Circuit-Design Techniques of Radiation Hardening for Monolithic Op Amps

The design of amplifying systems based on op amps is discussed from a radiation-hardening viewpoint. Such systems are used in satellite communications, nuclear energy, and defense electronics. Circuit-design techniques of radiation hardening are reviewed. Long-term and pulsed irradiation are considered. For the latter the problem of shortening the op-amp recovery time is addressed.     

Current-feedback operational amplifier: Some features of its transient radiation response

The behavior is investigated of a current-feedback opamp exposed to pulsed ionizing radiation sufficiently intense to produce voltage surges in the opamp. For a system using such opamps, the possibilities of maintaining normal operation under the stated conditions are explored.     

Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers

The response of IC operational amplifiers (op amps) to pulsed ionizing irradiation is studied theoretically and experimentally. The major mechanisms of the radiation response are covered. The contributions of main op-amp stages to the output-voltage response are analyzed. The ionization-induced failure of an op amp is traced to its intermediate stages. It is established that the recovery time depends on the type of compensation employed. A block-model approach is proposed as a method for the prediction of transient radiation responses. Ways to define the performance index of an op amp exposed to pulsed ionizing radiation are discussed.     

Influence of noise parameters of integral operational amplifiers and voltage comparators and their nonlinear distortions on presentation accuracy of signals being processed

Influence of noisy signals of integral operational amplifiers (IOAs) and voltage comparators (IVCs) on accurate parameters of low-noise preamplifiers, discriminators, and analog-to-digital converters (ADCs) is considered. Methods aimed at increasing the noise factor of the above devices are discussed. Influence of nonlinear distortions resulting from signal representation is taken into consideration     

Mathematical Modeling of Ionizing-Radiation Effects in ICs: A Review

The block modeling of ICs exposed to ionizing radiation is reviewed. This approach helps one to predict the radiation response and to improve the radiation hardness of ICs and systems that use them.     

Complementary-transistor wideband path for the compensation of analog ICs designed to operate under pulsed ionizing irradiation

For analog ICs exposed to pulsed ionizing radiation, a parallel wideband path is proposed as a means of compensation to reduce the recovery time, increase the bandwidth, and prevent parasitic oscillations and latchups.