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Study on the Implementation of Optical Transparent Transport Networks in the European Environment—Results of the Research Project COST 239 总被引:1,自引:0,他引:1
Batchelor Peter Daino Benedetto Heinzmann Peter Hjelme Dag R. Inkret Robert Ja¨ger Hubert A. Joindot Michel Kuchar Anton Coquil Emile Le Leuthold Peter Marchis Giancarlo De Matera Francesco Mikac Branko Nolting Hans-Peter Spa¨th Jan Tillerot Fran¸ois Caenegem Bart Van Wauters Nico Weinert Carl 《Photonic Network Communications》2000,2(1):15-32
Photonic Network Communications - 相似文献
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Dupont H. Chawki M.J. Tillerot F. Thual M. Poudoulec A. 《Photonics Technology Letters, IEEE》1994,6(8):942-944
A semiconductor optical amplifier has been used as an external modulator. The large signal response has shown a 3-dB bandwidth of 3.1 GHz when the amplifier was saturated by the input optical wave. Moreover, the effective phase-amplitude coupling factor, which is a typical parameter of a semiconductor optical amplifier, was measured to be 8 相似文献
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R. Ramesh W. K. Chan B. Wilkens A. Inam F. Tillerot T. D. Sands J. M. Tarascon V. G. Keramidas 《Journal of Electronic Materials》1992,21(5):513-518
Epitaxial thin film PbZr0.2Ti0.8O3/YBa2Cu3O7 heterostructures have been grown on single crystal LaA103 by in-situ pulsed laser deposition. Structural characterization by x-ray diffraction, and transmission electron microscopy
reveals that the films are typically c-axis oriented with a small fraction of a-axis oriented material, that is deposition
condition dependent. The electrical properties change systematically with the crystalline quality and the best properties
are obtained at higher temperatures. Above 715‡ C, there is progressive loss of lead and the electrical properties are diminished. 相似文献
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R. Ramesh A. Inam W. K. Chan B. Wilkens F. Tillerot T. Sands 《Integrated ferroelectrics》2013,141(2-4):205-212
Abstract Using a combination of pulsed laser deposition and sol-gel processing, we have fabricated epitaxial PbZr0.2Ti0.8O3/YBa2Cu3O7-x heterostructures on single crystalline [001] LaAlO3. Rutherford back-scattering studies show the composition to be the same as the nominal starting composition. Transmission electron microscopy shows the existence of a randomly oriented polycrystalline microstructure in the PZT layer with a grain size of about 500–1000Å. Microscopic pores were also observed in the PZT layer. The PZT film exhibits ferroelectric hysteresis with a saturation polarization of 22–25μC/cm2 (at 7.5V, 1kHz), a remanence of 5–6μC/cm2 and a coercive field of about 40kV/cm. 相似文献
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