抗辐照高速高精度AD的加固设计提供数据支撑。     

The investigation on sensitive mapping of memory cell in microprocessor

The single event effects of the sensitivity of a circuit are investigated on a 32-bit microprocessor with a five-stage instruction pipeline by pulsed laser test. The investigation on sensitive mapping of the memory cell is illustrated and then the comparison between the sensitive mapping and the layout of the circuit is made. A comparison result indicates that the area of the sensitive node in sensitive mapping is just the location of the drain in the layout. Therefore, SEE sensitivity in sensitive mapping fits well with that in the physical layout of functional units, which can directly and objectively indicate the size and distribution of sensitive areas. The investigation of sensitive mapping is a meaningful way to verify the hardened effect and provide a reference for improving hardened design by combining with the physical layout.     

利用日期来避免CIH病毒的发作

为防止CIH病毒发作,笔者近期利用DEBUG编写了一小程序,可由25回直接转至27日,跳过微机中的26日,从而杜绝了病毒发作的有效条件。该程序使用Wndows所带的DEBUG程序,利用DOS中断的ZA号中断（取日期）和ZB号中断（设置日期）来实现。具体实现方法如下：C＞debuga100灿,hnitZImovhi,19cmpdl,hijnzof10movdl,fomov灿,儿nitZImovah,4CimZIrexexo000：20、nd．cornw”q输入上述程序后,产生一个d。om文件,然后把此文件放入启动盘根目录的Window＼colnlnan子目录下,再由autDexecha文件来调用这一文件,即可实现开机自动检…     

The single-event effect evaluation technology for nano integrated circuits

Single-event effects of nano scale integrated circuits are investigated. Evaluation methods for single-event transients, single-event upsets, and single-event functional interrupts in nano circuits are summarized and classified in detail. The difficulties in SEE testing are discussed as well as the development direction of test technology, with emphasis placed on the experimental evaluation of a nano circuit under heavy ion, proton, and laser irradiation. The conclusions in this paper are based on many years of testing at accelerator facilities and our present understanding of the mechanisms for SEEs, which have been well verified experimentally.     

A prediction technique for single-event effects on complex integrated circuits

The sensitivity of complex integrated circuits to single-event effects is investigated. Sensitivity depends not only on the cross section of physical modules but also on the behavior of data patterns running on the system. A method dividing the main functional modules is proposed. The intrinsic cross section and the duty cycles of different sensitive modules are obtained during the execution of data patterns. A method for extracting the duty cycle is presented and a set of test patterns with different duty cycles are implemented experimentally. By combining the intrinsic cross section and the duty cycle of different sensitive modules, a universal method to predict SEE sensitivities of different test patterns is proposed, which is verified by experiments based on the target circuit of a microprocessor. Experimental results show that the deviation between prediction and experiment is less than 20%.     

SRAM型FPGA单粒子效应敏感性分析研究

首先描述了典型的SRAM型FPGA内部通常包含的三类基本资源,并分析三类基本资源内部不同功能的电路单元对单粒子效应的敏感性,归纳出Virtex系列SRAM型FPGA中6种类型的单粒子效应敏感结构单元,并得出这些敏感结构单元的单粒子翻转、单粒子功能中断、单粒子闩锁的检测方式,最后对SRAM型FPGA单粒子效应评估研究的发展趋势做了简要总结。