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S. Abedrabbo F. M. Tong N. M. Ravindra J. Gelpey S. Marcus A. T. Fiory 《Journal of Electronic Materials》1998,27(12):1323-1328
A study on the techniques to yield wafer emissivity independent temperature measurements in rapid thermal processing has been
presented. This study focuses on the Steag-AST Electronik approach to enhance wafer emissivity by using the Hotliner*. The
Hotliner comprises of a heavily doped p-Si substrate sandwiched with Si3N4/SiO2 from both sides. Experimental measurements on the optical properties of the Hotliner using a spectral emissometer operating
in the wavelength range of 1–20 μm are presented here. Results of the simulation of the experimental data using the MIT/SEMATECH
Multi-Rad model are discussed.
Hotliner is a trademark of Steag-AST Electronik, patent pending. 相似文献
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N. M. Ravindra Krshna Ravindra Sundaresh Mahendra Bhushan Sopori Anthony T. Fiory 《Journal of Electronic Materials》2003,32(10):1052-1058
A brief review of the models that have been proposed in the literature to simulate the emissivity of silicon-related materials
and structures is presented. The models discussed in this paper include ray tracing, numerical, phenomenological, and semi-quantitative
approaches. A semi-empirical model, known as Multi-Rad, based on the matrix method of multilayers is used to evaluate the
reflectance, transmittance, and emittance for Si, SiO2/Si, Si3N4/SiO2/Si/SiO2/Si3N4 (Hotliner), and separation by implantation of oxygen (SIMOX) wafers. The influence of doping concentration and dopant type
as well as the effect of the angle of incidence on the radiative properties of silicon is examined. The results of these simulations
lead to the following conclusions: (1) at least within the limitations of the Multi-Rad model, near the absorption edge, the
radiative properties of Si are not affected significantly by the angle of incidence unless the angle is very steep; (2) at
low temperatures, the emissivity of silicon shows complex structure as a function of wavelength; (3) for SiO2/Si, changes in emissivity are dominated by substrate effects; (4) Hotliner has peak transmittance at 1.25 μm, and its emissivity
is almost temperature independent; and (5) SIMOX exhibits significant changes in emissivity in the wavelength range of 1–20
μm. 相似文献
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