Chest X-ray enhancement to interpret pneumonia malformation based on fuzzy soft set and Dempster–Shafer theory of evidence

Image enhancement algorithms are commonly used to increase the contrast and visual quality of low-dose x-ray images. This paper proposes an automated enhancement method using soft fuzzy sets with a new decision-making scheme based on Dempster-Shafer theory of evidence for the visual interpretation of pneumonia malformation in low-dose x-ray images, called as XEFSDS. The XEFSDS model first generates an original source x-ray image into a complementary image, then each original and complement image is applied to the characterized image object and background areas of fuzzy space. The S-function is utilized to define fuzzy soft sets for the classification of gray level ambiguity in both images, and hence a decision criterion via Dempster-Shafer approach and fuzzy interval has been adapted to discriminate uncertainties on the pixel intensity and the spatial information. Modified membership grade operations have been performed on each object/background area, and Werner’s AND/OR operator (an aggregation operator) has been utilized to build a new membership function from two modified membership functions. Finally, an enhanced image is obtained from the new membership function via defuzzification. Experiments on different pneumonia X-ray images demonstrate that the XEFSDS scheme produces better results than the existing methods. To show the advantages of the XEFSDS scheme, we have executed a segmentation based examination on enhanced image for the detection of pneumonia malformation as well as abnormal lobe (lobar pneumonia) or bronchopneumonia.     

Determining the Instantaneous Effective Energy of x-Ray Tube Bremsstrahlung

A method is described for determining the instantaneous effective energy of x-ray tube brehmsstrahlung by means of two semiconductor detectors employing epitaxial GaAs structures and a measurement circuit, which together determine the effective energy with an error of 5% in the range 20–80 keV in the presence of nonlinearity in the detector response.     

New developments in CdTe and CdZnTe detectors for X and γ-ray applications

There has been considerable recent progress in II-VI semiconductor material and in methods for improving performance of the associated radiation detectors. New high resistivity CdZnTe material, new contact technologies, new detector structures, new electronic correction methods have opened the field of nuclear and x-ray imaging for industrial and medical applications. The purpose of this paper is to review new developments in several of these fields. In addition, we will present some recent results at LETI concerning first the CdTe 2-D imaging system (20 × 30 mm² with 400 × 600 pixels) for dental radiology and second the CdZnTe fast pulse correction method applied to a 5 × 5 × 5 mm³ CdZnTe detector (energy resolution = 5% for detection efficiency of 85% at 122 keV) for medical imaging.     

低银医用X光胶片的研制

对几种增黑剂进行了筛选实验研究，选用了两种增黑剂组合使用，提高了遮盖力，使医用Ｘ光胶片涂布银量由原业的９ｇ／ｍ２降到了６．８ｇ／ｍ２，与美国医用Ｘ光胶片涂布银量（６．７ｇ／ｍ２）相当，照相性能不低于国产医用Ｘ光胶片。     

Uncertainty in Quantitative Electron Probe Microanalysis

Quantitative electron probe analysis is based on models based on the physics or x-ray generation, empirically adjusted to the analyses of specimens of known composition. Their accuracy can be estimated by applying them to a set of specimens of presumably well-known composition.     

高能 X 射线工业 CT 技术的研究进展

目的 研究分析了国内外高能X射线工业CT技术的进展情况，方法 通过有关文献资料，对目前国际上主要的高能X射线工业CT技术及设备进行评述。结果和结论 对美国、德国等发达国家的高能X射线工业CT设备、线阵探测器、面陈探测器及重建算法进行了分析。     

Accurate Cross Sections for Microanalysis

To calculate the intensity of x-ray emission in electron beam microanalysis requires a knowledge of the energy distribution of the electrons in the solid, the energy variation of the ionization cross section of the relevant subshell, the fraction of ionizations events producing x rays of interest and the absorption coefficient of the x rays on the path to the detector. The theoretical predictions and experimental data available for ionization cross sections are limited mainly to K shells of a few elements. Results of systematic plane wave Born approximation calculations with exchange for K, L, and M shell ionization cross sections over the range of electron energies used in microanalysis are presented. Comparisons are made with experimental measurement for selected K shells and it is shown that the plane wave theory is not appropriate for overvoltages less than 2.5 V.     

同步辐射x射线光刻制作深亚微米T形栅

x射线光刻非常适合用于深亚微米T形栅的制作,这是因为它的高分辨率、大的曝光视场和高的生产效率足以满足MMIC制造工艺的要求。本文中我们首先对我们的x射线掩模制造工艺进行介绍,然后论述了一种用于制造深亚微米T形栅的两层胶工艺,介绍了所取得的一些研究结果,最后对国内的深亚微米光刻现状进行了简要分析。     

Non-destructive evaluation of residual stresses in thin films via x-ray diffraction topography methods

Quantitative x-ray diffraction topography techniques have been used to measure the residual strain magnitude and uniformity of deposition for Mo and W sputtered films on Si(100) substrates. High sensitivity rocking curve measurements were able to determine differential strains for films as thin as 2.5 nm; while Bragg angle contour mapping had similar sensitivity and was also able to assess coating uniformity and stress distribution over areas covering a whole wafer. Measurements of strain versus film thickness over a range of 2.5 nm to 80 nm showed that a critical thickness exists for maximum residual strain. Growth beyond this range produces stress relaxation. This non-destructive type of analysis could be employed on a wide range of film-substrate combinations.     

自动实时X射线检测技术在半导体制程控制中的应用

对X光检测的不同技术在半导体制程上的应用作了详细的介绍;着重讨论了全旋倾斜(off-axis)X射线技术的特点和优势。