Surface integrity characterization of manufactured component is very important as it significantly affects the in-service performance of the component. Till now, surface integrity was evaluated using conventional measurement technique like microhardness tester, X-ray diffraction, optical microscopy and surface roughness tester. But, this technique being laboratory based cannot be used for in-service monitoring of the surface integrity. The present study focuses on the characterization of surface integrity upon electric discharge machined sample using non-destructive magnetic Barkhausen noise technique. Electric discharge machining was performed in die-sinking mode on die steel using copper–tungsten electrode (negative polarity). Experiment was performed by selecting different levels of peak current, gap voltage and pulse on time. Surface integrity characteristics like microhardness change, residual stress, microstructural alteration and surface roughness were analysed using microhardness tester, X-ray diffraction, optical microscopy and surface roughness tester, respectively, and were then correlated with magnetic parameter like root mean square value and peak value obtained from Barkhausen noise signal. The results show a good correlation between magnetic parameter (RMS and Peak value) of Barkhausen noise with the microhardness and surface roughness of the machined sample.
We investigate the challenges of building an end-to-end cloud pipeline for real-time intelligent visual inspection system for use in automotive manufacturing. Current methods of visual detection in automotive assembly are highly labor intensive, and thus prone to errors. An automated process is sought that can operate within the real-time constraints of the assembly line and can reduce errors. Components of the cloud pipeline include capture of a large set of high-definition images from a camera setup at the assembly location, transfer and storage of the images as needed, execution of object detection, and notification to a human operator when a fault is detected. The end-to-end execution must complete within a fixed time frame before the next car arrives in the assembly line. In this article, we report the design, development, and experimental evaluation of the tradeoffs of performance, accuracy, and scalability for a cloud system. 相似文献
Of late, there has been an avalanche of cross-layer design proposals for wireless networks. A number of researchers have looked at specific aspects of network performance and, approaching cross-layer design via their interpretation of what it implies, have presented several cross-layer design proposals. These proposals involve different layers of the protocol stack, and address both cellular and ad hoc networks. There has also been work relating to the implementation of cross-layer interactions. It is high time that these various individual efforts be put into perspective and a more holistic view be taken. In this article, we take a step in that direction by presenting a survey of the literature in the area of cross-layer design, and by taking stock of the ongoing work. We suggest a definition for cross-layer design, discuss the basic types of cross-layer design with examples drawn from the literature, and categorize the initial proposals on how cross-layer interactions may be implemented. We then highlight some open challenges and new opportunities for cross-layer design. Designers presenting cross-layer design proposals can start addressing these as they move ahead. 相似文献
Wireless sensor networks could advance many scientific pursuits while providing a vehicle for enhancing various forms of productivity, including manufacturing, agriculture, construction, and transportation. 相似文献
We develop a method to estimate the variation of leakage current due to both intra-die and inter-die gate length process variability. We derive an analytical expression to estimate the probability density function (PDF) of the leakage current for stacked devices found in CMOS gates. These distributions of individual gate leakage currents are then combined to obtain the mean and variance of the leakage current for an entire circuit. We also present an approach to account for both the inter- and intra-die gate length variations to ensure that the circuit leakage PDF correctly models both types of variation. The proposed methods were implemented and tested on a number of benchmark circuits. Comparison to Monte Carlo simulation validates the accuracy of the proposed method and demonstrates the efficiency of the proposed analysis method. Comparison with traditional deterministic leakage current analysis demonstrates the need for statistical methods for leakage current analysis. 相似文献