Correcting the Characteristics of Silicon Photodiodes by Ion Implantation

Semiconductors - The measured electrical parameters of silicon pin photodiodes subjected to the implantation of defect-forming ions and subsequent heat treatment are analyzed, which reveal a new...     

Application of X-ray scattering technique to the study of supersmooth surfaces

Applications of the X-ray scattering technique for studying supersmooth surfaces with rms roughness of 0.1–0.2 nm are discussed. The experimental schemes are analyzed and systematic errors on the determination of 2D and 1D PSD-functions are evaluated. Results of laboratory and synchrotron experiments are presented on the study of roughness of superpolished substrates made of different materials as well as for B₄C films of different thickness.     

Template Synthesis of Iron Microstructures Based on Track Membranes

Iron nanowires (NWs) were obtained by template synthesis using polymer track membranes in the framework of development of a general method for the synthesis of regular metal nanostructures. The surface topography of NWs was studied by scanning electron microscopy, and the local state of iron atoms was determined by Mössbauer spectrometry.

     

A computationally efficient version of the algebraic method for computer tomography

We propose a new fast version of the Simultaneous Algebraic Reconstruction Technique (SART) for computer tomography. The algorithm’s iteration has been made asymptotically faster with a fast Hough transform. The algorithm’s behavior has been studied with a model experiment.     

X-ray microtomography using a laboratory source: Measurement technique and comparison of reconstruction algorithms

A method of measuring the projections recorded by a laboratory-scale x-ray tomograph device is described. Numerical realizations of several methods that employ the apparatus of morphological image analysis are used to reconstruct images of a test object. It is shown that the estimators of the mean values of the coefficients of linear attenuation of media that are obtained are in good agreement with the requirements imposed on modern industrial, medical, and laboratory tomograph devices. __________ Translated from Izmeritel’naya Tekhnika, No. 2, pp. 19–24, February, 2008.     

Comparative study of the roughness of optical surfaces and thin films by use of X-ray scattering and atomic force microscopy

The surface roughness of polished glass substrates and optical thin-film coatings is studied with atomic force microscopy and x-ray scattering. It is demonstrated that both methods permit the determination of power spectral density functions in a wide range of spatial frequencies. The results are in good quantitative agreement.     

Reflectometry of X-ray Whispering Gallery Waves Propagating along Liquid Meniscuses

Semiconductors - X-ray reflectometry of whispering galleries (WGs), which propagate along meniscuses of deionized water or silica hydrosols (Ludox® SM) enriched by Cs+ ions, was analyzed for...     

Regular Microstructures Based on Polyethylene Terephthalate Films

Technical Physics Letters - A method for forming regular dielectric and metallic microstructures based on polyethylene terephthalate films irradiated with a synchrotron radiation source through a...     

An X-ray Diffractometer with a Mobile Emitter-Detector System

An X-ray diffractometer with a mobile emitter-detector system is able to perform various X-ray examinations of a stationary sample. The design for this instrument is described, along with its operating principles and control programs. Owing to its high-precision angular movement sensors and its two detectors (one of these, a linear position-sensitive detector, has a working length of 100 mm and a resolution of <0.2 mm), the diffractometer can be used in both traditional and nontraditional experiments on X-ray reflection, scattering, and absorption. Results from using this instrument in reflectometry and X-ray tomography are presented as an example.__________Translated from Pribory i Tekhnika Eksperimenta, No. 3, 2005, pp. 99–107.Original Russian Text Copyright © 2005 by Asadchikov, Babak, Buzmakov, Dorokhin, Glagolev, Zanevskii, Zryuev, Krivonosov, Mamich, L. Moseiko, N. Moseiko, Mchedlishvili, Savel’ev, Senin, Smykov, Tudosi, Fateev, Chernenko, Cheremukhina, Cheremukhin, Chulichkov, Shilin, Shishkov.