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Different processes are used on the back surface of silicon wafers to form cells falling into three groups:textured, planar, and sawed-off pyramid back surface.The characteristic parameters of the cells, ISC, VOC, FF, Pm, and Eff, are measured.All these parameters of the planar back surface cells are the best.The FF, Pm, and Eff of sawed-off pyramid back surface cells are superior to textured back surface cells, although ISC and VOC are lower.The parasitic resistance is analyzed to explain the higher FF of the sawed-off pyramid back surface cells.The cross-section scanning electron microscopy(SEM) pictures show the uniformity of the aluminum-silicon alloy, which has an important effect on the back surface recombination velocity and the ohmic contact.The measured value of the aluminum back surface field thickness in the SEM picture is in good agreement with the theoretical value deduced from the Al-Si phase diagram.It is shown in an external quantum efficiency(EQE) diagram that the planar back surface has the best response to a wavelength between 440 and 1000 nm and the sawed-off back surface has a better long wavelength response. 相似文献
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《微机原理与接口技术》是一门非常重要的专业课,该课程理论性、实践性及应用性都非常地强。本人在多年的教学过程中研究发现,这门课在讲授时存在很多问题。本文结合本人多年来的教学实践,谈谈对本门课程的几点教学体会。 相似文献
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