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本文用计入热电子效应的动量能量守恒模型讨论了亚微米GaAs MESFET二维数值模拟。为了减少计算量进行了模型简化和算法选择。文中给出并分析了三种典型器件的模用范果,根据模拟结果,研究了小尺寸器件中的速度过冲效应并得出常规的漂移扩散模型的适拟结围。 相似文献
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熊思强 《电子科学学刊(英文版)》1990,7(4):356-364
This paper deals with 2-D simulation of GaAs MESFET,which includes velocityovershoot effects by using energy transport model suitable for submicron devices.Computationtime is greatly reduced by simplifying the model and using fast convergence algorithms,e.g.Gummel interaction and ICCG method.The program shows good stability and convergence.Several types of GaAs MESFET structures,e.g.epitaxial,ion-implanted and buried P-layer,have been simulated.The results show that buried P-layer can decrease carrier's injections intosubstrate and improve device performance.The results are also used to study carefully thevelocity overshoot effects.By comparison of results of energy transport model and drift-diffusionmodel,the limitation of drift-diffusion-model is derived. 相似文献
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