Physical investigations on Ni doping ZnO thin films along with ethanol response

Journal of Materials Science: Materials in Electronics - Undoped and Ni-doped ZnO thin films were grown on glass substrates at 460 °C using the spray pyrolysis method. All samples...     

Effect of pre-deposition annealing on physical properties of CZTSSe thin films deposed by RF-sputtering based on nanoparticles synthesized by solvothermal technique

This work aims to highlight the beneficial effect of annealing of Cu₂ZnSn(S,Se)₄ (CZTSSe) nanoparticles (NPs) on the properties of the obtained films by RF-magnetron sputtering at room temperature (RT) and at 200 °C. The CZTSSe targets used for the deposition are obtained using nanoparticles synthesized by solvothermal technique. It is denoted that the elemental composition of thin films becomes independent of the growth temperature in the case of annealed CZTSSe NPs. The optical investigation gives that the gap energy is ranging between 1.26 and 1.40 eV with an Urbach’s energy between 100 and 200 meV. By using the Wemple and Didominico model to analyze the refractive index spectra, we have identified common oscillator energy for all CZTSSe thin films and dispersion energy ranging from 2.63 to 5.81 eV. CZTSSe thin films obtained by means of annealed NPs exhibit higher dielectric constant and refractive index. The dispersion of different parameters with experimental conditions is analyzed via a common relationship that illustrates the linear dependence of n₀, E_d, ε_s, and ε_L on the square of the valence difference (ΔZ). The conductivity spectra are deduced, and a theoretical model was identified to fit the permittivity spectra. The obtained results are promising for solar cell applications.

     

X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin films

Different multifunctional (PbTiO₃, Sm_0.6Nd_0.4NiO₃, NdMnO₃) thin films were grown by metalorganic chemical vapor deposition (MOCVD) technique on SrTiO₃ and LaAlO₃ substrates. Transmission electron microscopy (TEM) and X-ray diffraction measurements reveal that almost single crystalline thin films can be epitaxially grown on the top of substrates. The relationship between the crystallographic orientation of the films and those of the substrates were determined by reciprocal space mapping and TEM analyses. PbTi03 thin films appear to be under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Relaxation mechanism as a function of the film thickness arises from coexistence of different type of domains and size and strain effect are analyzed. SmNiO₃ thin films present diffuse scattering strikes and are less well organized when compared to PbTi0₃ thin films. Different domains are observed as well as an additional parasitic phase close to NiO. Its regular distribution can be associated to reduced transport properties. Preliminary observations on NdMnO₃ thin films shows that an amorphous phase is obtained during MOCVD that can be transformed in a single crystalline film by annealing. The films are under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Magnetic properties are investigated.