首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   949篇
  免费   3篇
电工技术   4篇
化学工业   89篇
金属工艺   26篇
机械仪表   71篇
建筑科学   1篇
能源动力   2篇
轻工业   1篇
水利工程   2篇
石油天然气   11篇
武器工业   2篇
无线电   71篇
一般工业技术   120篇
冶金工业   514篇
原子能技术   31篇
自动化技术   7篇
  2021年   10篇
  2020年   11篇
  2019年   17篇
  2018年   16篇
  2017年   17篇
  2016年   20篇
  2015年   6篇
  2014年   22篇
  2013年   23篇
  2012年   28篇
  2011年   30篇
  2010年   19篇
  2009年   27篇
  2008年   25篇
  2007年   19篇
  2006年   12篇
  2005年   16篇
  2004年   4篇
  2003年   17篇
  2002年   8篇
  2001年   11篇
  2000年   10篇
  1999年   30篇
  1998年   142篇
  1997年   84篇
  1996年   64篇
  1995年   32篇
  1994年   28篇
  1993年   32篇
  1992年   5篇
  1991年   8篇
  1990年   4篇
  1989年   6篇
  1988年   6篇
  1986年   5篇
  1985年   5篇
  1983年   6篇
  1982年   6篇
  1981年   4篇
  1980年   4篇
  1977年   28篇
  1976年   29篇
  1974年   5篇
  1970年   5篇
  1969年   3篇
  1968年   5篇
  1967年   4篇
  1966年   3篇
  1965年   3篇
  1963年   3篇
排序方式: 共有952条查询结果,搜索用时 0 毫秒
1.
The results are presented of the fabrication of strain-relaxed graded Si1 − x Gex/Si(001) buffer layers with a maximum Ge fraction of about 0.25 that have a low density of threading dislocations (<106 cm−2) and low surface roughness. The buffer layers are grown by atmospheric-pressure hydride CVD. It is found that chemical mechanical polishing can reduce their surface roughness to a level comparable with that of the original Si(001) substrates. It is shown that the polished buffer layers can serve as substrates for MBE-grown SiGe/Si heterostructures.__________Translated from Mikroelektronika, Vol. 34, No. 4, 2005, pp. 243–250.Original Russian Text Copyright © 2005 by Vostokov, Drozdov, Krasil’nik, Kuznetsov, Novikov, Perevoshchikov, Shaleev.  相似文献   
2.
Results of ballistic tests for obstacles made of combined materials in relation to striker shape are presented in the form of penetration curves. It is established that striker shape affects not only quantitative indices, but also the qualitative nature of these curves.Translated from Problemy Prochnosti, No. 1, pp. 60–62, January, 1992.  相似文献   
3.
4.
5.
6.
There is now considerable evidence suggesting that alterations in the DNA methylating machinery play an important role in tumorigenesis and tumour progression. For example, focal hypermethylation and generalised genomic demethylation are features of many different types of neoplasms. It is thought that tumorigenesis and tumour progression may be caused by hypermethylation induced mutational events and silencing of genes which control cellular proliferation and/or demethylation induced reactivation of genes which may only be required during embryological development. Consequently, we have begun to investigate the role of DNA methylation and developmental genes in malignant lymphoproliferative diseases. Previously, in all cases of non-Hodgkins lymphoma and leukemia studied, we have shown that the myogenic developmental gene Myf-3 is abnormally hypermethylated. In this review we discuss the possible significance of these findings since in vitro studies suggest that Myf-3 may play an important role in control of the cell cycle and therefore lymphomagenesis. In vitro and in vivo evidence suggests that PAX genes may also have oncogenic potential. The PAX family of developmental genes are involved in cellular differentiation, proliferation and cell migration. Expression of PAX3 in particular is associated with cellular mobility. Our previous studies have indicated that alternate regional expression of PAX genes may be controlled by DNA methylation. Therefore, we have proposed that abnormal methylation profiles of PAX3 may be associated with neoplastic transformation and/or metastatic potential. Results thus far reveal that the paired box of PAX3 is abnormally hypermethylated and the homeobox abnormally hypomethylated in lymphomas and leukemias. These new findings are consistent with our postulate and support the idea that inappropriate methylation induced activation or inactivation of developmental genes such as Myf-3 and PAX3 play an important role in lymphomagenesis and disease progression and that inspection of the methylation status of other developmental genes is warranted.  相似文献   
7.
8.
The Ge and Er depth profiles in Si1 – x Ge x layers grown on Si(100) substrates by Si sublimation-source molecular-beam epitaxy in GeH4 were studied by secondary ion mass spectrometry. The results demonstrate that Ge facilitates Er incorporation into the growing Si–Ge layer. The Er dopant profile becomes sharper with increasing Ge content. The Ge profile also has rather sharp boundaries, indicating that there is no Ge surface segregation, which is attributable to the presence of adsorbed hydrogen, acting as a surfactant.  相似文献   
9.
10.
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号