新型体声波传感器读出电路的实验验证

为了实验验证此前通过仿真验证的基于六端口反射计的新型BAW传感器读出电路的方案的可行性,本文制作了新型BAW传感器读出电路并对其进行了测试.以串联谐振频率约为1.5 GHz的薄膜体声波谐振器(FBAR)为待测器件(DUT),设计、制作了一种能够满足该FBAR谐振频率测量带宽(1.3 GHz~1.7 GHz)要求的PCB上微带六端口网络和检波器,配合射频信号发生器和示波器,获得了模拟DUT(50ΩSMA匹配负载)的反射系数-频率(Γ-f)曲线测量结果.与矢量网络分析仪(VNA)的测量结果进行了对比,两者吻合较好,实验验证了"基于六端口反射计的BAW传感器读出电路"可用于FBAR谐振频率的测量.本文工作对实用化BAW传感器的研制和片上矢量网络分析仪(VNA-on-Chip)的设计都有借鉴意义.     

薄膜体声波谐振器的电磁兼容性分析

随着薄膜体声波谐振器(FBAR)工作频率及FBAR器件集成度的不断提高,FBAR器件的电磁干扰问题显得尤为突出。常用电学模型和有限元模型都假定FBAR中的电磁场为无源准静态场,无法仿真模型的相关电磁特性。使用HFSS高频电磁仿真软件建立了FBAR的三维电磁仿真模型,采用一个包含声场特性的等效介电常数,实现了FBAR电磁场分布、电磁场耦合与压电效应的一体化仿真。分析了高频电磁场分布及电磁场耦合对谐振特性的影响,通过优化FBAR与临近元件的间距及采用不同介电常数的基板材料,减小了电磁场耦合的干扰。     

薄膜体声波谐振器调频工艺研究

薄膜体声波器件具有体积小及性能高等优势,相关产品已被广泛应用于移动通信市场。薄膜体声波谐振器(FBAR)电极层和压电层等声学层的厚度、材料是影响谐振频率的主要因素。该文分析了FBAR调频的必要性、原理及扫描刻蚀的工作方式,研究了调频层薄膜在不同刻蚀功率时对器件频率的影响。通过对FBAR器件进行调频,频率均匀性提高了6.5倍,频率分散性得到显著改善。     

FBAR用AlN薄膜的射频反应溅射制备研究

采用射频反应磁控溅射法，制备了用于薄膜体声波谐振器的（002）取向的氮化铝薄膜。氮化铝薄膜为（002）取向为主混合少量（103）取向。氮化铝薄膜生长模式表面二维均匀成核再沿C轴堆垛生长。基片温度明显影响薄膜的取向，获得好的（002）取向的基片温度在380℃～400℃之间。不同的氮气分压比存在金属模式、过渡模式和氮化物模式，要进入稳定的氮化物模式。氮气分压比为0．3～0．4，氮气分压比高有利于（002）取向。射频馈入功率密度影响到成膜速率，且与氮气分压关联，较合适的值为12W／cm^2～15W／cm^2。     

High frequency response of Bragg reflector type film bulk acoustic wave resonator

Abstract

We fabricated a Bragg reflector type FBAR using AlN piezoelectric with quarter wavelength thickness, where the Bragg reflector was composed of W-SiO₂ pairs. By numerical simulation considering actual acoustic losses of each layer, we analyzed the frequency response of the resonator and could explain it using an equivalent circuit with parasitic elements. The Effective electromechanical coupling constant (K ² _eff ) and the Quality factor (Q_s ), figures of merit of the resonator, were about 1.1% and 307, respectively.</ab>     

自顶向下贯穿腐蚀制备空腔型FBAR的方法

牺牲层释放是空腔型薄膜体声波谐振器(FBAR)工艺中形成空腔结构的关键步骤,牺牲层释放的效果直接决定了空腔型FBAR的谐振特性。根据空腔型FBAR中气隙的功能和结构特点,提出了自顶向下贯穿腐蚀牺牲层制备镂空空腔型FBAR的创新工艺方法。为验证该方法的可行性,采用MATLAB对牺牲层腐蚀的恒扩散系数(CDC)模型进行数值迭代,采用Silvaco软件对其腐蚀过程进行仿真,根据仿真结果提出释放窗口的优化设计;采用ANSYS软件对镂空FBAR的谐振特性进行有限元仿真分析,对比常规FBAR发现,镂空FBAR具有较好的谐振特性,且其阻抗零点、阻抗极点频率向高频段漂移,有效机电耦合系数和品质因数降低。     

薄膜体声波谐振器温度-频率漂移特性分析

薄膜体声波谐振器(FBAR)的谐振频率会受外界环境温度的影响而产生漂移,对于FBAR滤波器而言,这种温度-频率漂移特性会导致其中心频率、插入损耗、带内纹波等性能发生变化,降低其在电学应用中的可靠性。应用ANSYS有限元分析软件,对一个典型Mo-AlN-Mo结构的FBAR进行温度-频率漂移特性的仿真,在-50⁺150℃温度范围内得到其温度频率系数为-33.6×10-6/℃。通过在FBAR结构中添加一层正温度系数的补偿层,分析了补偿层厚度对FBAR温度-频率漂移特性、谐振频率和机电耦合特性的影响。设计的温度补偿FBAR其温度频率系数为0.872×10-6/℃,比未添加补偿层时有很大改善。     

Balanced RF Duplexer with Low Interference Using Hybrid BAW Resonators for LTE Application

A balanced RF duplexer with low interference in an extremely narrow bandgap is proposed. The Long‐Term Evolution band‐7 duplexer should be designed to prevent the co‐existence problem with the WiFi band, whose fractional bandgap corresponds to only 0.7%. By implementing a hybrid bulk acoustic wave (BAW) structure, the temperature coefficient of frequency (TCF) value of the duplexer is successfully reduced and the suppressed interference for the narrow bandgap is performed. To achieve an RF duplexer with balanced Rx output topology, we also propose a novel balanced BAW Rx topology and RF circuit block. The novel balanced Rx filter is designed with both lattice‐ and ladder‐type configurations to ensure excellent attenuation. The RF circuit block, which is located between the antenna and the Rx filter, is developed to simultaneously function as a balance‐to‐unbalance transformer and a phase shift network. The size of the fabricated duplexer is as small as 2.0 mm × 1.6 mm. The maximum insertion loss of the duplexer is as low as 2.4 dB in the Tx band, and the minimum attenuation in the WiFi band is as high as 36.8 dB. The TCF value is considerably lowered to ?16.9 ppm/°C.     

Dielectric properties of Mn doped Bismuth Barium Titanate based ceramic thin films prepared by PLD technique

In this article, the effect of Mn doping on the permittivity and dielectric loss in 0.67BiFeO₃-0.33BaTiO₃ (BF-BT) based film bulk acoustic resonator test structures has been investigated. BF-BT thin films were deposited on the fused silica substrates with Pt/TiO₂/Ti as bottom electrode. During the study of the BF-BT based parallel-plate structures, it has been revealed that BF-BT is in the ferroelectric state at room temperature. Higher permittivity (ԑ) is observed at a growth temperature of 600 °C and lower dielectric loss is achieved at 0.3 wt% Mn doping contents. These results show that the proposed BF-BT based FBAR test structure has a great potential for applications in tunable thin Film Bulk Acoustic Resonator (FBAR) devices. Comparison of the measured and simulation results has been made by utilizing the Mason equivalent circuit.     

薄膜体声波谐振器的FDTD数值分析

提出了基于时域有限差分方法对薄膜体声波谐振器进行数值分析的新方法。利用时域有限差分法理论对压电材料的控制方程,牛顿方程和电学方程在空间和时间进行了离散化,通过得到的差分方程直接得出了声场传播的时域数值解。使用该数值方法对薄膜体声波谐振器的电学特性阻抗进行了分析,并将结果与一维Mason模型的解析解进行了比较验证。