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Jacksen N. Nelsen L.D. Boehm D.E. Odom T. 《Electronics Packaging Manufacturing, IEEE Transactions on》2001,24(2):65-71
Magneto-optical static event detectors, introduced at the 1998 EOS/ESD Symposium, have been demonstrated as a useful tool to detect low-level transients that damage magnetoresistive (MR) and giant magnetoresistive (GMR) recording heads. Improvements in magneto-optic film characteristics, device design, and wafer fabrication methods will result in enhanced sensitivity to those transients. Improvements in packaging and performance repeatability are described 相似文献
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