We have demonstrated high-performance InGaN-GaN multiple quantum-wells light-emitting diodes (LEDs) using polarization-induced (PI) p-InGaN-GaN superlattice. Electrical measurements show that PI LEDs produce much lower series resistance and turn-on voltage (at 20 mA) as compared to those of normal LEDs without the superlattice. It is also shown that the output power and photon wavelength of the PI LEDs remain electrically stable up to a high stress region of 200 mA. However, those of normal LEDs become electrically and optically degraded in excess of 120 mA. These results show that the use of the PI effect is very effective to the improvement of the electrical properties of LEDs. 相似文献
Indium tin oxide (ITO) films with a smooth surface (root-mean-square roughness; Rrms=0.40 nm) were made using a combination of the deposition conditions in the ion beam-sputtering method. Sheet resistance was 13.8 Ω/sq for a 150-nm-thick film grown at 150 °C. Oxygen was fed into the growth chamber during film growth up to 15 nm, after which, the oxygen was turned off throughout the rest of the deposition. The surface of the films became smooth with the addition of ambient oxygen but electrical resistance increased. In films grown at 150 °C with no oxygen present, a rough surface (Rrms=2.1 nm) and low sheet resistance (14.4 Ω/sq) were observed. A flat surface (Rrms=0.5 nm) with high sheet resistance (41 Ω/sq) was obtained in the films grown with ambient oxygen throughout the film growth. Surface morphology and microstructure of the films were determined by the deposition conditions at the beginning of the growth. Therefore, fabrication of ITO films with a smooth surface and high electrical conductivity was possible by combining experimental conditions. 相似文献
In this study, we investigated cold-sprayed copper as a front contact for crystalline silicon solar cells. Copper powder was deposited on a monocrystalline silicon wafer with variation of the particle velocity during deposition. The particle velocity was varied by varying the heating temperature from 250 to 400 °C using a gas pressure of 0.45 MPa. The particle velocities were calculated using empirical equations, and were found to increase with an increase in the carrier gas temperature. Grid patterns were formed on a phosphorus-doped n-type emitter of a p-type silicon substrate. The electrode thickness increased with increasing particle velocity. The electrical properties of the grids were evaluated using the transfer length method. The specific contact resistance of the n-type emitter was in the range of 2.6-26.4 mΩ-cm2. Damage to the p-n junction was investigated via minority carrier lifetime measurement of the substrate. The copper-silicon interface was evaluated using transmission electron microscopy. The contact properties were affected by the interface conditions. 相似文献
Nano imprinting technology and the electrodeposition method were applied to make CdTe nano patterns on flexible substrates. An ammonia based aqueous solution was prepared at pH 10.7 and indium tin oxide (ITO)/polyethylene naphthalate (PEN) film with template was used as the working electrode. ITO thin film which was coated on PEN film had good electrical conductivity and optical transmittance. The template was manufactured by nano imprinting technology on ITO/PEN film. It was made from benzyl methacrylate and had nano rod arrays. It was used as the working electrode and for making CdTe nano pattern. CdTe nano pattern were analyzed by X-ray diffractometer, dual beam (DB)-focused ion beam (FIB)-scanning electron microscopy (SEM), Raman spectroscopy, and ultraviolet (UV)-visible (VIS) spectroscopy. The structure and optical properties of CdTe nano pattern on flexible substrates was analyzed. The crystalline size of nano pattern had 8.26 nm. The Te particles that were precipitated on CdTe surface seems to be exist. The absence of annealing process influenced to have low absorption coefficient and narrow band gap compared to bulk CdTe. However, nano pattern increased reflectance. 相似文献
This paper presents the numerical study of dynamic fracture for metal cylinder under internal explosive loading. Also, the effects of fracture models and groove designs on fracture behavior are investigated. For the dynamic hardening behavior, the Lim-Huh model including the thermal softening effect is adopted [1, 2]. Also, the Lou-Huh fracture model considering the strain rate dependency is used for fracture prediction [3]. The tensile fracture occurs first at the outer surface, and the shear fracture is observed near the inner surface. In addition, finite element analyses are performed to study the effect of various groove designs on dynamic fracture; single U-groove and V-groove at the outer surface. The tensile and shear fracture lines are predicted near the groove tip and inner surface, respectively. It is concluded that the stress triaxiality parameter is one of the critical factors in the dynamic fracture prediction of the metal cylinder.
The comparison of resistive switching (RS) storage in the same device architecture is explored for atomic layer deposition (ALD) Al2O3, HfO2 and HfAlOx‐based resistive random access memory (ReRAM) devices. Among them, the deeper high‐ and low‐ resistance states, more uniform VSET‐VRES, persistent ROFF/RON (>102) ratio and endurance up to 105 cycles during both DC and AC measurements were observed for HfAlOx‐based device. This improved behavior is attributed to the intermixing of amorphous Al2O3/HfO2 oxide layers to form amorphous thermally stable HfAlOx thin films by consecutive‐cycled ALD. In addition, the higher oxygen content at Ti/HfAlOx thin films interface was found within the energy dispersive spectroscopy analysis (EDS). We believe this higher oxygen content at the interface could lead to its sufficient storage and supply, leading to the stable filament reduction‐oxidation operation. Further given insight to the RS mechanism, SET/RESET power necessities and scavenging effect shed a light to the enhancement of HfAlOx‐based ReRAM device as well. 相似文献