Liquid phase sintering and characterization of SiC ceramics

The present study focuses on the sintering of silicon carbide-based ceramics (SiC) by liquid phase sintering (LPS) followed by characterization of the produced ceramics. AlN/Re₂O₃ mixtures were used as additives in the LPS process. In the first step, the LPS-SiC materials were produced in a graphite resistance furnace in the form of discs at different temperatures. The conditions with the best results regarding real density and relative density were taken as reference for sintering in the form of prismatic bars. In the second step, these samples were evaluated regarding fracture toughness (K_IC), by the Single Edge V Notch Beam – SEVNB – method, and flexural strength. K_IC behavior was evaluated according to the depth and curvature radius of the notches. Reliable K_IC values were presented when the ceramic displayed a small curvature radius at the notch tip. When the radius was large, it did not maintain the square root singularity of the notch tip. Tests were carried out to determine K_IC values in atmospheric air and water. K_IC results were lower in water than air, with a decrease ranging between 2.56% and 11.26%. The observations indicated a direct grain size correlation between K_IC values and fracture strength of the SiC ceramics.     

下一代无线网络架构

无线局域网(WLAN)技术为家庭和企业用户描绘了美好的蓝图,也吸引着众多半导体和系统设备厂商涌入这一市场。WLAN技术的不断演变,将标准制订团体、互操作性论坛(互操作性是市场进一步接受的关键要求)、产品OEM厂商和相应的半导体厂商紧密联系在一起。     

如何用硅振荡器替代晶体和陶瓷谐振器

对于绝大多数微控制器时钟电路而言，硅振荡器是一种简单且有效的解决方案。与晶体和陶瓷谐振器不同，基于硅材料的定时器具有抗振动、抗撞击和抗电磁干扰的优点。同时，硅振荡器不需要严格匹配的定时元件和线路板走线。     

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM

In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM cores. Our contribution includes a compact and efficient BIST circuit with diagnosis support and an automatic diagnostic system. The diagnosis module of our BIST circuit can capture the error syndromes as well as fault locations for the purposes of repair and fault/failure analysis. In addition, our design provides programmability for custom March algorithms with lower hardware cost. The combination of the on-line programming mode and diagnostic system dramatically reduces the effort in design debugging and yield enhancement. We have designed and implemented test chips with our BIST design. Experimental results show that the area overhead of the proposed BIST design is only 2.4% for a 128 KB SRAM, and 0.65% for a 2 MB one.     

汽车电子系统要求低静态电流

如今的汽车电子系统越来越复杂。同时，汽车环境对任何电子产品来说都是很大的挑战，因为汽车电子系统要求运行电压很宽，并且有很大的瞬态电压和温度变化。另外，性能要求也越来越高，需要多个供应电压以满足系统的不同要求。典型的