超深亚微米IC的宇宙射线辐射软失效研究

辐射引起的软失效一直是影响半导体可靠性的一个重大问题.特别是宇宙射线引起的在地球表面的高能中子,由于其特有的高穿透性很难有效屏蔽防护.介绍了其造成半导体器件软失效的失效机理,并利用加速软失效测试模型分别对90,65和45nm工艺的随机静态存储器的软失效率进行了分析,研究了该类中子造成的软失效率的影响因素及相关规律.据此预测了更高工艺技术产品的中子软失效率,在为芯片设计和制造阶段就对中子辐射可靠性的防护提供了一定的参考和依据.     

SRAM故障模型的检测方法与应用

静态随机存储器（Static Random Access Memory,SRAM）的功能测试用来检测该集成电路（IC）是否有功能缺陷,而目前大部分测试程序都只是集中在如何提高IC测试覆盖度,却很少能够做到检测IC是否有缺陷的同时分析这些缺陷的物理失效机理。本文介绍了一种利用不同测试算法组合测试的方法,在检测IC是否有缺陷同时,还能进行失效故障模型的分析,进一步利用该故障模型可以推测出具体的物理失效机理。该方法能显著提高测试中电性失效分析（EFA）的能力,进而提高了物理失效分析和IC制程信息反馈的效率和能力。     

Evaluation of grain refiners influence on the mechanical properties in a CuAlBe shape memory alloy by ultrasonic and mechanical tensile testing

This work carried out a non-destructive evaluation of grain size influence on the mechanical properties of a CuAlBe shape memory alloy with and without grain refiners. Ultrasonic signal processing, considering only the longitudinal velocity, was used for the non-destructive evaluation. Therefore, the average modulus of elasticity values found for the CuAlBe shape memory alloy was 45.7 GPa and 57.3 GPa with and without grain refiners, respectively. The corresponding values obtained by conventional mechanical tensile testing were equal to 43.2 GPa and 52.6 GPa, respectively. Additionally the mechanical tensile testing verified that the addition of grain refiners increases the stress of the alloy but has a slight effect on the alloy’s ductility. Thus, the modulus of elasticity and consequently the ultrasonic velocity, as well as the stress and strain values of CuAlBe alloy are fully dependent on its grain size. The ultrasonic analysis shows that this alloy is an excellent sound, vibration and mechanical wave absorber, presenting a high attenuation coefficient related to the wave scattering through the grains. In addition, the ultrasonic signal processing method used here confirms its main advantages of fastness and reliability.     

产品ESD快速低成本测试方法

静电防护(ESD)测试是半导体集成电路可靠性的重要项目,存在ESD问题会对产品的可靠性造成致命的影响.而由于目前产品的ESD测试,必须经过成品封装后才能进行,这样就无法快速进行产品的ESD认证和评估.介绍了ESD测试中如何利用陶瓷双列直插式封装(ceramic DIP或sB)来快速实现产品的ESD测试.对于一些多管脚芯片产品,举例说明了一种共地连接、分组测试的方法,克服了该封装有管脚数量限制的局限性.该方法简单、低成本、并且可以快速完成.可以极大地减少相对于传统ESD评估或认证的时间和成本,随之也大大缩短了产品的研发认证周期.     

Retinal Toxicity Induced by Chemical Agents

Vision is an important sense for humans, and visual impairment/blindness has a huge impact in daily life. The retina is a nervous tissue that is essential for visual processing since it possesses light sensors (photoreceptors) and performs a pre-processing of visual information. Thus, retinal cell dysfunction or degeneration affects visual ability and several general aspects of the day-to-day of a person’s lives. The retina has a blood–retinal barrier, which protects the tissue from a wide range of molecules or microorganisms. However, several agents, coming from systemic pathways, reach the retina and influence its function and survival. Pesticides are still used worldwide for agriculture, contaminating food with substances that could reach the retina. Natural products have also been used for therapeutic purposes and are another group of substances that can get to the retina. Finally, a wide number of medicines administered for different diseases can also affect the retina. The present review aimed to gather recent information about the hazard of these products to the retina, which could be used to encourage the search for more healthy, suitable, or less risky agents.