提取光栅耦合的高电子迁移率晶体管中的太赫兹辐射

借助于傅立叶光谱仪,在具有耦合光栅的高电子迁移率晶体管中观察到了波长在400um左右的微弱的太赫兹辐射。同时使用了一种调制探测技术,从而使得太赫兹辐射的绝对功率能够被提取计算出来。并且发现器件的太赫兹辐射功率正比于源漏电流,而黑体辐射功率则与器件电功率有密切关系。此外,太赫兹辐射对于源漏偏置电压及栅压的依赖性,说明太赫兹辐射是由加速电子与光栅的相互作用而引起的。     

Extraction of terahertz emission from a grating-coupled high-electron-mobility transistor

In a grating-coupled high-electron-mobility transistor,weak terahertz emission with wavelength around 400μm was observed by using a Fourier-transform spectrometer.The absolute terahertz emission power was extracted from a strong background blackbody emission by using a modulation technique.The power of terahertz emission is proportional to the drain-source current,while the power of blackbody emission has a distinct relation with the electrical power.The dependence on the drain-source bias and the gate voltage suggests that the terahertz emission is induced by accelerated electrons interacting with the grating.