Low-frequency characteristics of thin-film multijunction thermalvoltage converters

Low-frequency errors of thin-film multijunction thermal voltage converters are estimated using a simple model based on easily measured parameters. The model predictions are verified by measuring the converter's frequency characteristic using a digitally synthesized source     

Binary versus decade inductive voltage divider comparison and errordecomposition

An automatic inductive voltage divider (IVD) characterization method that can measure linearity by comparing IVD's with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is possible to assign independent errors due to the binary and decade structures with a 2σ uncertainty of 0.05 parts per million (ppm) at the measured ratio values     

Evaluation of a Capacitance Scaling System

An improved error analysis of an existing capacitance scaling system for supporting measurements of higher valued (10 nF to 100 ) ceramic-dielectric four-terminal-pair (4TP) capacitance standards over the 100-Hz to 100-kHz frequency range is described. The capacitance scaling system uses a commercial impedance (inductance-capacitance-resistance) meter and a single-decade inductive voltage divider as an impedance comparator. Four-terminal-pair capacitors in decade (10 : 1) steps from 10 nF to 100 F are measured. The system's 10 : 1 scaling error is determined using 100-pF and 1-nF air-dielectric 4TP capacitance standards with known capacitance and loss characteristics over frequency. This paper discusses the significant reductions in measurement uncertainty that were attained through the use of improved calibration standards and measurement method refinements. Details of the uncertainty analysis for a 10-nF capacitor (in the 100-Hz to 10-kHz frequency range) and verification data are presented.