High-performance MIM capacitor using ALD high-k HfO/sub 2/-Al/sub 2/O/sub 3/ laminate dielectrics

For the first time, we successfully fabricated and demonstrated high performance metal-insulator-metal (MIM) capacitors with HfO/sub 2/-Al/sub 2/O/sub 3/ laminate dielectric using atomic layer deposition (ALD) technique. Our data indicates that the laminate MIM capacitor can provide high capacitance density of 12.8 fF//spl mu/m/sup 2/ from 10 kHz up to 20 GHz, very low leakage current of 3.2 /spl times/ 10/sup -8/ A/cm/sup 2/ at 3.3 V, small linear voltage coefficient of capacitance of 240 ppm/V together with quadratic one of 1830 ppm/V/sup 2/, temperature coefficient of capacitance of 182 ppm//spl deg/C, and high breakdown field of /spl sim/6 MV/cm as well as promising reliability. As a result, the HfO/sub 2/-Al/sub 2/O/sub 3/ laminate is a very promising candidate for next generation MIM capacitor for radio frequency and mixed signal integrated circuit applications.     

曲线轮廓汉字的网格适配技术

要提高曲线轮廓汉字的还原质量, 需要在字形还原时采用网格适配技术本文介绍了网格适配的基本原理, 并在分析汉字字形还原失真现象的基础上, 给出了我们自己设计并实现的适合于曲线轮廓汉字特点的二种网格适配方法, 即动态的补象素算法和曲线轮廓汉字的技术     

大系统分散鲁棒容错控制的进展及主要成果

综述了近２０年来关联大系统分散鲁棒容错控制的研究动态及取得的主要成果。说明了统一地研究分散鲁棒容错控制的必要性。在分散控制、鲁棒控制和容错控制研究领域内，分析了各种设计方法的主导思想及实质；指出了这些研究成果的意义与存在的问题。文中着重论述了分散、鲁棒、容错控制研究方法的发展途径。     

软X射线对血液有形成分表面电荷的影响——2、淋巴细胞和血小板膜电荷的变化

软X射线不仅能引起红细胞表面电荷的变化,同时也能导致淋巴细胞和血小板表面电荷下降,表现为照射后它们的电泳率下降。低剂量范围内,这种电荷的变化是暂时性的,照后4小时降到最低点,24小时后恢复到对照的水平。细胞电泳率的下降与辐射剂量相关。淋巴细胞是一个复杂的细胞群,正常状态下,按细胞在电场中泳动速度的快慢,可分为两个组分:快峰为T细胞,慢峰为B细胞。软X射线照射以后,T和B细胞的电泳率皆减慢,频数分布峰值下降,离散度加大。血小板成分单一,电泳率较一致。 从照射浓集的血小板再加回自身血浆中电泳率的下降较照射血浆再加到血小板中的电泳率下降大得多;受照射的血小板在磷酸缓冲液中电泳率下降较在血浆悬液中严重得多;2000 rad照后,悬浮于血浆中的血小板电泳率能恢复,而悬浮于磷酸缓冲液中则不能恢复,三个方面来看,血浆中可能存在抗辐射因子。超氧化物岐化酶能有效地预防血小板电泳率的下降,从而可阻止血小板的凝聚。     

野外大气扩散试验中四面体气球示踪实验的初步评价

1985年11月在瑞士北部进行了一次以探讨“冷池”条件下的扩散和湍流特征为目的的国际野外大气试验,本文介绍其中的四面体气球示踪实验的结果。一共进行了三次由雷达跟踪的四面体示踪实验,释放了10个四面体球。按多轨迹法和单轨迹法分别估算并比较了其中两次示踪实验得到的水平扩散参数σ_y,探讨了风摆效应的贡献。采用“体源模式”并结合单轨迹法估算了微弱风场不定风向条件下的扩散参数,分析了静风,弱风条件下的水平风向标准差和湍流强度。     

从实际出发 探索办学理念

从学生、社会、学校、教师和学科诸多方面探索办学理念.提出通过学科、专业、课程、教学方法、考核方式等的改革,培养工商企业所需的有较高素质和发展潜力的人才.     

Local residence time,residence revolution,and residence volume distributions in twin‐screw extruders

This work was aimed at studying the overall, partial, and local residence time distributions (RTD); overall, partial and local residence revolution distributions (RRD) and overall, partial and local residence volume distributions (RVD) in a co‐rotating twin screw extruder, on the one hand; and establishing the relationships among them, on the other hand. Emphasis was placed on the effects of the type and geometry of mixing elements (a gear block and various types of kneading elements differing in staggering angle) and process parameters on the RTD, RRD and RVD. The overall and partial RTD were directly measured in‐line during the extrusion process and the local ones were calculated by deconvolution based on a statistical theory. The local RTD allowed comparing the mixing performance of mixing elements. Also it was confirmed both experimentally and theoretically that specific throughput, defined as a ratio of throughput (Q) over screw speed (N), controlled all the above three types of residence distributions, be they local, partial or overall. The RRD and RVD do not provide more information on an extrusion process than the corresponding RTD. Rather they are different ways of representing the same phenomena. POLYM. ENG. SCI., 48:19–28, 2008. © 2007 Society of Plastics Engineers     

A generalized Bezoutian matrix with respect to a polynomial sequence of interpolatory type

In this note, a generalized Bezoutian matrix with respect to a polynomial sequence of interpolatory type is introduced. The operator representation relative to a pair of dual bases and the generalized Barnett-type factorization formula are derived. An intertwining relation and a Bezoutian reduction to a block diagonal form by congruence via a generalized Vandermonde matrix are presented. Fujiwara-Hermite and Routh-Hurwitz criteria in terms of this generalized Bezout matrix are obtained.     

Modeling electromigration lifetime under bidirectional currentstress

Electromigration reliability of interconnect under bidirectional current stress has been studied in a wide frequency range (mHz to 200 MHz). Experimental results show that the AC lifetime rises with the stress current frequency. The current density exponent and the activation energy of AC lifetime are found to be twice that of DC lifetime. Pure AC current stress failure at extremely high current density is believed to result from thermal migration of metal at hot/cold transition points