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A contact layer element for large deformations 总被引:1,自引:0,他引:1
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Semi‐Markovian processes (SMP) serve as a versatile means to model various traffic types generated by sources or superposed
from links in ATM networks. An efficient discrete time analysis method is proposed for SMP/G/1 queueing systems to evaluate
ATM switches with non‐renewal input. Some basic results are derived for the autocorrelation function of semi‐Markovian processes
and for the effect of state space reduction on autocorrelation, which show how to represent correlated traffic with given
characteristic by an adequate SMP model of limited size.
This revised version was published online in June 2006 with corrections to the Cover Date. 相似文献
4.
Henrik Lindstrm Eva Magnusson Anna Holmberg Sven Sdergren Sten-Eric Lindquist Anders Hagfeldt 《Solar Energy Materials & Solar Cells》2002,73(1):240
The present paper describes a new method for manufacturing a nanostructured porous layer of TiO2 on a conducting glass substrate for use in a dye-sensitized photoelectrochemical cell. The method involves deposition of a layer of semiconductor particles onto a conducting substrate and compression of the particle layer to form a mechanically stable, electrically conducting, and porous nanostructured film at room temperature. Photoelectrochemical characteristics and morphology of the resulting nanostructured films are presented. The potential use of the new manufacturing method in the future applications of nanostructured systems is discussed. 相似文献
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Sven Hovmöller 《Ultramicroscopy》1985,17(2):175-192
We present a family of techniques for the transmission electron microscope that generate surface zone-axis patterns. These patterns display the variation of the diffracted-beam intensity as a function of the angle of the incident electrons. The conditions of the experiments are those of reflection high-energy electron diffraction at near grazing incidence. The techniques are: surface convergent-beam diffraction, a surface analogue of the Tanaka method and a modified double-rocking scheme. Experimental results are presented for diffraction from surfaces of MgO and MoS2. We anticipate that surface zone-axis patterns (surface ZAPs) will become established as an important tool for surface characterization, especially when used in conjunction with high-resolution surface imaging and surface energy loss spectroscopy; surface ZAPs may be expected to play, in surface analysis, a role analogous to that played by convergent-beam diffraction in normal transmission electron microscopy. 相似文献
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A necessary and sufficient criterion is presented under which the property of positivity carry over from the data set to rational quadratic spline interpolants. The criterion can always be satisfied if the occuring parameters are properly chosen. 相似文献