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1.
孙咸 《焊管》2022,45(5):22-35
综述了铁素体与铁素体异种金属焊缝(dissimilar metal welds,DMWs)接头界面组织及其影响。结果表明,在焊后热处理或运行温度下的铁素体钢DMWs接头的不均匀界面组织中,通常会形成脱碳层和增碳层。在铁素体钢DMWs焊接接头界面组织影响因素中,焊缝金属的化学成分有重要影响;焊后热处理规范(温度和时间)、工作温度下运行时间的影响较为突出;焊接工艺参数的影响亦不可忽略。异种钢接头界面处近缝区裂纹的产生,以及接头的蠕变强度随Larson Miller 参数增大而下降等不利影响,均为异种钢界面碳迁移行为所导致。焊缝成分控制法是接头界面组织控制或改善的必要条件,而脱碳层部位转移法能有效防止裂纹发生,亦是接头安全运行的重要工艺措施之一。  相似文献   
2.
Semiconductor particles doped Al2O3 coatings were prepared by cathode plasma electrolytic deposition in Al(NO3)3 electrolyte dispersed with SiC micro- and nano-particles (average particle sizes of 0.5–1.7?µm and 40?nm respectively). The effects of the concentrations and particle sizes of the SiC on the microstructures and tribological performances of the composite coatings were studied. In comparison with the case of dispersing with SiC microparticles, the dispersion of SiC nanoparticles in the coatings was more uniform. When the concentration of SiC nanoparticles was 5?g/L, the surface roughness of the composite coating was reduced by 63%, compared with that of the unmodified coating. Friction results demonstrated that the addition of 5?g/L SiC nanoparticles reduced the friction coefficient from 0.60 to 0.38 and decreased the wear volume under dry friction. The current density and bath voltage were measured to analyze the effects of SiC particles on the deposition process. The results showed that the SiC particles could alter the electrical behavior of the coatings during the deposition process, weaken the bombardment of the plasma, and improve the structures of the coatings.  相似文献   
3.
The mechanical property of age‐hardenable Al‐alloys is governed by the state of ageing, which determines the microstructure and consequently, their corrosion behavior which is a vital aspect for a number of applications. This article presents a comparative assessment of corrosion behavior of under‐, peak‐ and over‐aged Al‐Mg‐Si alloy. Corrosion characteristics have been determined via immersion tests in 0.1 M ortho‐phosphoric acid solution and intergranular corrosion (IGC) tests. Corroded surfaces are examined by field emission scanning electron micrographs‐energy dispersive spectroscopy and 3D optical profilometer. The obtained results reveal that the corrosion rate at a specific immersion time as well as the depth of IGC increases in the order for under‐, peak‐, and over‐aged states. Irrespective of the state of ageing, corrosion loss increases linearly but the rate of corrosion decreases rapidly with increasing immersion time. The dominant mode of corrosion in under‐aged alloy is identified as localized pitting, while peak‐aged is highly susceptible to IGC in contrast extensive pitting corrosion is observed for over‐aged alloy. The observed differences in corrosion behavior are explained considering characteristics of precipitates. Formation of β (Mg2Si) in case of over‐aged alloy and presence of inclusions like AlFeMnSi particles are found to accelerate pitting corrosion.  相似文献   
4.
采用超高真空电子束蒸发法制备了新型高 K栅介质-非晶 ZrO2薄膜. X射线光电子能谱 (XPS) 中 Zr3d5/2 和 Zr3d3/2 对应的结合能分别为 182.1eV和 184.3eV, Zr元素的主要存在形式为 Zr4+,说明薄膜由完全氧化的 ZrO2组成 ,并且纵向分布均一.扩展电阻法( SRP)显示 ZrO2薄膜的 电阻率在 108Ω@ cm以上,通过高分辨率透射电镜( HR- XTEM)可以观察 ZrO2/Si界面陡直,没有 界面反应产物 ,证明 600℃快速退火后 ZrO2薄膜是非晶结构.原子力显微镜( AFM)表征了薄膜的 表面粗糙度,所有样品表面都很平整,其中 600℃快速退火样品 (RTA)的 RMS为 0.480nm.  相似文献   
5.
The c-axis preferred orientation of ZnO film is the most important factor for its successful application in piezoelectric devices. The effects of surface roughness of the substrate on the c-axis preferred orientation of ZnO thin films, deposited by radio frequency magnetron sputtering, were investigated. During sputtering, the oxygen content in the argon environment used was varied from 0 to 70% at a total sputtering pressure of 10 mTorr. Very smooth Si, smooth evaporated Au/Si, smooth evaporated-Al/Si, and rough sputtered-Al/Si were used as substrates. Their r.m.s. roughnesses, as measured by atomic force microscopy, were 1.27, 17.1, 21.1 and 65-118 Å, respectively. The crystalline structure and the angular spread of the (0 0* 2) plane normal to the ZnO films were determined using X-ray diffraction and X-ray rocking curves, respectively. The crystallinity and the preferred c-axis orientation of the ZnO films were strongly dependent on the surface roughness of the substrates rather than on the oxygen content of the working environment or on the chemical nature of the substrate.  相似文献   
6.
In this article, a subtractive clustering-based fuzzy identification method and a Sugeno-type fuzzy inference system are used for modeling in metal cutting. This approach is considered with its application on the experimental study of Boring and Trepanning Association (BTA) deep-hole drilling. The model for the surface roughness is identified by using the cutting speed and feed as input data and roughness as the output data. Using subtractive clustering in both input and output spaces performs the model-building process. Minimum error model is obtained through enumerative search of clustering parameters. The fuzzy model obtained is capable of predicting the surface roughness for a given set of inputs (speed and feed). Therefore, the operator can predict the quality of the surface for a given set of working parameters and will then be able to set the machining parameters to achieve a certain surface quality. The fuzzy model is verified experimentally by further experimentation using different sets of inputs. The tool life is also investigated using the same approach. The fuzzy inference system obtained is capable of predicting the tool life for a given set of cutting parameters. Therefore, the operator will be able to predict how many minutes the cutting tool is going to last and will set the time for the next tool change.  相似文献   
7.
高玮  谭建荣 《计算机学报》1996,19(6):472-476
本文通过分析现有工程图纸扫描图象的识别与理解系统,提出了表面粗造度的自动识别算法,从而弥补了以往系统的不足,基于图形约束的表面粗造度整体识别算法符合技术人员的读图规律,处理速度快,可靠性高,该算法已在微机上调试成功。  相似文献   
8.
混凝土渠道糙率原型观测   总被引:6,自引:0,他引:6  
糙率是渠道水力设计的关键技术参数之一,其值的准确选取决于已建工程原型观测成果的类比。选择3条不同衬砌特性的混凝土渠道进行糙率原型观测,对观测方法及步骤做了较详细描述;计算出了3条渠道的糙率,对其存在误差进行了分析探讨,可为今后进一步开展相关课题研究积累经验并供同行参考。  相似文献   
9.
薄Si膜对基底表面粗糙度的影响   总被引:8,自引:3,他引:5  
利用ZYGO光学干涉测量仪,散射积分测量法观测了光学元件表面均方根粗糙度.详细分析了薄Si膜对基底均方根粗糙度的影响,由此认为薄膜并不总是复制基底表面的粗糙度,结果出现了薄膜降低表面粗糙度的现象.提出了一定厚度范围的薄Si膜的表面粗糙度存在着一个稳定值的新设想.  相似文献   
10.
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