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Different processes are used on the back surface of silicon wafers to form cells falling into three groups:textured, planar, and sawed-off pyramid back surface.The characteristic parameters of the cells, ISC, VOC, FF, Pm, and Eff, are measured.All these parameters of the planar back surface cells are the best.The FF, Pm, and Eff of sawed-off pyramid back surface cells are superior to textured back surface cells, although ISC and VOC are lower.The parasitic resistance is analyzed to explain the higher FF of the sawed-off pyramid back surface cells.The cross-section scanning electron microscopy(SEM) pictures show the uniformity of the aluminum-silicon alloy, which has an important effect on the back surface recombination velocity and the ohmic contact.The measured value of the aluminum back surface field thickness in the SEM picture is in good agreement with the theoretical value deduced from the Al-Si phase diagram.It is shown in an external quantum efficiency(EQE) diagram that the planar back surface has the best response to a wavelength between 440 and 1000 nm and the sawed-off back surface has a better long wavelength response. 相似文献
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本文系统分析了食品安全检测中检测技术、人员能力、标准规范及监督管理等方面存在的质量控制问题,提出针对性提升策略。分析认为,通过优化检测技术设备、强化人员培训、推进标准统一化及完善监督机制,能够有效提升检测结果的准确性与公信力,为构建现代化食品安全保障体系提供理论支撑。 相似文献
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《微机原理与接口技术》是一门非常重要的专业课,该课程理论性、实践性及应用性都非常地强。本人在多年的教学过程中研究发现,这门课在讲授时存在很多问题。本文结合本人多年来的教学实践,谈谈对本门课程的几点教学体会。 相似文献
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