Effect of Annealing Temperature on Flowerlike Cu<Subscript>3</Subscript>BiS<Subscript>3</Subscript> Thin Films Grown by Chemical Bath Deposition

For widespread application of thin-film photovoltaic solar cells, synthesis of inexpensive absorber material is essential. In this work, deposition of ternary Cu₃BiS₃ absorber material, which contains abundant and environmentally benign elements, was carried out on glass substrate. Flowerlike Cu₃BiS₃ thin films with nanoflakes as building block were formed on glass substrate by chemical bath deposition. These films were annealed at 573 K and 673 K in sulfur ambient for structural improvement. Their structure was characterized using Raman spectroscopy, as well as their surface morphological and optical properties. The x-ray diffraction profile of as-deposited Cu₃BiS₃ thin film revealed amorphous structure, which transformed to orthorhombic phase after annealing. The Raman spectrum exhibited a characteristic peak at 290 cm^?1. Scanning electron microscopy of as-deposited Cu₃BiS₃ film confirmed formation of nanoflowers with diameter of around 1052 nm. Wettability testing of as-deposited Cu₃BiS₃ thin film demonstrated hydrophobic nature, which became hydrophilic after annealing. The measured ultraviolet–visible (UV–Vis) absorption spectra of the Cu₃BiS₃ thin films gave an absorption coefficient of 10⁵ cm^?1 and direct optical bandgap of about 1.42 eV after annealing treatment. Based on all these results, such Cu₃BiS₃ material may have potential applications in the photovoltaic field as an absorber layer.     

Electrophysical properties of Cu/Cr and Fe/Cr film systems within elastic and plastic deformation range

We have investigated the electrophysical properties of metallic thin films based on Cu/Cr and Fe/Cr systems. We find that the longitudinal gauge factor of two-layer films is significantly greater as compared with one-layer films, which have the same thickness as the total thickness of a two-layer film. Interface and intensive grain–boundary electron scattering explain such an increase in the longitudinal gauge factor. We find that the longitudinal gauge factor increases in transition from elastic to plastic zone.     

Growth, structural and optical properties of copper indium diselenide thin films deposited by thermal evaporation method

Copper indium diselenide (CuInSe₂) compound was synthesized by reacting its constituent’s elements copper, indium and selenium in near stoichiometric proportions (i.e. 1:1:2 with 5% excess selenium) in an evacuated quartz ampoule. Synthesized pulverized compound material was used as an evaporant material to deposit thin films of CuInSe₂ onto organically cleaned sodalime glass substrates, held at different temperatures (300-573 K), by means of single source thermal evaporation method. The phase structure and the composition of chemical constituents present in the synthesized compound and thin films have been investigated using X-ray diffraction and energy dispersive X-ray analysis, respectively. The investigations show that CuInSe₂ thin films grown above 423 K are single phase, having preferred orientation of grains along the (112) direction, and having near stoichiometric composition of elements. The surface morphology of CuInSe₂ films, deposited at different substrate temperatures, has been studied using the atomic force microscopy to estimate its surface roughness. An analysis of the transmission spectra of CuInSe₂ films, recorded in the wavelength range of 500-1500 nm, revealed that the optical absorption coefficient and the energy band gap for CuInSe₂ films, deposited at different substrate temperatures, are ∼10⁴ cm⁻¹ and 1.01-1.06 eV, respectively. The transmission spectrum was analyzed using iterative method to calculate the refractive index and the extinction coefficient of CuInSe₂ thin film deposited at 523 K. The Hall effect measurements and the temperature dependence of the electrical conductivity of CuInSe₂ thin films, deposited at different substrate temperatures, revealed that the films had electrical resistivity in the range of 0.15-20 ohm cm, and the activation energy 82-42 meV, both being influenced by the substrate temperature.     

Effects of Hydrogen-Dilution on Opto-Structural Properties of Hot-wire CVD Grown a-Si:H/nc-Si:H Multilayer for Photovoltaics

The multilayered thin film structure of amorphous silicon (a-Si:H) and nanocrystalline silicon (nc-Si:H) provides the possibility of bandgap tuning for fabrication of multijunction solar cells. This paper communicates a detailed analysis of optical and structural properties of a-Si:H/nc-Si:H multilayer thin films by hot-wire chemical vapor deposition at low hydrogen (H₂) and silane (SiH₄) flow rates. A set of multilayer films with 25 bilayers of a-Si:H/nc-Si:H are prepared using different hydrogen-dilution of SiH₄ in the alternating nc-Si:H layers. The first and the second order Raman scattering studies reveal the presence of mixed phases of silicon in the nc-Si:H layers. Raman and XRD investigation of the films confirm the presence of different sizes of the silicon nanocrystals. The optical spectroscopic analysis instead of FTIR analysis of multilayer films is utilized uniquely to determine the hydrogen content in the a-Si:H/nc-Si:H multilayers and is related to the amorphous phase of the films. No significant change in hydrogen content is observed and the amorphous phase is found to decrease with increase in hydrogen dilution. Further, no quantum size effect (QSE) was observed due to the large growth time of nc-Si:H layers. Thus the experimental result shows that the bandgap of multilayer films decreases due to reduction in amorphous silicon phase, ineffective QSE and relative loss of hydrogen content.

     

Structural,optical, and electrical properties of flash-evaporated copper indium diselenide thin films

Copper indium diselenide (CuInSe₂) compound was synthesized by reacting its elemental components, i.e., copper, indium, and selenium, in stoichiometric proportions (i.e., 1:1:2 with 5% excess selenium) in an evacuated quartz ampoule. Structural and compositional characterization of synthesized pulverized material confirms the polycrystalline nature of tetragonal phase and stoichiometry. CuInSe₂ thin films were deposited on soda lime glass substrates kept at different temperatures (300–573 K) using flash evaporation technique. The effect of substrate temperature on structural, morphological, optical, and electrical properties of CuInSe₂ thin films were investigated using X-ray diffraction analysis (XRD), atomic force microscopy (AFM), optical measurements (transmission and reflection), and Hall effect characterization techniques. XRD analysis revealed that CuInSe₂ thin films deposited above 473 K exhibit (112) preferred orientation of grains. Transmission and reflectance measurements analysis suggests that CuInSe₂ thin films deposited at different substrate temperatures have high absorption coefficient (~10⁴ cm⁻¹) and optical energy band gap in the range 0.93–1.02 eV. Results of electrical characterization showed that CuInSe₂ thin films deposited at different substrate temperatures have p-type conductivity and hole mobility value in the range 19–136 cm²/Vs. Variation of energy band gap and resistivity of CuInSe₂ thin films deposited at 523 K with thickness was also studied. The temperature dependence of electrical conductivity measurements showed that CuInSe₂ film deposited at 523 K has an activation energy of ~30 meV.