CMOS图像传感器的硬复位电路研究

像素复位电路是CMOS图像传感器的重要组成部分,其特性直接影响着图像的质量.本文对CMOS APS图像传感器的动态范围、抗饱和能力、图像滞后以及非线性等性能进行了分析,并讨论了通过复位电路改善CMOS图像传感器性能的方法.在本文中,设计了两种带有抗饱和电路的硬复位电路,一种是采用传统的交叉耦合结构实现电压转换,另一种是基于改进的锁存器结构并增加阈值补偿管来实现,两种方案各具特点,分别适用不同的应用要求.仿真结果表明,两种电路方案均能够使动态范围提高2~3dB,增强像素抗饱和能力,同时消除了图像滞后与弱光下的非线性.     

Radiation effects on scientific CMOS image sensor

A systemic solution for radiation hardened design is presented. Besides, a series of experiments have been carried out on the samples, and then the photoelectric response characteristic and spectral characteristic before and after the experiments have been comprehensively analyzed. The performance of the CMOS image sensor with the radiation hardened design technique realized total-dose resilience up to 300 krad(Si) and resilience to single-event latch up for LET up to110 MeV·cm²/mg.