POLYMER DIODES MADE OF ION IMPLANTED POLYACETYLENE FILMS

Polyacetylene films were doped with FeCl3 and implanted with 30 k'eV K+ ions. Physical changes to the films were examined by a series of measurements, which include the four-probe test, infrared ray absorption and 2 MeV He+ particle elastic recoil dettection and Rutherford backscattering. The chemical dopants (Fe+++ and Cl-) were redistributed after the implantation and the different species (K+. Fe+++ and Cl-ions) formed p - n junctions at the implantation depths. The implanted films exhibited desirable Ⅰ-Ⅴ characteristics, with current densities as high as 600 mA/cm- at 3V and back - to - forward ratio of current over 300. The polymer diodes kept their behavior for over 60 days. Discussions on the results were given in detail.     

离子束散射分析

离子束散射技术得到广泛应用还只有十几年的历史。目前,在国际上它已广泛应用于电子材料、核能材料及材料科学等领域。它的主要优点是简单、快速、直观、可靠。它无需标准样品即可进行定量分析,无需腐蚀、剥离表层即可给出深度分布信息。     

背散射分析测定锗(锂漂移)表面的氟化钙薄膜厚度

在制造同轴锗(锂漂移)探测器时,为了减少表面漏电流、降低噪声,需要在锗表面生长一层有一定厚度的氟化钙复盖膜。因此,在选择加工工艺条件时,要求测量此层的厚度。 背散射分析一般不适合于测量重基体表面上的轻材料薄膜.我们用测量基体背散射能谱的位移量的方法,测出了锗(锂漂移)表面上氟化钙薄膜的厚度。     

钽电容器电介质层厚度的测量

金属钽片在阳极氧化处理过程中,在不同的电解液、电解电压及通电时间下,会形成不同厚度的Ta_2O_5层,即可制成各种不同耐压规格的钽电容器。钽基片上的Ta_2O_5层厚度与阳极氧化工艺之间的数量关系过去不太清楚。用离子束背散射方法便可很好地解决这一问题,并且具有简便、可靠、无需标准样品、不破坏样品等优点。钽片的阳极氧化处理一般有两种方法。一种是先预赋能,然后再赋能;另一种是不预赋能而仅     

硅基体的金属钼反冲注入

在某基体的表面,真空蒸镀一层其它材料的薄膜,用离子轰击时将引起原子级联碰撞而导致基体原子和薄层原子的混合,特别是在界面区域的混合。所谓反冲注入是指薄层原子在此过程中进入基体的现象。目前,离子束混合已开始应用到半导体器件及金属等材料改性的领域中。     

聚变反应堆壁材料钨和钼的表面离子束效应

运用扫描电子显微镜(SEM)及氘的定量深度分布测量,系统地研究了在氘离子轰击下金属钨和钼的损伤情况, 特别是钨表面气泡的形成及机制,以及氘在表面层的滞留量与气泡形成机制之间的关系。D+能量为100—1000eV, 轰击注量为11019—11021cm-2。轰击过程中靶表面温度分别控制在室温、600℃和800℃。研究结果为聚变堆壁材料的选择提供了依据。     

穿透散射法测定氮化钽薄膜的原子比

高精度、高稳定性氮化钽薄膜电阻器,是先在二极阴极溅射钽的同时,向真空室内充入适当量的氮气,进行反应溅射而获得氮化钽膜,再经过热处理和阻值调整后而制得的。实践表明,严格控制制作工艺过程中的氮气分压,使之生成具有一定氮-钽原子比值的薄膜,是制备优质氮化钽薄膜电阻器的关键之一。     

Mn DEPLETION IN THE SURFACE LAYER OF STAINLESS STEEL 304 LN AT THE TEMPERATURE 1200 K

The Mn component of stainless steel 304 LN has been found to be severely depleted in the surface layer during heating at the temperature 1200 K. The surface concentrations of Mn were reduced by about 2- 3 orders of magnitude in comparison with the bulk value, as was revealed by a secondary ion mass spectroscopy (SIMS) system. And the Mn concentration gradient in the surface layer was examined, too, by SIMS. Massive preferential losses of Mn have been determined by using the catcher technique and proton induced X- ray emission (PIXE). A theoretical model has been proposed for calculating the surface concentration changes for a component in an alloy under heating. A comparison shows a good agreement between the calculation and experimental results from SIMS and catcher technique.