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Shtrom I. V. Kotlyar K. P. Filosofov N. G. Serov A. Yu. Krizhkov D. I. Samsonenko Yu. B. Ilkiev I. V. Reznik R. R. Agekyan V. F. Cirlin G. E. 《Semiconductors》2018,52(16):2146-2148
Semiconductors - We present the results of photoluminescence measurements of AlxGa1 – xAs nanowires, together with the transmission electron microscopy structural analysis.... 相似文献
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