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排序方式: 共有88条查询结果,搜索用时 298 毫秒
1.
Combined time and wavelength multiplexing technique of optical fiber grating sensor arrays using commercial OTDR equipment 总被引:1,自引:0,他引:1
Valente L.C.G. Braga A.M.B. Ribeiro A.S. Regazzi R.D. Ecke W. Chojetzki C. Willsch R. 《IEEE sensors journal》2003,3(1):31-35
The use of a commercial optical time domain reflectometry device for simultaneous wavelength and time domain multiplexing of fiber-optic Bragg grating sensors is proposed and demonstrated. The realization of such systems provides an inexpensive way of interrogating several hundreds of sensors in a single fiber. Strain resolution of 30 /spl mu/m/m over a strain measuring range of 0.5% was obtained. 相似文献
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Mick Donegan Jeffrey D. Morris Fulvio Corno Isabella Signorile Adriano Chió Valentina Pasian Alessandro Vignola Margret Buchholz Eva Holmqvist 《Universal Access in the Information Society》2009,8(4):259-275
Gaze-control enables people to control a computer by using eye-gaze to select items on screen. Gaze-control is a necessity
for people who have lost all motor control of their body and only have control over eye movements. In addition, gaze-control
can be the quickest and least tiring option for a far broader group of people with varying disabilities. This paper reports
findings from gaze-control user trials involving users from both groups: people who are totally paralyzed, as well as people
with a wide range of complex disabilities. The trials conducted involved four different centres supporting people with disabilities
in three different European countries. Several gaze-control systems were trialled by a large number of users with varying
needs and abilities. The perceived benefits of gaze-control are described, and recommendations for successful assessment and
implementation of gaze-control are provided. 相似文献
4.
Lutz Hofmann Tobias Fischer Thomas Werner Franz Selbmann Michael Rennau Ramona Ecke Stefan E. Schulz Thomas Geßner 《Microsystem Technologies》2016,22(7):1665-1677
This paper discusses approaches for the isolation of deep high aspect ratio through silicon vias (TSV) with respect to a Via Last approach for micro-electro-mechanical systems (MEMS). Selected TSV samples have depths in the range of 170…270 µm and a diameter of 50 µm. The investigations comprise the deposition of different layer stacks by means of subatmospheric and plasma enhanced chemical vapour deposition (PECVD) of tetraethyl orthosilicate; Si(OC2H5)4 (TEOS). Moreover, an etch-back approach and the selective deposition on SiN were also included in the investigations. With respect to the Via Last approach, the contact opening at the TSV bottom by means of a specific spacer-etching method have been addressed within this paper. Step coverage values of up to 74 % were achieved for the best of those approaches. As an alternative to the SiO2-isolation liners a polymer coating based on the CVD of Parylene F was investigated, which yields even higher step coverage in the range of 80 % at the lower TSV sidewall for a surface film thickness of about 1000 nm. Leakage current measurements were performed and values below 0.1 nA/cm2 at 10 kV/cm were determined for the Parylene F films which represents a promising result for the aspired application to Via Last MEMS-TSV. 相似文献
5.
Case-based reasoning (CBR) model for hard machining process 总被引:1,自引:1,他引:0
Anthony M. Xavior Margret S. Anouncia 《The International Journal of Advanced Manufacturing Technology》2012,61(9-12):1269-1275
In this research paper, hard machining of two materials viz. AISI 52100 (bearing steel) and AISI D2 (tool steel) at a hardness of 55?HRC is addressed. Taguchi’s technique is used for the design of experiments. Eight different parameters are considered for the experimentation in order to perform comprehensive investigations on hard machining process. Case-based reasoning (CBR) model is developed for predicting the machining performance and its capability is evaluated by conducting validation experiments. The root mean squared error, mean absolute percentage error, and the correlation coefficient between the actual and the model-predicted values of surface roughness and tool life are evaluated to confirm the validity of the CBR model. 相似文献
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Wang Y. Bartelt H. Ecke W. Moerl K. Lehmann H. Schroeder K. Willsch R. Kobelke J. Rothhardt M. Spittel R. Shan L. Brueckner S. Jin W. Tan X. Jin L. 《Photonics Technology Letters, IEEE》2010,22(3):164-166
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