Surface-enhanced Raman scattering substrate of silver nanoparticles depositing on AAO template fabricated by magnetron sputtering

In this report, we describe a fabrication process of low-cost and highly sensitive SERS substrates by using a simple anodizing setup and a low-energy magnetron sputtering method. The structure of the SERS substrates consists of silver nanoparticles deposited on a layer of anodic aluminum oxide (AAO) template. The fabricated SERS substrates are investigated by a scanning electron microscope (SEM), a transmission electron microscope (TEM), and a confocal Raman spectroscope. We have verified from the surface morphology that the fabricated SERS substrates consist of high-density round-shape silver nanoparticles where their size distribution ranges from 10 to 30 nm on the top and the bottom of nanopores. The surface-enhanced Raman scattering activities of these nanostructures are demonstrated using methylene blue (MB) as probing molecules. The detection limit of 10⁻⁸ M can be achieved from this SERS substrate.     

Designs and investigations of anti-glare blue-tint side-view car mirrors

Recent developments for luxury car industries have been in favor of anti-glare color-tint side-view exterior car mirrors. In this study, we explore the designs, the fabrications, and the investigations of anti-glare blue-tint samples suitable for the side-view car mirrors. With an aid of the thin film design software, the TiO₂-based backside-coated optical systems are prepared by the homemade and the retailed sputtering systems, and examined for the reflection spectra and the chromaticity diagrams. From four major designs of the anti-glare blue-tint mirrors, the ultra-thin metallic layer and the dielectric stack with the bottommost reflective layer offer the blue-tint at 85% highest reflection. Although the design requires only 40 min of the deposition time, the careful control of the ultra-thin metallic film thickness is crucial.     

Large scale F-doped SnO2 coating on glass by spray pyrolysis

Large scale F-doped SnO₂ coating was carried out on a glass production line by a cheap in-house spray pyrolysis coater. The coater was installed on glass annealing lehr which has a width of ∼2 m. The solution for film formation consisted of SnCl₄·5H₂O and NH₄F dissolved in a solvent. The solution was sprayed by pressure spray nozzles downward to underneath hot glass sheet. The coating was done for 150 s where the glass temperature was in a range of 430-450 °C. The total length of the coated glass was ∼10 m. It was found by sheet resistance measurement that the coating started non-uniformly and then it covered the entire width of glass when spraying time approached 150 s. The lowest sheet resistance of the coated glass was 0.8 kΩ/□ where the film thickness was ∼80 nm which corresponds to film resistivity of ∼6.4 × 10^− 3 Ω-cm.     

Characterization of inhomogeneity in TiO2 thin films prepared by pulsed dc reactive magnetron sputtering

This article discusses an analytical method for characterizations of TiO₂ thin films and determinations of the degree of their inhomogeneity. The TiO₂ films were prepared by a pulsed dc magnetron sputtering with an operating pressure as a main experimental parameter. The obtained films were primarily characterized for film crystallinity, microstructures and optical properties by spectroscopic ellipsometry. The measured ellipsometric data were analyzed by the single-, the double, and the triple-layer models in order to match with the inhomogeneous film structure proposed in the Thornton structure zone model. The results were then compared with those obtained from grazing-incidence X-ray diffraction, field-emission scanning electron microscopy and high-resolution transmission electron microscopy. The study revealed that the pulsed dc sputtered TiO₂ films could be best described by the inhomogeneous triple-layer physical model. Although the films deposited at lower operating pressure had a dense structure with a mirror-like surface topography, the films deposited at higher operating pressure had the porous structure with the rough surface and the void.     

Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials

By incorporation of an achromatic three-reflection quarterwave retarder to a spectroscopic ellipsometer and application of appropriate calibration and error correction procedures, it has been possible to characterize real thin-film fluoride optical coatings that are inhomogeneous. The refractive index and its dispersion with wavelengths greater than 300-700 nm as well as the depth profile of voids in the film have been determined for AlF(3), CeF(3), HfF(4), LaF(3), ScF(3) and YF(3) films on vitreous silica substrates.     

Development of the scratch resistance on acrylic sheet with basic colloidal silica (SiO2)—methyltrimethoxysilane (MTMS) nanocomposite films by sol–gel technique

The formation of scratch‐resistant coating film prepared from colloidal silica and a polysiloxane matrix was investigated. Methyltrimethoxysilane (MTMS) was hydrolysed and mixed with silica sol (SiO₂) at various compositions to form the hybrid hard‐coating nanocomposite film. The hydrolysed MTMS (polysiloxane) acts as the polymeric binder that is covalently linked to the colloidal silica surface and provides adhesion for the scratch resistant coating film to the substrate. The ratio between the polymeric matrix and the SiO₂ nanoparticles was found to play a major role in controlling the coating film appearance and its resistance to scratching. At a SiO₂ content < 30 wt.%, the agglomeration of the hydrolysed polysiloxane was observed and caused the opacity of the coating film. At a SiO₂ content >70 wt.%, there was not enough polysiloxane to act as a binder for the SiO₂, therefore a shrinkage upon solidification of the coating film caused cracking within the nanocomposite film. The optimum ratio was found to be at 40 wt.% ≤SiO₂ ≤60 wt.%, where the films had a transparent, crack free hard coating, with excellent scratch resistance, good adhesion and very good environmental resistance. The nanoindentation revealed that the nanocomposite film, at the optimum loading, possessed a higher strength with a higher SiO₂ loading. Film properties, including hardness, scratch resistance, adhesion and environmental resistance were also examined. The morphology of nanocomposite films was identified by atomic force microscopy (AFM) and scanning electron microscopy (SEM). © 2011 Canadian Society for Chemical Engineering     

Structural, optical and hydrophilic properties of nanocrystalline TiO2 ultra-thin films prepared by pulsed dc reactive magnetron sputtering

TiO₂ ultra-thin (15 nm) films were deposited on silicon wafers (100) and glass slides by pulsed dc reactive magnetron sputtering in an ultra-high vacuum (UHV) system. The effects of substrate temperature, from room temperature to 400 °C, on structural, optical, and hydrophilic properties of the obtained films have been investigated. The structure of the films was characterized by grazing-incidence X-ray diffraction, high-resolution transmission electron microscopy, and atomic force microscopy. The optical properties were determined by UV-vis spectrophotometer and spectroscopic ellipsometry. The hydrophilic properties of the films, after exposed to ultraviolet illumination, were analyzed from contact angle measurements. The results suggested that the substrate temperature at 300 °C was critical in the crystalline phase transformation from amorphous to anatase in the TiO₂ films. The obtained films exhibited good qualities in the optical properties, in addition to excellent photo-induced hydrophilic activities.     

Characterization of Optical Thin Films by Spectroscopic Ellipsometry

Spectroscopic ellipsometry was used to rapidly and nonde- structively characterize ion-plated SiO₂ and Ta₂O₅ films on glass substrates as a function of temperature. The analysis provided the density (as a function of depth) and optical properties of the films. The SiO₂ film had a higher refractive index than is typical for thermally grown SiO₂. This was attributed to compaction of the film during the deposition process. Similarly, the ion-plated Ta₂O₅ film had the high refractive index characteristic of a high-density film. The films were not affected strongly by temperature during heating >100°C.