A BIST-DFT technique for DC test of analog modules

Among test techniques for analog circuits, DC test is one of the simplest method for BIST application since easy to integrate test pattern generator and response analyzer are conceivable. Precisely, this paper presents such an investigation for a CMOS operational amplifier that is latter extended to active analog filters. Since the computation of fault coverage is still a controversy question for analog cells, we develop first an evaluation technique for optimizing the tolerance band of the measurements to test. Then, using some DFT solutions we derive single DC pattern and discuss the minimal number of points to test for the detection of defects. A response analyzer is integrated with a Built-in Voltage Sensor (BIVS) and provides directly a logic pass/fail test result. Finally, the extra circuitry introduced by this BIST technique for analog modules does not exceed 5% of the total silicon area of the circuit under test and detects most of the faults.     

Design for testability and DC test of switched-capacitor circuits

The authors present a design for testability (DFT) technique for switched-capacitor circuits. The principle is to reconfigure the SC circuit so that it realises a cascade of DC voltage amplifiers in which all capacitors are represented in a simple form. Then, the transfer function becomes a product of the ratio of two capacitors and the sensibility of the DC gain to each capacitor is close to unity. Consequently, a simple test with partial diagnosis is realised with some DC voltage stimuli and gives an accurate test result at the output of the last voltage amplifier     

Boolean equations for multiple paths sensitisation of digitaloscillation built-in self test

A major improvement to the digital oscillation built-in self test (DOBIST) method is proposed. The DOBIST technique deals with simultaneously testing path delay, gate delay and stuck-at faults in digital integrated circuits. The equations reported allow concurrent multiple oscillations and greatly improve the DOBIST test quality