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Jong-heon Kim In-Soo Kang Chi-jung Song Young-Jik Hur Hak-Nam Kim Esdy Baek Tae-Jun Seo 《Microelectronics Reliability》2004,44(1):1326-161
Chip scaled opto-electronic packaging is introduced as a cost and size effective packaging solution for mobile phone with built in camera. The chip scaled assembly includes gold bumped CMOS image sensor device and its flip-chip bonding on substrate using the anisotropic conductive material. Two types of flip-chip module were designed to have flip-chip on flex and flip-chip on glass. It is shown that well controlled bumping process of thin film deposition and wet etching gives no damage to image sensing surface during the deposition and stripping of metal film. As results, smart and high degree miniaturized image sensor module is actualized for mobile phone and the reliability test results proved the robustness of module structure having flip-chip. Solder bumping was also reviewed and successfully introduced to verify the alternative of image sensor bumping. 相似文献
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The computational complexity required by the complete calculation of the distance spectrum of turbo codes, even limited to low weight input sequences, makes it too slow for practical purposes such as interleaver optimization or effective bit error rate bounding. In this paper, a fast algorithm for distance spectrum estimation purposes is presented. A comparison with complete computed spectra, theoretically derived spectra and results from previous works will be presented for both deterministic and uniform interleavers. 相似文献
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